METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

CULTRERA, ALESSANDRO
 Distribuzione geografica
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Continente #
NA - Nord America 5.017
EU - Europa 3.206
AS - Asia 2.691
SA - Sud America 243
Continente sconosciuto - Info sul continente non disponibili 213
AF - Africa 76
OC - Oceania 8
Totale 11.454
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Nazione #
US - Stati Uniti d'America 4.838
SG - Singapore 1.109
RU - Federazione Russa 919
IT - Italia 717
CN - Cina 630
DE - Germania 386
SE - Svezia 331
VN - Vietnam 280
GB - Regno Unito 206
HK - Hong Kong 197
BR - Brasile 163
UA - Ucraina 149
FR - Francia 139
CA - Canada 112
KR - Corea 112
NL - Olanda 72
IN - India 71
FI - Finlandia 64
PL - Polonia 57
BD - Bangladesh 52
MX - Messico 49
ZA - Sudafrica 49
JP - Giappone 46
IE - Irlanda 41
TR - Turchia 35
ID - Indonesia 30
ES - Italia 29
AR - Argentina 25
BE - Belgio 24
EC - Ecuador 18
UZ - Uzbekistan 17
LT - Lituania 13
IL - Israele 12
IQ - Iraq 12
PK - Pakistan 12
CO - Colombia 11
CH - Svizzera 9
MY - Malesia 9
SA - Arabia Saudita 9
AT - Austria 8
CL - Cile 8
IR - Iran 8
EU - Europa 7
PT - Portogallo 7
VE - Venezuela 7
AE - Emirati Arabi Uniti 6
CY - Cipro 6
MA - Marocco 6
TW - Taiwan 6
BO - Bolivia 5
JM - Giamaica 5
NP - Nepal 5
PH - Filippine 5
CZ - Repubblica Ceca 4
DZ - Algeria 4
EG - Egitto 4
HN - Honduras 4
HR - Croazia 4
HU - Ungheria 4
LB - Libano 4
AU - Australia 3
BG - Bulgaria 3
BH - Bahrain 3
CR - Costa Rica 3
JO - Giordania 3
KH - Cambogia 3
NZ - Nuova Zelanda 3
TN - Tunisia 3
AZ - Azerbaigian 2
DK - Danimarca 2
GY - Guiana 2
LK - Sri Lanka 2
LV - Lettonia 2
MD - Moldavia 2
NI - Nicaragua 2
PY - Paraguay 2
RO - Romania 2
SI - Slovenia 2
SK - Slovacchia (Repubblica Slovacca) 2
XK - ???statistics.table.value.countryCode.XK??? 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AL - Albania 1
AO - Angola 1
BB - Barbados 1
BJ - Benin 1
BW - Botswana 1
BY - Bielorussia 1
CG - Congo 1
CI - Costa d'Avorio 1
CU - Cuba 1
CW - ???statistics.table.value.countryCode.CW??? 1
GD - Grenada 1
GR - Grecia 1
KE - Kenya 1
KI - Kiribati 1
KW - Kuwait 1
LC - Santa Lucia 1
LU - Lussemburgo 1
MK - Macedonia 1
MT - Malta 1
Totale 11.239
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Città #
Singapore 635
Ashburn 627
Chandler 354
San Jose 333
Moscow 261
Beijing 259
Fairfield 243
Council Bluffs 214
Dallas 206
Hong Kong 189
New York 166
Cambridge 147
Boardman 142
Houston 135
Los Angeles 132
Woodbridge 125
Seoul 103
Seattle 98
Ann Arbor 95
Rome 94
Ho Chi Minh City 92
Wilmington 91
Turin 88
Falkenstein 82
Nyköping 82
Milan 73
Hanoi 67
Jacksonville 54
Santa Clara 48
Atlanta 47
Toronto 46
Munich 45
San Mateo 45
Orem 44
Johannesburg 42
Dublin 41
Helsinki 41
Denver 40
Montreal 40
São Paulo 40
Lauterbourg 38
Tokyo 38
Warsaw 37
Frankfurt am Main 35
London 35
Stockholm 34
Des Moines 31
Amsterdam 30
Phoenix 29
Chicago 26
Berlin 24
Brooklyn 24
Brussels 23
Chennai 23
Mexico City 22
The Dalles 22
Poplar 21
Strasbourg 21
Manchester 20
Chongqing 18
Las Vegas 18
Ankara 17
San Francisco 17
Guangzhou 15
San Diego 15
Kraków 14
Ogden 14
Aachen 13
Hanover 13
Da Nang 12
Genoa 12
Boston 11
Buffalo 11
Miami 11
Mumbai 11
Naples 11
Columbus 10
Dearborn 10
Dong Ket 10
Paris 10
Querétaro 10
Turku 10
Shenzhen 9
Vigevano 9
Kyiv 8
Lappeenranta 8
New Delhi 8
Nuremberg 8
Oxford 8
Quito 8
Shanghai 8
West Jordan 8
Barnsley 7
City of London 7
Fasano 7
Redwood City 7
Curitiba 6
Haiphong 6
Kuala Lumpur 6
Roubaix 6
Totale 6.666
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Nome #
A modified cryostat for photo-electrical characterization of porous materials in controlled atmosphere at very low gas dosage 396
Band-gap states in unfilled mesoporous nc-TiO2: measurement protocol for electrical characterization 393
10th Young Researcher Meeting 2019 387
9th Young Researcher Meeting 349
Electrical Resistance Tomography of Conductive Thin Films 336
Electrical Resistance Tomography on thin films: Sharp conductive profiles 326
A calibration-verification testbed for electrical energy meters under low power quality conditions 324
Good Practice Guide on the electrical characterisation of graphene using contact methods 322
A correlation noise spectrometer for flicker noise measurement in graphene samples 312
A calibration-verification testbed for electrical energy meters under low power quality conditions 310
Sistema automatico di taratura ZERA MTS310 e relativo software di controllo WinSAM: allestimenti circuitali e impostazione sequenze di misura 306
Good Practice Guide on the electrical characterisation of graphene using non-contact and high throughput methods 297
GRACE: Developing Electrical Characterisation Methods for Future Graphene Electronics 291
