METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

CULTRERA, ALESSANDRO
 Distribuzione geografica
Salva come PNG Salva come JPEG
Continente #
NA - Nord America 3.823
EU - Europa 2.612
AS - Asia 2.001
SA - Sud America 189
AF - Africa 63
Continente sconosciuto - Info sul continente non disponibili 9
OC - Oceania 6
Totale 8.703
Salva come PNG Salva come JPEG
Nazione #
US - Stati Uniti d'America 3.689
SG - Singapore 886
RU - Federazione Russa 663
IT - Italia 566
CN - Cina 469
DE - Germania 346
SE - Svezia 329
GB - Regno Unito 181
HK - Hong Kong 171
BR - Brasile 141
UA - Ucraina 141
VN - Vietnam 122
KR - Corea 113
CA - Canada 90
FR - Francia 88
NL - Olanda 55
PL - Polonia 54
FI - Finlandia 53
IN - India 48
ZA - Sudafrica 42
JP - Giappone 40
IE - Irlanda 39
MX - Messico 37
BE - Belgio 24
ES - Italia 24
ID - Indonesia 22
TR - Turchia 22
BD - Bangladesh 20
AR - Argentina 17
UZ - Uzbekistan 17
EC - Ecuador 13
IL - Israele 12
LT - Lituania 11
IR - Iran 8
AT - Austria 7
CH - Svizzera 7
EU - Europa 7
IQ - Iraq 7
PK - Pakistan 7
CY - Cipro 6
MA - Marocco 6
CL - Cile 5
CO - Colombia 5
MY - Malesia 5
SA - Arabia Saudita 5
AE - Emirati Arabi Uniti 4
PT - Portogallo 4
AU - Australia 3
BG - Bulgaria 3
CZ - Repubblica Ceca 3
DZ - Algeria 3
EG - Egitto 3
HR - Croazia 3
LB - Libano 3
VE - Venezuela 3
AZ - Azerbaigian 2
CR - Costa Rica 2
DK - Danimarca 2
HU - Ungheria 2
JM - Giamaica 2
JO - Giordania 2
LK - Sri Lanka 2
PY - Paraguay 2
A2 - ???statistics.table.value.countryCode.A2??? 1
BH - Bahrain 1
BJ - Benin 1
BO - Bolivia 1
BW - Botswana 1
CG - Congo 1
CI - Costa d'Avorio 1
CU - Cuba 1
GR - Grecia 1
GY - Guiana 1
KE - Kenya 1
KH - Cambogia 1
KI - Kiribati 1
KW - Kuwait 1
LC - Santa Lucia 1
MD - Moldavia 1
MK - Macedonia 1
NI - Nicaragua 1
NO - Norvegia 1
NP - Nepal 1
NZ - Nuova Zelanda 1
PH - Filippine 1
RE - Reunion 1
RO - Romania 1
SC - Seychelles 1
SI - Slovenia 1
SK - Slovacchia (Repubblica Slovacca) 1
SN - Senegal 1
SR - Suriname 1
TH - Thailandia 1
TJ - Tagikistan 1
TO - Tonga 1
TW - Taiwan 1
UG - Uganda 1
XK - ???statistics.table.value.countryCode.XK??? 1
Totale 8.703
Salva come PNG Salva come JPEG
Città #
Singapore 476
Ashburn 437
Chandler 354
Beijing 245
Fairfield 243
Moscow 204
Dallas 183
Hong Kong 166
Cambridge 147
Boardman 143
Houston 131
New York 129
Woodbridge 125
Los Angeles 111
Seoul 105
Ann Arbor 95
Seattle 95
Turin 91
Wilmington 91
Nyköping 82
Rome 65
Falkenstein 60
Milan 59
Jacksonville 52
Munich 45
San Mateo 45
Ho Chi Minh City 44
Toronto 43
Atlanta 41
Dublin 39
Johannesburg 38
São Paulo 37
Warsaw 36
Tokyo 34
Denver 32
Des Moines 32
Stockholm 32
Helsinki 31
Montreal 31
Hanoi 28
London 28
Orem 27
Santa Clara 26
Berlin 24
Council Bluffs 24
Brussels 23
Amsterdam 22
The Dalles 22
Frankfurt am Main 21
Poplar 21
Chicago 20
Strasbourg 20
Brooklyn 19
Chennai 19
Mexico City 18
Ankara 17
Manchester 17
Phoenix 17
Guangzhou 15
Las Vegas 15
Ogden 15
San Diego 15
Kraków 14
Aachen 13
Chongqing 13
Hanover 13
Boston 11
Dearborn 10
Dong Ket 10
Miami 10
Querétaro 10
Turku 10
Vigevano 9
Genoa 8
New Delhi 8
Oxford 8
West Jordan 8
Barnsley 7
Fasano 7
Lappeenranta 7
Mumbai 7
Quito 7
Redwood City 7
San Jose 7
Naples 6
San Francisco 6
Shanghai 6
Tashkent 6
Xi'an 6
Cagliari 5
Changsha 5
Chiswick 5
Columbus 5
Curitiba 5
Da Nang 5
Haifa 5
Leawood 5
Nicosia 5
Nuremberg 5
Paris 5
Totale 5.211
Salva come PNG Salva come JPEG
Nome #
Band-gap states in unfilled mesoporous nc-TiO2: measurement protocol for electrical characterization 356
A modified cryostat for photo-electrical characterization of porous materials in controlled atmosphere at very low gas dosage 355
10th Young Researcher Meeting 2019 327
Electrical Resistance Tomography of Conductive Thin Films 307
9th Young Researcher Meeting 305
Electrical Resistance Tomography on thin films: Sharp conductive profiles 291
A calibration-verification testbed for electrical energy meters under low power quality conditions 271
Good Practice Guide on the electrical characterisation of graphene using contact methods 258
A correlation noise spectrometer for flicker noise measurement in graphene samples 257
GRACE: Developing Electrical Characterisation Methods for Future Graphene Electronics 253
A calibration-verification testbed for electrical energy meters under low power quality conditions 241
Mapping the conductivity of graphene with Electrical Resistance Tomography 236
Good Practice Guide on the electrical characterisation of graphene using non-contact and high throughput methods 223
