statistiche ricercatore

CULTRERA, ALESSANDRO

Distribuzione geografica

Continente	#
NA - Nord America	4.458
EU - Europa	3.160
AS - Asia	2.671
SA - Sud America	240
AF - Africa	77
Continente sconosciuto - Info sul continente non disponibili	10
OC - Oceania	8
Totale	10.624

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Nazione	#
US - Stati Uniti d'America	4.298
SG - Singapore	1.115
RU - Federazione Russa	931
IT - Italia	664
CN - Cina	630
DE - Germania	392
SE - Svezia	331
VN - Vietnam	280
GB - Regno Unito	204
HK - Hong Kong	199
BR - Brasile	165
UA - Ucraina	149
FR - Francia	137
KR - Corea	114
CA - Canada	100
IN - India	71
NL - Olanda	70
FI - Finlandia	64
PL - Polonia	57
ZA - Sudafrica	50
JP - Giappone	47
MX - Messico	47
IE - Irlanda	42
TR - Turchia	32
ID - Indonesia	29
BD - Bangladesh	28
ES - Italia	27
AR - Argentina	25
BE - Belgio	24
EC - Ecuador	17
UZ - Uzbekistan	17
IL - Israele	12
IQ - Iraq	12
LT - Lituania	12
PK - Pakistan	11
CH - Svizzera	9
SA - Arabia Saudita	9
AT - Austria	8
CL - Cile	8
CO - Colombia	8
IR - Iran	8
MY - Malesia	8
EU - Europa	7
PT - Portogallo	7
VE - Venezuela	7
AE - Emirati Arabi Uniti	6
CY - Cipro	6
MA - Marocco	6
TW - Taiwan	6
BO - Bolivia	5
NP - Nepal	5
PH - Filippine	5
CZ - Repubblica Ceca	4
DZ - Algeria	4
EG - Egitto	4
HR - Croazia	4
HU - Ungheria	4
AU - Australia	3
BG - Bulgaria	3
BH - Bahrain	3
CR - Costa Rica	3
HN - Honduras	3
JM - Giamaica	3
JO - Giordania	3
KH - Cambogia	3
LB - Libano	3
NZ - Nuova Zelanda	3
TN - Tunisia	3
AZ - Azerbaigian	2
DK - Danimarca	2
LK - Sri Lanka	2
MD - Moldavia	2
PY - Paraguay	2
RO - Romania	2
SI - Slovenia	2
SK - Slovacchia (Repubblica Slovacca)	2
XK - ???statistics.table.value.countryCode.XK???	2
A2 - ???statistics.table.value.countryCode.A2???	1
AO - Angola	1
BB - Barbados	1
BJ - Benin	1
BW - Botswana	1
CG - Congo	1
CI - Costa d'Avorio	1
CU - Cuba	1
GR - Grecia	1
GY - Guiana	1
KE - Kenya	1
KI - Kiribati	1
KW - Kuwait	1
LC - Santa Lucia	1
LU - Lussemburgo	1
LV - Lettonia	1
MK - Macedonia	1
MT - Malta	1
NI - Nicaragua	1
NO - Norvegia	1
OM - Oman	1
PE - Perù	1
QA - Qatar	1
Totale	10.615

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Città	#
Singapore	637
Ashburn	587
Chandler	354
San Jose	295
Moscow	266
Beijing	260
Fairfield	243
Hong Kong	191
Dallas	184
Cambridge	147
Boardman	143
New York	139
Houston	133
Woodbridge	125
Los Angeles	118
Seoul	105
Ann Arbor	95
Seattle	95
Turin	93
Ho Chi Minh City	92
Wilmington	91
Rome	89
Falkenstein	85
Nyköping	82
Hanoi	66
Milan	66
Council Bluffs	57
Jacksonville	52
Munich	45
San Mateo	45
Toronto	45
Johannesburg	43
Atlanta	42
Dublin	42
São Paulo	42
Helsinki	41
Orem	40
Tokyo	39
Lauterbourg	38
Warsaw	37
Frankfurt am Main	36
Stockholm	34
Denver	33
London	33
Montreal	33
Des Moines	32
Amsterdam	31
Santa Clara	27
Berlin	24
Brussels	23
Chennai	23
Chicago	23
The Dalles	22
Manchester	21
Mexico City	21
Poplar	21
Strasbourg	21
Brooklyn	20
Chongqing	18
Phoenix	18
Ankara	17
Guangzhou	16
Las Vegas	15
Ogden	15
San Diego	15
Kraków	14
Aachen	13
Hanover	13
Da Nang	12
Boston	11
Mumbai	11
Dearborn	10
Dong Ket	10
Miami	10
Querétaro	10
Turku	10
Columbus	9
Shenzhen	9
Vigevano	9
Genoa	8
Kyiv	8
Lappeenranta	8
New Delhi	8
Nuremberg	8
Oxford	8
Paris	8
Quito	8
West Jordan	8
Barnsley	7
Buffalo	7
City of London	7
Fasano	7
Naples	7
Redwood City	7
Shanghai	7
Curitiba	6
Haiphong	6
Roubaix	6
San Francisco	6
Tashkent	6
Totale	6.283

