METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

CULTRERA, ALESSANDRO
 Distribuzione geografica
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Continente #
NA - Nord America 5.513
EU - Europa 3.303
AS - Asia 2.738
SA - Sud America 260
Continente sconosciuto - Info sul continente non disponibili 217
AF - Africa 80
OC - Oceania 8
Totale 12.119
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Nazione #
US - Stati Uniti d'America 5.290
SG - Singapore 1.125
RU - Federazione Russa 934
IT - Italia 765
CN - Cina 639
DE - Germania 393
SE - Svezia 331
VN - Vietnam 285
GB - Regno Unito 222
HK - Hong Kong 199
BR - Brasile 169
UA - Ucraina 150
FR - Francia 139
CA - Canada 133
KR - Corea 114
NL - Olanda 76
IN - India 72
FI - Finlandia 64
PL - Polonia 59
BD - Bangladesh 54
MX - Messico 50
ZA - Sudafrica 50
JP - Giappone 47
IE - Irlanda 42
TR - Turchia 35
ID - Indonesia 33
AR - Argentina 30
ES - Italia 30
BE - Belgio 24
EC - Ecuador 18
UZ - Uzbekistan 17
IL - Israele 15
CO - Colombia 14
LT - Lituania 13
IQ - Iraq 12
PK - Pakistan 12
HN - Honduras 10
VE - Venezuela 10
CH - Svizzera 9
MY - Malesia 9
SA - Arabia Saudita 9
AT - Austria 8
CL - Cile 8
CR - Costa Rica 8
IR - Iran 8
JM - Giamaica 8
EU - Europa 7
PH - Filippine 7
PT - Portogallo 7
AE - Emirati Arabi Uniti 6
CY - Cipro 6
MA - Marocco 6
TW - Taiwan 6
BO - Bolivia 5
GT - Guatemala 5
NP - Nepal 5
CZ - Repubblica Ceca 4
DZ - Algeria 4
EG - Egitto 4
HR - Croazia 4
HU - Ungheria 4
LB - Libano 4
AU - Australia 3
BG - Bulgaria 3
BH - Bahrain 3
JO - Giordania 3
KH - Cambogia 3
NI - Nicaragua 3
NZ - Nuova Zelanda 3
SC - Seychelles 3
TN - Tunisia 3
AZ - Azerbaigian 2
DK - Danimarca 2
EE - Estonia 2
GY - Guiana 2
LK - Sri Lanka 2
LV - Lettonia 2
MD - Moldavia 2
PY - Paraguay 2
RO - Romania 2
SI - Slovenia 2
SK - Slovacchia (Repubblica Slovacca) 2
TH - Thailandia 2
XK - ???statistics.table.value.countryCode.XK??? 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AL - Albania 1
AO - Angola 1
BB - Barbados 1
BJ - Benin 1
BW - Botswana 1
BY - Bielorussia 1
CG - Congo 1
CI - Costa d'Avorio 1
CU - Cuba 1
CW - ???statistics.table.value.countryCode.CW??? 1
GD - Grenada 1
GR - Grecia 1
KE - Kenya 1
KI - Kiribati 1
KW - Kuwait 1
Totale 11.895
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Città #
Ashburn 677
Singapore 641
San Jose 407
Chandler 354
Moscow 266
Beijing 260
Fairfield 243
Council Bluffs 218
Dallas 214
Hong Kong 191
New York 190
Cambridge 147
Boardman 146
Houston 137
Los Angeles 137
Woodbridge 125
Seoul 105
Seattle 98
Ho Chi Minh City 96
Ann Arbor 95
Rome 95
Turin 95
Wilmington 92
Falkenstein 85
Nyköping 82
Milan 75
Hanoi 67
Jacksonville 54
Santa Clara 51
Atlanta 48
Toronto 46
Munich 45
Orem 45
San Mateo 45
Montreal 44
Johannesburg 43
Phoenix 43
Dublin 42
São Paulo 42
Denver 41
Helsinki 41
Chicago 40
Tokyo 39
Lauterbourg 38
Warsaw 38
Frankfurt am Main 36
London 36
Stockholm 34
Amsterdam 32
Des Moines 32
Brooklyn 28
Berlin 24
Brussels 23
Chennai 23
Manchester 22
Mexico City 22
San Diego 22
The Dalles 22
Poplar 21
Strasbourg 21
Las Vegas 19
Chongqing 18
San Francisco 18
Ankara 17
Guangzhou 16
Buffalo 15
Ogden 15
Glen Cove 14
Kraków 14
Naples 14
Aachen 13
Hanover 13
Miami 13
Boston 12
Da Nang 12
Genoa 12
Mumbai 11
Columbus 10
Dearborn 10
Dong Ket 10
Paris 10
Querétaro 10
Turku 10
Shenzhen 9
Vigevano 9
Bologna 8
Kyiv 8
Lappeenranta 8
New Delhi 8
Nuremberg 8
Oxford 8
Quito 8
Salt Lake City 8
San José 8
Shanghai 8
West Jordan 8
Barnsley 7
City of London 7
Fasano 7
Newark 7
Totale 6.961
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Nome #
Band-gap states in unfilled mesoporous nc-TiO2: measurement protocol for electrical characterization 402
A modified cryostat for photo-electrical characterization of porous materials in controlled atmosphere at very low gas dosage 401
10th Young Researcher Meeting 2019 392
9th Young Researcher Meeting 354
A calibration-verification testbed for electrical energy meters under low power quality conditions 347
Electrical Resistance Tomography of Conductive Thin Films 345
Electrical Resistance Tomography on thin films: Sharp conductive profiles 332
Good Practice Guide on the electrical characterisation of graphene using contact methods 330
A correlation noise spectrometer for flicker noise measurement in graphene samples 326
Sistema automatico di taratura ZERA MTS310 e relativo software di controllo WinSAM: allestimenti circuitali e impostazione sequenze di misura 325
A calibration-verification testbed for electrical energy meters under low power quality conditions 315
Good Practice Guide on the electrical characterisation of graphene using non-contact and high throughput methods 309
GRACE: Developing Electrical Characterisation Methods for Future Graphene Electronics 306
Un laboratorio di taratura e verifica dei contatori elettrici anche in condizioni di scarsa Power Quality 296