Un laboratorio di taratura e verifica dei contatori elettrici anche in condizioni di scarsa Power Quality 219
Laboratory reproduction of on-field low power quality conditions for the calibration/verification of electrical energy meters 215
Molecular doping and gas sensing in Si nanowires: From charge injection to reduced dielectric mismatch 211
Sistema automatico di taratura ZERA MTS310 e relativo software di controllo WinSAM: allestimenti circuitali e impostazione sequenze di misura 206
A new calibration setup for lock-in amplifiers in the low frequency range and its validation in a bilateral comparison 198
Calibration of lock-in amplifiers in the low-frequency range 186
A simple algorithm to find the L-curve corner in the regularisation of ill-posed inverse problems 181
GRACE — Methods for the Electrical Characterization of Graphene 175
Metrological characterization of consumer-grade equipment for wearable brain-computer interfaces and extended reality 169
Accuracy in electrical resistance tomography: from measurements to maps 167
Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials 167
Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications 155
Tomografia a resistenza elettrica applicata ai film sottili 146
A laboratory for the reproduction of on-field low power quality for the calibration/verification of active energy meters 145
EMPIR GRACE - Good Practice Guides on the electrical characterisation of graphene using contact- and non-contact methods 143
Smart Glasses for Visually Evoked Potential Applications: Characterisation of the Optical Output for Different Display Technologies 138
Towards standardisation of contact and contactless electrical measurements of CVD graphene at the macro-, micro- and nano-scale 134
Memristive devices as a potential resistance standard 131
Normativa per le proprietà elettriche del grafene 131
Reference data for Electrical Resistance Tomography 129
Un laboratorio per la riproduzione di condizioni di bassa power quality registrate sul campo per la taratura di contatori di energia attiva 128
Test di contatori di energia elettrica in condizioni di power quality registrate sul campo 127
Active Energy Meters Tested in Realistic Non-Sinusoidal Conditions Recorded on the Field and Reproduced in Laboratory 115
Emerging Spatiotemporal Dynamics in Multiterminal Neuromorphic Nanowire Networks Through Conductance Matrices and Voltage Maps 115
I PROGETTI EMPHASIS E METSUPERCAP PER LO SVILUPPO DEI SUPERCONDENSATORI 110
LA TOMOGRAFIA A RESISTENZA ELETTRICA DI MATERIALI IN FILM SOTTILE: ATTIVITÀ IN INRIM E INTERAZIONE CON CONSORZI DI RICERCA 106
Traceable Measurements of Mutual Inductance Standards Applied to Large Capacitance Simulation in Electrochemical Impedance Spectroscopy 105
Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks using voltage excitation 100
Electrical resistance tomography as a characterisation tool for large-area graphene 98
Misure su effetto Hall quantistico in criostato senza elio 97
Calibration of Magnitude Error of Lock-in Amplifiers and Noise Response 94
Preface 91
Implementation of electrical resistance tomography for conductivity mapping of nanostructured transparent conductor materials 88
The project ‘Metrology for Static and Dynamic Characterization of Supercapacitors’ – MetSuperCap 84
Role of plasma-induced defects in the generation of 1/f noise in graphene 74
Tomography of memory engrams in self-organizing nanowire connectomes 68
Memristive devices for metrological applications 61
Laboratory Replication of Low Power Quality Conditions Observed on the Field for Testing Active Energy Meters 61
New IEC standards for the measurement of sheet resistance on large-area graphene using the van der Pauw and the in-line four-point probe methods 58
Towards new IEC standards for the electrical characterization of graphene 55
null 26
Totale 8.887
Salva come PNG Salva come JPEG
Categoria #
all - tutte 54.230
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 54.230
Salva come PNG Salva come JPEG


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021383 0 0 0 0 0 39 137 9 63 47 36 52
2021/2022657 77 22 30 79 67 22 63 78 80 44 30 65
2022/2023932 56 83 107 76 66 148 28 79 165 28 62 34
2023/2024881 61 88 106 78 77 49 119 29 83 38 52 101
2024/20251.405 37 41 75 43 54 99 217 96 181 92 222 248
2025/20263.478 264 297 481 853 606 977 0 0 0 0 0 0
Totale 8.887