CULTRERA, ALESSANDRO
 Distribuzione geografica
Continente #
NA - Nord America 4.690
EU - Europa 3.196
AS - Asia 2.713
SA - Sud America 241
AF - Africa 77
Continente sconosciuto - Info sul continente non disponibili 10
OC - Oceania 8
Totale 10.935
Nazione #
US - Stati Uniti d'America 4.525
SG - Singapore 1.124
RU - Federazione Russa 931
IT - Italia 695
CN - Cina 637
DE - Germania 392
SE - Svezia 331
VN - Vietnam 281
GB - Regno Unito 206
HK - Hong Kong 199
BR - Brasile 165
UA - Ucraina 149
FR - Francia 137
KR - Corea 114
CA - Canada 103
IN - India 71
NL - Olanda 71
FI - Finlandia 64
PL - Polonia 57
ZA - Sudafrica 50
MX - Messico 49
BD - Bangladesh 47
JP - Giappone 47
IE - Irlanda 42
TR - Turchia 35
ID - Indonesia 30
ES - Italia 27
AR - Argentina 25
BE - Belgio 24
EC - Ecuador 17
UZ - Uzbekistan 17
LT - Lituania 13
IL - Israele 12
IQ - Iraq 12
PK - Pakistan 12
CH - Svizzera 9
CO - Colombia 9
MY - Malesia 9
SA - Arabia Saudita 9
AT - Austria 8
CL - Cile 8
IR - Iran 8
EU - Europa 7
PT - Portogallo 7
VE - Venezuela 7
AE - Emirati Arabi Uniti 6
CY - Cipro 6
MA - Marocco 6
TW - Taiwan 6
BO - Bolivia 5
NP - Nepal 5
PH - Filippine 5
CZ - Repubblica Ceca 4
DZ - Algeria 4
EG - Egitto 4
HR - Croazia 4
HU - Ungheria 4
AU - Australia 3
BG - Bulgaria 3
BH - Bahrain 3
CR - Costa Rica 3
HN - Honduras 3
JM - Giamaica 3
JO - Giordania 3
KH - Cambogia 3
LB - Libano 3
NZ - Nuova Zelanda 3
TN - Tunisia 3
AZ - Azerbaigian 2
DK - Danimarca 2
LK - Sri Lanka 2
MD - Moldavia 2
PY - Paraguay 2
RO - Romania 2
SI - Slovenia 2
SK - Slovacchia (Repubblica Slovacca) 2
XK - ???statistics.table.value.countryCode.XK??? 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AL - Albania 1
AO - Angola 1
BB - Barbados 1
BJ - Benin 1
BW - Botswana 1
CG - Congo 1
CI - Costa d'Avorio 1
CU - Cuba 1
GR - Grecia 1
GY - Guiana 1
KE - Kenya 1
KI - Kiribati 1
KW - Kuwait 1
LC - Santa Lucia 1
LU - Lussemburgo 1
LV - Lettonia 1
MK - Macedonia 1
MT - Malta 1
NI - Nicaragua 1
NO - Norvegia 1
OM - Oman 1
PE - Perù 1
Totale 10.925
Città #
Singapore 641
Ashburn 610
Chandler 354
San Jose 329
Moscow 266
Beijing 260
Fairfield 243
Hong Kong 191
Dallas 186
Council Bluffs 152
New York 148
Cambridge 147
Boardman 146
Houston 133
Woodbridge 125
Los Angeles 119
Seoul 105
Ann Arbor 95
Seattle 95
Turin 93
Ho Chi Minh City 92
Rome 92
Wilmington 91
Falkenstein 85
Nyköping 82
Milan 70
Hanoi 67
Jacksonville 53
Munich 45
San Mateo 45
Toronto 45
Atlanta 43
Johannesburg 43
Dublin 42
São Paulo 42
Helsinki 41
Orem 40
Santa Clara 40
Tokyo 39
Lauterbourg 38
Warsaw 37
Frankfurt am Main 36
Montreal 35
London 34
Stockholm 34
Denver 33
Des Moines 32
Amsterdam 31
Berlin 24
Brussels 23
Chennai 23
Chicago 23
Brooklyn 22
Mexico City 22
The Dalles 22
Manchester 21
Poplar 21
Strasbourg 21
Phoenix 19
Chongqing 18
Ankara 17
Guangzhou 16
Las Vegas 15
Ogden 15
San Diego 15
Kraków 14
Aachen 13
Hanover 13
Da Nang 12
Boston 11
Mumbai 11
Dearborn 10
Dong Ket 10
Miami 10
Querétaro 10
Turku 10
Columbus 9
Genoa 9
Shenzhen 9
Vigevano 9
Buffalo 8
Kyiv 8
Lappeenranta 8
New Delhi 8
Nuremberg 8
Oxford 8
Paris 8
Quito 8
Shanghai 8
West Jordan 8
Barnsley 7
City of London 7
Fasano 7
Naples 7
Redwood City 7
San Francisco 7
Curitiba 6
Haiphong 6
Kuala Lumpur 6
Roubaix 6
Totale 6.488
Nome #
A modified cryostat for photo-electrical characterization of porous materials in controlled atmosphere at very low gas dosage 393
Band-gap states in unfilled mesoporous nc-TiO2: measurement protocol for electrical characterization 389
10th Young Researcher Meeting 2019 378
9th Young Researcher Meeting 340
Electrical Resistance Tomography of Conductive Thin Films 331
Electrical Resistance Tomography on thin films: Sharp conductive profiles 323
A calibration-verification testbed for electrical energy meters under low power quality conditions 316
A correlation noise spectrometer for flicker noise measurement in graphene samples 307
Good Practice Guide on the electrical characterisation of graphene using contact methods 306
A calibration-verification testbed for electrical energy meters under low power quality conditions 297
Sistema automatico di taratura ZERA MTS310 e relativo software di controllo WinSAM: allestimenti circuitali e impostazione sequenze di misura 292
GRACE: Developing Electrical Characterisation Methods for Future Graphene Electronics 286
Good Practice Guide on the electrical characterisation of graphene using non-contact and high throughput methods 281
Un laboratorio di taratura e verifica dei contatori elettrici anche in condizioni di scarsa Power Quality 281
Mapping the conductivity of graphene with Electrical Resistance Tomography 277
