RIBOTTA, LUIGI

RIBOTTA, LUIGI  

AE Metrologia applicata e ingegneria  

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3D characterization of printed structures by stylus- and optical-based measurements / Bellotti, Roberto; Maras, Claire; Picotto, Gian Bartolo; Pometto, Marco; Ribotta, Luigi. - (2018), pp. 493-494. (Intervento presentato al convegno 18th international conference of the european society for precision engineering and nanotechnology tenutosi a Venice, Italy nel Monday 4th to Friday 8th June 2018). 2018 Bellotti, RobertoPicotto, Gian BartoloPometto, MarcoRibotta, Luigi + 3D characterization of printed structures by stylus- and optical-based measurements_euspen 2018 .pdf
A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness / Ribotta, Luigi; Giura, Andrea; Bellotti, Roberto; Zucco, Massimo. - (2023). (Intervento presentato al convegno NanoScale 2023 (Euramet)). 2023 Luigi RibottaAndrea GiuraRoberto BellottiMassimo Zucco Poster Ribotta NanoScale 2023 - MG.pdf
A function-driven characterization of printed conductors on PV cells / Bellotti, Roberto; Furin, Valentina; Maras, Claire; Picotto, Gianbartolo; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - 6:2(2018), p. 025002. [10.1088/2051-672x/aabe20] 2018 Roberto BellottiGianbartolo PicottoLuigi Ribotta + Bellotti_2018_Surf._Topogr.__Metrol._Prop._6_025002.pdfA function-driven characterization of printed conductors on PV cells_submitted manuscript.pdf
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes / Bellotti, Roberto; Picotto Gian, Bartolo; Ribotta, Luigi. - In: NANOMANUFACTURING AND METROLOGY. - ISSN 2520-8128. - (2022). [10.1007/s41871-022-00125-x] 2022 Bellotti RobertoRibotta Luigi + Bellotti2022.pdf
AFM metrology of shape controlled TiO2 nanoparticles / Maurino, Valter; Pellegrino, Francesco; Bartolo Picotto, Gian; Ribotta, Luigi. - (2018). (Intervento presentato al convegno NanoInnovation 2018 Conference&Exhibition). 2018 Luigi Ribotta + -
Atomic force microscopy metrology of non-spherical nanoparticles / Maurino, Valter; Pellegrino, Francesco; Bartolo PICOTTO, Gian; Ribotta, Luigi. - (2020). (Intervento presentato al convegno 106° Congresso Nazionale Società Italiana di Fisica nel 14-18 Settembre 2020). 2020 Luigi Ribotta + -
Dimensional metrology at the nanoscale: quantitative characterization of nanoparticles by means of metrological atomic force microscopy / Ribotta, Luigi. - (2022). 2022 Luigi Ribotta PhD_thesis_Ribotta.pdf
INRiM Technical Report 26/2020 - Indoor and outdoor measurements of particulate matter concentration in air during wintertime performed in INRiM Campus and in the CNR Research Area of Turin by using particle counters / Ribotta, Luigi. - (2020). 2020 Luigi Ribotta I.N.RI.M. TECHNICAL REPORT 26-2020.pdf
Metrologia di superfici funzionali per la caratterizzazione di celle fotovoltaiche / Valentina, Furin; Gian Bartolo, Picotto; Ribotta, Luigi. - (2019). (Intervento presentato al convegno A&T - Automation & Testing - LA FIERA DEDICATA A INDUSTRIA 4.0, MISURE E PROVE, ROBOTICA, TECNOLOGIE INNOVATIVE). 2019 RIBOTTA, LUIGI + 1218_Ribotta_INRIM_abstract esteso.pdf
Metrological characterization of nanoparticles by mAFM / Maurino, Valter; Pellegrino, Francesco; Bartolo Picotto, Gian; Ribotta, Luigi. - (2019). (Intervento presentato al convegno 6th Nano Today Conference nel 16-20 Giugno 2019). 2019 Luigi Ribotta + -
