CULTRERA, ALESSANDRO

CULTRERA, ALESSANDRO  

QN Metrologia quantistica e nanotecnologie  

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10th Young Researcher Meeting 2019 / Agostini, Fabio; Aiello, Lorenzo; Antolini, Claudia; Avallone, Guerino; Silvia Baldi, Anna; Buzzelli, Alessandro; Cultrera, Alessandro; D'Agostino, Domenico; D'Agostino, Rocco; Di Stefano, Marco; Giovannelli, Luca; Migliaccio, Marina; Nichelli, Elisa; Pagnanini, Lorenzo; Pietrobon, Davide; Pizzimento, Luca; Pusceddu, Emanuela; Serra, Matteo; Stellato, Francesco; Viavattene., Giorgio. - 1548:(2020), pp. 012001-012039. 2020 Alessandro Cultrera + -
9th Young Researcher Meeting / Agostini, Fabio; Francesco Aldi, Giulio; Antolini, Claudia; Avallone, Guerino; Cattani, Giordano; Cultrera, Alessandro; D'Agostino, Domenico; D'Agostino, Rocco; Delvecchio, Ivan; Di Giorgio, Cinzia; Di Stefano, Marco; Forlenza, Paola; Funicello, Nicola; Giovannelli, Luca; Iemmo, Laura; Gaetano Luciano, Giuseppe; Luongo, Giuseppe; Mancini, Simona; Menegoni, Eloisa; Migliaccio, Marina; Napolitano, Ferdinando; Pagnanini, Lorenzo; Piacentini, Fabrizio; Pietrobon, Davide; Pusceddu, Emanuela; Ripoli, Cristina; Serra, Matteo; Stellato, Francesco. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 1226(2019), p. 011001. [10.1088/1742-6596/1226/1/011001] 2019 Alessandro CultreraFabrizio Piacentini + _2019_J._Phys.__Conf._Ser._1226_011001.pdf
A modified cryostat for photo-electrical characterization of porous materials in controlled atmosphere at very low gas dosage / Cultrera A; Amato G; Boarino L; Lamberti C. - In: AIP ADVANCES. - ISSN 2158-3226. - 4:8(2014). [10.1063/1.4894074] 2014 Cultrera AAMATO, GIAMPIEROBOARINO, LUCA + -
Accuracy in electrical resistance tomography: from measurements to maps / Cultrera, Alessandro; Callegaro, Luca. - (2019), pp. 69-70. ((Intervento presentato al convegno ItENBIS and INRIM Joint Workshop: Mathematical and statistical methods for metrology. 2019 Alessandro CultreraLuca Callegaro -
Band-gap states in unfilled mesoporous nc-TiO2: measurement protocol for electrical characterization / Cultrera A; Boarino L; Amato G; Lamberti C. - In: JOURNAL OF PHYSICS D. APPLIED PHYSICS. - ISSN 0022-3727. - 47:1(2014). [10.1088/0022-3727/47/1/015102] 2014 Cultrera ABOARINO, LUCAAMATO, GIAMPIERO + -
Calibration of lock-in amplifiers in the low-frequency range / Cultrera, A.; Tran, N. M. T.; D'Elia, V.; Ortolano, M.; Callegaro, L.. - (2019), pp. 122-125. ((Intervento presentato al convegno 23rd IMEKO TC4 International Symposium on Electrical & Electronic Measurements tenutosi a Xi'an, China nel 17-20 September. 2019 A. CultreraV. D'EliaL. Callegaro + IMEKO-TC4-2019_PROCEEDINGS-ISBN.pdf
A calibration-verification testbed for electrical energy meters under low power quality conditions / Callegaro, Luca; Aprile, Giulia; Cultrera, Alessandro; Galliana, Flavio; Germito, Gabriele; Serazio, Danilo; Trinchera, Bruno. - In: MEASUREMENT. SENSORS. - ISSN 2665-9174. - 18(2021), p. 100188. [10.1016/j.measen.2021.100188] 2021 Callegaro, LucaAprile, GiuliaCultrera, AlessandroGalliana, FlavioGermito, GabrieleSerazio, DaniloTrinchera, Bruno 1-s2.0-S2665917421001513-main.pdf
A calibration-verification testbed for electrical energy meters under low power quality conditions / Callegaro, Luca; Aprile, Giulia; Cultrera, Alessandro; Galliana, Flavio; Germito, Gabriele; Serazio, Danilo; Trinchera, BRUNO OTTAVIO. - (2021), pp. 230-233. ((Intervento presentato al convegno XXIII IMEKO World Congress 2021. 2021 Luca CallegaroGiulia AprileAlessandro CultreraFlavio GallianaGabriele GermitoDanilo SerazioBruno Trinchera Callegaro2021_IMEKO2021.pdf
A correlation noise spectrometer for flicker noise measurement in graphene samples / Marzano, Martina; Cultrera, Alessandro; Ortolano, Massimo; Callegaro, Luca. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 30:3(2019), p. 035102. [10.1088/1361-6501/aafcab] 2019 Marzano, MartinaCultrera, AlessandroCallegaro, Luca + Marzano_2019_Meas._Sci._Technol._30_035102 (1).pdf
Electrical Resistance Tomography of Conductive Thin Films / Cultrera, Alessandro; Callegaro, Luca. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 65:9(2016), pp. 2101-2107. [10.1109/TIM.2016.2570127] 2016 Cultrera, AlessandroCALLEGARO, LUCA 07484320.pdfCultrera_IEEE_ERT_2016_post_print_accepted.pdf
