At the conference we will present a first draft of a machine-readable refer- ence dataset structure for ERT measurements on thin film materials, based on XLM language. Reference data will include ERT measurements, along with a set of meta- data, such as information about the samples (geometry, materials), the measurement protocol used to perform the ERT multiterminal measurements, the measurements uncertainty, instrumentation specifications.

Reference data for Electrical Resistance Tomography / Cultrera, Alessandro; Germito, Gabriele; Callegaro, Luca. - (2023), pp. 112-113. (Intervento presentato al convegno Mathematical and Statistical Methods for Metrology Joint workshop of ENBIS and MATHMET tenutosi a Torino nel 30-31 Maggio 2023).

Reference data for Electrical Resistance Tomography

alessandro cultrera
;
Gabriele Germito;Luca Callegaro
2023

Abstract

At the conference we will present a first draft of a machine-readable refer- ence dataset structure for ERT measurements on thin film materials, based on XLM language. Reference data will include ERT measurements, along with a set of meta- data, such as information about the samples (geometry, materials), the measurement protocol used to perform the ERT multiterminal measurements, the measurements uncertainty, instrumentation specifications.
2023
Mathematical and Statistical Methods for Metrology Joint workshop of ENBIS and MATHMET
30-31 Maggio 2023
Torino
open
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11696/77599
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