We present a high-resolution digital correlation spectrum analyzer for the measurement of low frequency resistance fluctuations in graphene samples. The system exploits the cross-correlation method to reject the amplifiers' noise. The graphene sample is excited with a low-noise DC current. The output voltage is fed to two two-stage low-noise amplifiers connected in parallel; the DC signal component is filtered by a high-pass filter with a cutoff frequency of 34 mHz. The amplified signals are digitized by a two-channel synchronous ADC board; the cross-periodogram, which rejects uncorrelated amplifiers' noise components, is computed in real time. As a practical example, we measured the noise cross-spectrum of graphene samples in the frequency range from 0.153 Hz to 10 kHz, both in two- and four-wire configurations, and for different bias currents. We report here the measurement setup, the data analysis and the error sources.

A correlation noise spectrometer for flicker noise measurement in graphene samples / Marzano, Martina; Cultrera, Alessandro; Ortolano, Massimo; Callegaro, Luca. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 30:3(2019), p. 035102. [10.1088/1361-6501/aafcab]

A correlation noise spectrometer for flicker noise measurement in graphene samples

Marzano, Martina
;
Cultrera, Alessandro;Callegaro, Luca
2019

Abstract

We present a high-resolution digital correlation spectrum analyzer for the measurement of low frequency resistance fluctuations in graphene samples. The system exploits the cross-correlation method to reject the amplifiers' noise. The graphene sample is excited with a low-noise DC current. The output voltage is fed to two two-stage low-noise amplifiers connected in parallel; the DC signal component is filtered by a high-pass filter with a cutoff frequency of 34 mHz. The amplified signals are digitized by a two-channel synchronous ADC board; the cross-periodogram, which rejects uncorrelated amplifiers' noise components, is computed in real time. As a practical example, we measured the noise cross-spectrum of graphene samples in the frequency range from 0.153 Hz to 10 kHz, both in two- and four-wire configurations, and for different bias currents. We report here the measurement setup, the data analysis and the error sources.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11696/61085
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