Laboratory reproduction of on-field low power quality conditions for the calibration/verification of electrical energy meters 270
A new calibration setup for lock-in amplifiers in the low frequency range and its validation in a bilateral comparison 239
Calibration of lock-in amplifiers in the low-frequency range 234
Molecular doping and gas sensing in Si nanowires: From charge injection to reduced dielectric mismatch 234
Smart Glasses for Visually Evoked Potential Applications: Characterisation of the Optical Output for Different Display Technologies 219
Test di contatori di energia elettrica in condizioni di power quality registrate sul campo 211
Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials 206
A simple algorithm to find the L-curve corner in the regularisation of ill-posed inverse problems 206
Metrological characterization of consumer-grade equipment for wearable brain-computer interfaces and extended reality 203
Accuracy in electrical resistance tomography: from measurements to maps 198
GRACE — Methods for the Electrical Characterization of Graphene 195
Tomografia a resistenza elettrica applicata ai film sottili 181
Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications 181
Memristive devices as a potential resistance standard 180
A laboratory for the reproduction of on-field low power quality for the calibration/verification of active energy meters 180
Reference data for Electrical Resistance Tomography 168
Normativa per le proprietà elettriche del grafene 168
Un laboratorio per la riproduzione di condizioni di bassa power quality registrate sul campo per la taratura di contatori di energia attiva 165
EMPIR GRACE - Good Practice Guides on the electrical characterisation of graphene using contact- and non-contact methods 164
Active Energy Meters Tested in Realistic Non-Sinusoidal Conditions Recorded on the Field and Reproduced in Laboratory 160
Towards standardisation of contact and contactless electrical measurements of CVD graphene at the macro-, micro- and nano-scale 160
Misure su effetto Hall quantistico in criostato senza elio 148
I PROGETTI EMPHASIS E METSUPERCAP PER LO SVILUPPO DEI SUPERCONDENSATORI 148
Emerging Spatiotemporal Dynamics in Multiterminal Neuromorphic Nanowire Networks Through Conductance Matrices and Voltage Maps 142
Traceable Measurements of Mutual Inductance Standards Applied to Large Capacitance Simulation in Electrochemical Impedance Spectroscopy 139
LA TOMOGRAFIA A RESISTENZA ELETTRICA DI MATERIALI IN FILM SOTTILE: ATTIVITÀ IN INRIM E INTERAZIONE CON CONSORZI DI RICERCA 133
Calibration of Magnitude Error of Lock-in Amplifiers and Noise Response 132
Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks using voltage excitation 126
Preface 119
The project ‘Metrology for Static and Dynamic Characterization of Supercapacitors’ – MetSuperCap 117
Electrical resistance tomography as a characterisation tool for large-area graphene 117
Implementation of electrical resistance tomography for conductivity mapping of nanostructured transparent conductor materials 109
New IEC standards for the measurement of sheet resistance on large-area graphene using the van der Pauw and the in-line four-point probe methods 106
Tomography of memory engrams in self-organizing nanowire connectomes 100
Laboratory Replication of Low Power Quality Conditions Observed on the Field for Testing Active Energy Meters 99
Role of plasma-induced defects in the generation of 1/f noise in graphene 92
Memristive devices for metrological applications 86
Towards new IEC standards for the electrical characterization of graphene 76
Caratterizzazione di Supercondensatori: Elettrodi e Dispositivi 43
Electrical resistance tomography for 2D and thin-film materials: from measurements to image reconstruction 40
Electrical resistance tomography of thin conductive materials with wavelet regularization 31
Magnitude and Phase Calibration of Lock-In Amplifiers, and Analysis of the Noise Response 27
Memristance and transmemristance in multiterminal memristive systems 27
null 26
MetSuperCap: Metrology for static and dynamic characterisation of supercapacitors 21
Electrical Resistance Tomography for the investigation of memristive nanowire networks 17
Totale 11.140
Categoria #
all - tutte 59.506
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 59.506


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202152 0 0 0 0 0 0 0 0 0 0 0 52
2021/2022657 77 22 30 79 67 22 63 78 80 44 30 65
2022/2023932 56 83 107 76 66 148 28 79 165 28 62 34
2023/2024881 61 88 106 78 77 49 119 29 83 38 52 101
2024/20251.405 37 41 75 43 54 99 217 96 181 92 222 248
2025/20265.731 264 297 481 853 606 1.309 635 255 350 385 203 93
Totale 11.140