Morphology-driven parameters of engineered functional surfaces / Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Picotto, Gianbartolo; Ribotta, Luigi. - (2017). (Intervento presentato al convegno MacroScale 2017 - Recent Developments in Traceable Dimensional Measurements tenutosi a Espoo, Finland nel October 17th to 19th, 2017). 2017 Bellotti, RobertoPicotto GianbartoloRIBOTTA, LUIGI + -
Nanodimensional characterization on nanowires: an interlaboratory comparison between AFMs / Ribotta, Luigi; Cara, Eleonora; Bellotti, Roberto; DE CARLO, Ivan; Fretto, Matteo; Delvallée, Alexandra; Knulst, Walter; Koops, Richard; Torre, Bruno; Boarino, Luca. - (2023). (Intervento presentato al convegno NanoScale 2023 (Euramet)). 2023 Luigi RibottaEleonora CaraRoberto BellottiIvan De CarloMatteo FrettoBruno TorreLuca Boarino + Poster Ribotta NanoScale 2023 - Nanowires.pdf
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells / Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Picotto, Gianbartolo; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - 7:3(2019), p. 035009. [10.1088/2051-672x/ab370e] 2019 Roberto BellottiGianbartolo PicottoLuigi Ribotta + Bellotti_2019_Surf._Topogr.__Metrol._Prop._7_035009.pdfBellotti+et+al_2019_Surf._Topogr.__Metrol._Prop._10.1088_2051-672X_ab370e_Accepted Manuscript.pdf
Quantitative 3D determination of dimensional parameters of surfaces by optical profilometer’s images / Ribotta, Luigi; Giura, Andrea; Zucco, Massimo. - (2023). (Intervento presentato al convegno NanoScale 2023 (Euramet)). 2023 Luigi ribottaAndrea GiuraMassimo Zucco Poster Ribotta NanoScale 2023 - Program.pdf
Quantitative analysis and processing of surfaces and profiles from profilometry images / Giura, A.; Zucco, M.; Balsamo, A.; Ribotta, L.. - (2023). (Intervento presentato al convegno Mathematical and Statistical Methods for Metrology tenutosi a Torino nel 2023-05-30/31). 2023 A. GiuraM. ZuccoA. BalsamoL. Ribotta 2023-05 MSMM Torino - Profilometro (da booklet of abstracts).pdf
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy / Maurino, Valter; Pellegrino, Francesco; bartolo picotto, Gian; Ribotta, Luigi. - In: ULTRAMICROSCOPY. - ISSN 0304-3991. - (2022). [10.1016/j.ultramic.2022.113480] 2022 Luigi Ribotta + 1-s2.0-S0304399122000171-main.pdfULTRAM-D-21-00168R1_post+print (1).pdf
Quarantena / Ribotta, Luigi. - (2020). 2020 luigi ribotta -
Software implementation for processing and quantitative analysis of surfaces and profiles from profilometry images / Giura, Andrea; Ribotta, Luigi. - (2023). 2023 Andrea GiuraLuigi Ribotta May2023_TR_Giura_Ribotta.pdf
Tip-sample characterization in the AFM study of a rod-shaped nanostructure / Picotto, G; Vallino, M; Ribotta, L. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 31:8(2020), p. 084001. [10.1088/1361-6501/ab7bc2] 2020 Picotto, GRibotta, L + Picotto_2020_Meas._Sci._Technol._31_084001.pdfPicotto+et+al_2020_Meas._Sci._Technol._10.1088_1361-6501_ab7bc2_accepted manuscript.pdf
Tip-sample interaction in the AFM characterization of bio-plant nanostructures / Carofiglio, Marco; Damiani, Manuel; Giordano, Marco; Nguyen, Linh; Bartolo Picotto, Gian; Ribotta, Luigi; Vallino, Marta. - (2019). (Intervento presentato al convegno 6th Nano Today Conference nel 16-20 Giugno 2019). 2019 Luigi Ribotta + -