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Nome	#
A modified cryostat for photo-electrical characterization of porous materials in controlled atmosphere at very low gas dosage	390
Band-gap states in unfilled mesoporous nc-TiO2: measurement protocol for electrical characterization	387
10th Young Researcher Meeting 2019	375
9th Young Researcher Meeting	337
Electrical Resistance Tomography of Conductive Thin Films	329
Electrical Resistance Tomography on thin films: Sharp conductive profiles	322
A calibration-verification testbed for electrical energy meters under low power quality conditions	306
A correlation noise spectrometer for flicker noise measurement in graphene samples	305
Good Practice Guide on the electrical characterisation of graphene using contact methods	300
GRACE: Developing Electrical Characterisation Methods for Future Graphene Electronics	284
A calibration-verification testbed for electrical energy meters under low power quality conditions	284
Sistema automatico di taratura ZERA MTS310 e relativo software di controllo WinSAM: allestimenti circuitali e impostazione sequenze di misura	278
Good Practice Guide on the electrical characterisation of graphene using non-contact and high throughput methods	275
Un laboratorio di taratura e verifica dei contatori elettrici anche in condizioni di scarsa Power Quality	271
Mapping the conductivity of graphene with Electrical Resistance Tomography	264
Laboratory reproduction of on-field low power quality conditions for the calibration/verification of electrical energy meters	258
A new calibration setup for lock-in amplifiers in the low frequency range and its validation in a bilateral comparison	234
Molecular doping and gas sensing in Si nanowires: From charge injection to reduced dielectric mismatch	232
Calibration of lock-in amplifiers in the low-frequency range	226
Smart Glasses for Visually Evoked Potential Applications: Characterisation of the Optical Output for Different Display Technologies	206
Test di contatori di energia elettrica in condizioni di power quality registrate sul campo	204
A simple algorithm to find the L-curve corner in the regularisation of ill-posed inverse problems	200
Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials	199
Metrological characterization of consumer-grade equipment for wearable brain-computer interfaces and extended reality	197
GRACE — Methods for the Electrical Characterization of Graphene	194
Accuracy in electrical resistance tomography: from measurements to maps	193
Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications	180
Tomografia a resistenza elettrica applicata ai film sottili	179
A laboratory for the reproduction of on-field low power quality for the calibration/verification of active energy meters	177
Normativa per le proprietà elettriche del grafene	167
Reference data for Electrical Resistance Tomography	165
Memristive devices as a potential resistance standard	164
EMPIR GRACE - Good Practice Guides on the electrical characterisation of graphene using contact- and non-contact methods	163
Un laboratorio per la riproduzione di condizioni di bassa power quality registrate sul campo per la taratura di contatori di energia attiva	160
Towards standardisation of contact and contactless electrical measurements of CVD graphene at the macro-, micro- and nano-scale	157
Active Energy Meters Tested in Realistic Non-Sinusoidal Conditions Recorded on the Field and Reproduced in Laboratory	155
I PROGETTI EMPHASIS E METSUPERCAP PER LO SVILUPPO DEI SUPERCONDENSATORI	144
Misure su effetto Hall quantistico in criostato senza elio	142
Emerging Spatiotemporal Dynamics in Multiterminal Neuromorphic Nanowire Networks Through Conductance Matrices and Voltage Maps	140
Traceable Measurements of Mutual Inductance Standards Applied to Large Capacitance Simulation in Electrochemical Impedance Spectroscopy	134
LA TOMOGRAFIA A RESISTENZA ELETTRICA DI MATERIALI IN FILM SOTTILE: ATTIVITÀ IN INRIM E INTERAZIONE CON CONSORZI DI RICERCA	130
Calibration of Magnitude Error of Lock-in Amplifiers and Noise Response	126
Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks using voltage excitation	122
Electrical resistance tomography as a characterisation tool for large-area graphene	117
Preface	115
The project ‘Metrology for Static and Dynamic Characterization of Supercapacitors’ – MetSuperCap	111
Implementation of electrical resistance tomography for conductivity mapping of nanostructured transparent conductor materials	105
Laboratory Replication of Low Power Quality Conditions Observed on the Field for Testing Active Energy Meters	97
Tomography of memory engrams in self-organizing nanowire connectomes	94
New IEC standards for the measurement of sheet resistance on large-area graphene using the van der Pauw and the in-line four-point probe methods	91
Role of plasma-induced defects in the generation of 1/f noise in graphene	88
Memristive devices for metrological applications	85
Towards new IEC standards for the electrical characterization of graphene	76
Caratterizzazione di Supercondensatori: Elettrodi e Dispositivi	38
Electrical resistance tomography for 2D and thin-film materials: from measurements to image reconstruction	32
null	26
Electrical resistance tomography of thin conductive materials with wavelet regularization	23
Magnitude and Phase Calibration of Lock-In Amplifiers, and Analysis of the Noise Response	22
Memristance and transmemristance in multiterminal memristive systems	20
MetSuperCap: Metrology for static and dynamic characterisation of supercapacitors	18
Electrical Resistance Tomography for the investigation of memristive nanowire networks	16
Totale	10.829

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Categoria	#
all - tutte	57.467
article - articoli	0
book - libri	0
conference - conferenze	0
curatela - curatele	0
other - altro	0
patent - brevetti	0
selected - selezionate	0
volume - volumi	0
Totale	57.467

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	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2020/2021	135	0	0	0	0	0	0	0	0	0	47	36	52
2021/2022	657	77	22	30	79	67	22	63	78	80	44	30	65
2022/2023	932	56	83	107	76	66	148	28	79	165	28	62	34
2023/2024	881	61	88	106	78	77	49	119	29	83	38	52	101
2024/2025	1.405	37	41	75	43	54	99	217	96	181	92	222	248
2025/2026	5.420	264	297	481	853	606	1.309	635	255	350	370	0	0
Totale													10.829