Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials

Metallic nanowire (NW) networks have attracted great attention as promising transparent conductive materials thanks to the low sheet resistance, high transparency, low cost production, and compatibility with flexible substrates. Despite many efforts having been devoted to investigating the conduction mechanism, a quantitative characterization of local electrical properties of nanowire networks at the macroscale still represents a challenge. In this work, we report on the investigation of local electrical properties and their evolution over time of Ag NW networks by means of electrical resistance tomography (ERT). Spatial correlation of local conductivity properties and optical transparency revealed that the nonscanning and rapid ERT technique allows to probe local electrical inhomogeneities in the NW network, differently from conventional measurement techniques such as van der Pauw and the four-point probe. In addition, ERT mapping over time was employed for in situ monitoring the evolution of Ag NW networks conductivity, elucidating the dependence of the degradation of local electrical properties under ambient exposure on the initial conductivity. Our results shed light on the importance of the characterization of local electrical properties of NW networks where uniformity and stability represent the main challenges to overcome for their use as transparent conductive materials.