Mapping the conductivity of graphene with Electrical Resistance Tomography 293
Laboratory reproduction of on-field low power quality conditions for the calibration/verification of electrical energy meters 279
Calibration of lock-in amplifiers in the low-frequency range 261
Molecular doping and gas sensing in Si nanowires: From charge injection to reduced dielectric mismatch 257
A new calibration setup for lock-in amplifiers in the low frequency range and its validation in a bilateral comparison 251
Test di contatori di energia elettrica in condizioni di power quality registrate sul campo 231
Metrological characterization of consumer-grade equipment for wearable brain-computer interfaces and extended reality 226
Smart Glasses for Visually Evoked Potential Applications: Characterisation of the Optical Output for Different Display Technologies 225
A simple algorithm to find the L-curve corner in the regularisation of ill-posed inverse problems 222
Accuracy in electrical resistance tomography: from measurements to maps 219
Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials 218
GRACE — Methods for the Electrical Characterization of Graphene 212
Memristive devices as a potential resistance standard 203
Tomografia a resistenza elettrica applicata ai film sottili 197
A laboratory for the reproduction of on-field low power quality for the calibration/verification of active energy meters 196
Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications 192
Reference data for Electrical Resistance Tomography 190
Normativa per le proprietà elettriche del grafene 182
Un laboratorio per la riproduzione di condizioni di bassa power quality registrate sul campo per la taratura di contatori di energia attiva 178
Active Energy Meters Tested in Realistic Non-Sinusoidal Conditions Recorded on the Field and Reproduced in Laboratory 177
EMPIR GRACE - Good Practice Guides on the electrical characterisation of graphene using contact- and non-contact methods 174
Towards standardisation of contact and contactless electrical measurements of CVD graphene at the macro-, micro- and nano-scale 170
Misure su effetto Hall quantistico in criostato senza elio 159
I PROGETTI EMPHASIS E METSUPERCAP PER LO SVILUPPO DEI SUPERCONDENSATORI 157
Traceable Measurements of Mutual Inductance Standards Applied to Large Capacitance Simulation in Electrochemical Impedance Spectroscopy 153
Emerging Spatiotemporal Dynamics in Multiterminal Neuromorphic Nanowire Networks Through Conductance Matrices and Voltage Maps 151
Calibration of Magnitude Error of Lock-in Amplifiers and Noise Response 150
Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks using voltage excitation 148
LA TOMOGRAFIA A RESISTENZA ELETTRICA DI MATERIALI IN FILM SOTTILE: ATTIVITÀ IN INRIM E INTERAZIONE CON CONSORZI DI RICERCA 145
Preface 137
The project ‘Metrology for Static and Dynamic Characterization of Supercapacitors’ – MetSuperCap 130
Electrical resistance tomography as a characterisation tool for large-area graphene 129
Laboratory Replication of Low Power Quality Conditions Observed on the Field for Testing Active Energy Meters 126
New IEC standards for the measurement of sheet resistance on large-area graphene using the van der Pauw and the in-line four-point probe methods 125
Implementation of electrical resistance tomography for conductivity mapping of nanostructured transparent conductor materials 124
Tomography of memory engrams in self-organizing nanowire connectomes 116
Role of plasma-induced defects in the generation of 1/f noise in graphene 108
Memristive devices for metrological applications 93
Towards new IEC standards for the electrical characterization of graphene 88
Caratterizzazione di Supercondensatori: Elettrodi e Dispositivi 58
Electrical resistance tomography for 2D and thin-film materials: from measurements to image reconstruction 57
Electrical resistance tomography of thin conductive materials with wavelet regularization 48
Memristance and transmemristance in multiterminal memristive systems 43
Magnitude and Phase Calibration of Lock-In Amplifiers, and Analysis of the Noise Response 42
MetSuperCap: Metrology for static and dynamic characterisation of supercapacitors 42
Electrical Resistance Tomography for the investigation of memristive nanowire networks 31
null 26
Totale 12.119
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Categoria #
all - tutte 64.602
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 64.602
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022528 0 0 0 79 67 22 63 78 80 44 30 65
2022/2023932 56 83 107 76 66 148 28 79 165 28 62 34
2023/2024881 61 88 106 78 77 49 119 29 83 38 52 101
2024/20251.405 37 41 75 43 54 99 217 96 181 92 222 248
2025/20265.767 264 297 481 853 606 1.309 635 255 350 385 203 129
2026/2027943 101 304 278 260 0 0 0 0 0 0 0 0
Totale 12.119