Un laboratorio di taratura e verifica dei contatori elettrici anche in condizioni di scarsa Power Quality 291
Mapping the conductivity of graphene with Electrical Resistance Tomography 285
Laboratory reproduction of on-field low power quality conditions for the calibration/verification of electrical energy meters 273
A new calibration setup for lock-in amplifiers in the low frequency range and its validation in a bilateral comparison 241
Calibration of lock-in amplifiers in the low-frequency range 239
Molecular doping and gas sensing in Si nanowires: From charge injection to reduced dielectric mismatch 238
Test di contatori di energia elettrica in condizioni di power quality registrate sul campo 220
Smart Glasses for Visually Evoked Potential Applications: Characterisation of the Optical Output for Different Display Technologies 220
A simple algorithm to find the L-curve corner in the regularisation of ill-posed inverse problems 212
Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials 211
Metrological characterization of consumer-grade equipment for wearable brain-computer interfaces and extended reality 207
GRACE — Methods for the Electrical Characterization of Graphene 203
Accuracy in electrical resistance tomography: from measurements to maps 202
Memristive devices as a potential resistance standard 192
A laboratory for the reproduction of on-field low power quality for the calibration/verification of active energy meters 189
Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications 188
Tomografia a resistenza elettrica applicata ai film sottili 186
Reference data for Electrical Resistance Tomography 174
Normativa per le proprietà elettriche del grafene 174
Active Energy Meters Tested in Realistic Non-Sinusoidal Conditions Recorded on the Field and Reproduced in Laboratory 173
Un laboratorio per la riproduzione di condizioni di bassa power quality registrate sul campo per la taratura di contatori di energia attiva 173
EMPIR GRACE - Good Practice Guides on the electrical characterisation of graphene using contact- and non-contact methods 168
Towards standardisation of contact and contactless electrical measurements of CVD graphene at the macro-, micro- and nano-scale 164
Misure su effetto Hall quantistico in criostato senza elio 153
I PROGETTI EMPHASIS E METSUPERCAP PER LO SVILUPPO DEI SUPERCONDENSATORI 153
Traceable Measurements of Mutual Inductance Standards Applied to Large Capacitance Simulation in Electrochemical Impedance Spectroscopy 149
Emerging Spatiotemporal Dynamics in Multiterminal Neuromorphic Nanowire Networks Through Conductance Matrices and Voltage Maps 146
Calibration of Magnitude Error of Lock-in Amplifiers and Noise Response 139
LA TOMOGRAFIA A RESISTENZA ELETTRICA DI MATERIALI IN FILM SOTTILE: ATTIVITÀ IN INRIM E INTERAZIONE CON CONSORZI DI RICERCA 139
Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks using voltage excitation 137
Preface 129
The project ‘Metrology for Static and Dynamic Characterization of Supercapacitors’ – MetSuperCap 123
Electrical resistance tomography as a characterisation tool for large-area graphene 120
New IEC standards for the measurement of sheet resistance on large-area graphene using the van der Pauw and the in-line four-point probe methods 117
Laboratory Replication of Low Power Quality Conditions Observed on the Field for Testing Active Energy Meters 113
Tomography of memory engrams in self-organizing nanowire connectomes 109
Role of plasma-induced defects in the generation of 1/f noise in graphene 96
Memristive devices for metrological applications 87
Towards new IEC standards for the electrical characterization of graphene 84
Electrical resistance tomography for 2D and thin-film materials: from measurements to image reconstruction 52
Caratterizzazione di Supercondensatori: Elettrodi e Dispositivi 48
Electrical resistance tomography of thin conductive materials with wavelet regularization 40
Memristance and transmemristance in multiterminal memristive systems 34
MetSuperCap: Metrology for static and dynamic characterisation of supercapacitors 34
Magnitude and Phase Calibration of Lock-In Amplifiers, and Analysis of the Noise Response 29
null 26
Electrical Resistance Tomography for the investigation of memristive nanowire networks 25
Totale 11.454
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Categoria #
all - tutte 61.020
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 61.020
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022580 0 22 30 79 67 22 63 78 80 44 30 65
2022/2023929 56 83 107 76 66 148 28 79 163 28 61 34
2023/2024859 54 86 104 77 76 48 117 29 80 38 51 99
2024/20251.378 37 39 73 39 54 96 212 96 175 92 219 246
2025/20265.710 261 292 477 846 603 1.291 629 253 350 380 200 128
2026/2027387 100 287 0 0 0 0 0 0 0 0 0 0
Totale 11.454