Electrical Resistance Tomography on thin films: Sharp conductive profiles / Cultrera, Alessandro; Callegaro, Luca. - (2015), pp. 297-301. ((Intervento presentato al convegno IEEE 1st International Forum on Research and Tecnologies for Society and Industry Leveraging a better tomorrow (RTSI) tenutosi a Torino, Italy nel 16-18 Sept. 2015 [10.1109/RTSI.2015.7325114]. 2015 CULTRERA, ALESSANDROCallegaro, Luca 07325114.pdf
EMPIR GRACE - Good Practice Guides on the electrical characterisation of graphene using contact- and non-contact methods / Cultrera, A.; Raso, F.; Kazakova, O.; Zurutuza, A.; Taboada, E.; Fabricius, N.; Kretinin, A.; Fabricius, A.; Callegaro, L.. - (2020), p. 46. ((Intervento presentato al convegno Graphene Industrial Forum &2DM 2020 tenutosi a Online nel 27 may 2020. 2020 A. CultreraL. Callegaro + -
Good Practice Guide on the electrical characterisation of graphene using contact methods / Fabricius, Alexandra; Catanzaro, Alessandro; Cultrera, Alessandro; Isidro Raso Alonso, Félix; Matias Hernandez, Laura; Catanzaro, Alessandro; Camarchia, Vittorio; Callegaro, Luca. - (2020). 2020 Alessandro CultreraLuca Callegaro + 20200428_GRACE_GPG_1_v1.pdf
Good Practice Guide on the electrical characterisation of graphene using non-contact and high throughput methods / Fabricius, Alexandra; Cultrera, Alessandro; Catanzaro, Alessandro; Huang, Nathaniel J.; Melios, Christos; Hao, Ling; Gallop, John; Arnedo, Israel; Etayo, David; Taboada, Elena; Kazakova, Olga. - (2020). 2020 Alessandro Cultrera + 20200428_GRACE_GPG_2_v1.pdf
GRACE — Methods for the Electrical Characterization of Graphene / Cultrera, A.; Callegaro, L.; Matías, L.; Raso, F.; Huang, N. J.; Melios, C.; Hao, L.; Gallop, J.; Kazakova, O.; Arnedo, I.; Etayo, D.; Taboada, E.; Redo-Sanchez, A.; Fabricius, A.. - (2019). ((Intervento presentato al convegno Joint Workshop “GRACE at the Graphene Week 2019. 2019 A. CultreraL. Callegaro + -
GRACE: Developing Electrical Characterisation Methods for Future Graphene Electronics / Callegaro, L.; Cassiago, C.; Cultrera, A.; D'Elia, V.; Serazio, D.; Ortolano, M.; Marzano, M.; Kazakova, O.; Melios, C.; Raso, F.; Matias, L.; Zurutuza, A.; Centeno, A.; Redo-Sanchez, A.; Kretinin, A.; Sann-Ferro, K.; Fabricius, A.; Weking, G.; Bergholz, W.; Fabricius, N.. - (2018). ((Intervento presentato al convegno 2018 Conference on Precision Electromagnetic Measurements tenutosi a Paris, France nel 8-13 July 2018 [10.1109/CPEM.2018.8501012]. 2018 L. CallegaroC. CassiagoA. CultreraV. D'EliaD. Serazio + ConfDig-CPEM2018_08501012.pdf
Mapping the conductivity of graphene with Electrical Resistance Tomography / Cultrera, Alessandro; Serazio, Danilo; Zurutuza, Amaia; Centeno, Alba; Txoperena, Oihana; Etayo, David; Cordon, Alvaro; Redo-Sanchez, Albert; Arnedo, Israel; Ortolano, Massimo; Callegaro, Luca. - In: SCIENTIFIC REPORTS. - ISSN 2045-2322. - 9:1(2019), p. 10655. [10.1038/s41598-019-46713-8] 2019 Cultrera, AlessandroSerazio, DaniloCallegaro, Luca + Cultrera2019.pdf
Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials / Milano, Gianluca; Cultrera, Alessandro; Bejtka, Katarzyna; DE LEO, Maria; Callegaro, Luca; Ricciardi, Carlo; Boarino, Luca. - In: ACS APPLIED NANO MATERIALS. - ISSN 2574-0970. - 3:12(2020), pp. 11987-11997. [10.1021/acsanm.0c02204] 2020 Gianluca MilanoAlessandro CultreraNatascia De LeoLuca CallegaroLuca Boarino + Manuscript_revised_3.pdfacsanm.0c02204.pdf
Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications / Arpaia, Pasquale; Callegaro, Luca; Cultrera, Alessandro; Esposito, Antonio; Ortolano, Massimo. - (2021), pp. 1-5. ((Intervento presentato al convegno 2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT) [10.1109/MetroInd4.0IoT51437.2021.9488445]. 2021 Callegaro, LucaCultrera, AlessandroOrtolano, Massimo + Metrological_characterization_of_a_low-cost_electroencephalograph_for_wearable_neural_interfaces_in_industry_4.0_applications.pdf
Metrological characterization of consumer-grade equipment for wearable brain-computer interfaces and extended reality / Arpaia, Pasquale; Callegaro, Luca; Cultrera, Alessandro; Esposito, Antonio; Ortolano, Massimo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - (2021), pp. 1-1. [10.1109/TIM.2021.3127650] 2021 Callegaro, LucaCultrera, AlessandroOrtolano, Massimo + Metrological_characterization_of_consumer-grade_equipment_for_wearable_brain-computer_interfaces_and_extended_reality.pdf