RIBOTTA, LUIGI
RIBOTTA, LUIGI
AE Metrologia applicata e ingegneria
3D characterization of printed structures by stylus- and optical-based measurements
2018 Bellotti, Roberto; Maras, Claire; Picotto, Gian Bartolo; Pometto, Marco; Ribotta, Luigi
A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness
2023 Ribotta, Luigi; Giura, Andrea; Bellotti, Roberto; Zucco, Massimo
A function-driven characterization of printed conductors on PV cells
2018 Bellotti, Roberto; Furin, Valentina; Maras, Claire; Picotto, Gianbartolo; Ribotta, Luigi
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes
2022 Bellotti, Roberto; Picotto Gian, Bartolo; Ribotta, Luigi
AFM metrology of shape controlled TiO2 nanoparticles
2018 Maurino, Valter; Pellegrino, Francesco; Bartolo Picotto, Gian; Ribotta, Luigi
Atomic force microscopy metrology of non-spherical nanoparticles
2020 Maurino, Valter; Pellegrino, Francesco; Bartolo PICOTTO, Gian; Ribotta, Luigi
Dimensional metrology at the nanoscale: quantitative characterization of nanoparticles by means of metrological atomic force microscopy
2022 Ribotta, Luigi
INRiM Technical Report 26/2020 - Indoor and outdoor measurements of particulate matter concentration in air during wintertime performed in INRiM Campus and in the CNR Research Area of Turin by using particle counters
2020 Ribotta, Luigi
Metrologia di superfici funzionali per la caratterizzazione di celle fotovoltaiche
2019 Valentina, Furin; Gian Bartolo, Picotto; Ribotta, Luigi
Metrological characterization of nanoparticles by mAFM
2019 Maurino, Valter; Pellegrino, Francesco; Bartolo Picotto, Gian; Ribotta, Luigi
Morphology-driven parameters of engineered functional surfaces
2017 Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Picotto, Gianbartolo; Ribotta, Luigi
Nanodimensional characterization on nanowires: an interlaboratory comparison between AFMs
2023 Ribotta, Luigi; Cara, Eleonora; Bellotti, Roberto; DE CARLO, Ivan; Fretto, Matteo; Delvallée, Alexandra; Knulst, Walter; Koops, Richard; Torre, Bruno; Boarino, Luca
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells
2019 Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Picotto, Gianbartolo; Ribotta, Luigi
Quantitative 3D determination of dimensional parameters of surfaces by optical profilometer’s images
2023 Ribotta, Luigi; Giura, Andrea; Zucco, Massimo
Quantitative analysis and processing of surfaces and profiles from profilometry images
2023 Giura, A.; Zucco, M.; Balsamo, A.; Ribotta, L.
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy
2022 Maurino, Valter; Pellegrino, Francesco; bartolo picotto, Gian; Ribotta, Luigi
Quarantena
2020 Ribotta, Luigi
Software implementation for processing and quantitative analysis of surfaces and profiles from profilometry images
2023 Giura, Andrea; Ribotta, Luigi
Tip-sample characterization in the AFM study of a rod-shaped nanostructure
2020 Picotto, G; Vallino, M; Ribotta, L
Tip-sample interaction in the AFM characterization of bio-plant nanostructures
2019 Carofiglio, Marco; Damiani, Manuel; Giordano, Marco; Nguyen, Linh; Bartolo Picotto, Gian; Ribotta, Luigi; Vallino, Marta
Citazione | Data di pubblicazione | Autori | File |
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3D characterization of printed structures by stylus- and optical-based measurements / Bellotti, Roberto; Maras, Claire; Picotto, Gian Bartolo; Pometto, Marco; Ribotta, Luigi. - (2018), pp. 493-494. (Intervento presentato al convegno 18th international conference of the european society for precision engineering and nanotechnology tenutosi a Venice, Italy nel Monday 4th to Friday 8th June 2018). | 2018 | Bellotti, RobertoPicotto, Gian BartoloPometto, MarcoRibotta, Luigi + | 3D characterization of printed structures by stylus- and optical-based measurements_euspen 2018 .pdf |
A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness / Ribotta, Luigi; Giura, Andrea; Bellotti, Roberto; Zucco, Massimo. - (2023). (Intervento presentato al convegno NanoScale 2023 (Euramet)). | 2023 | Luigi RibottaAndrea GiuraRoberto BellottiMassimo Zucco | Poster Ribotta NanoScale 2023 - MG.pdf |
A function-driven characterization of printed conductors on PV cells / Bellotti, Roberto; Furin, Valentina; Maras, Claire; Picotto, Gianbartolo; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - 6:2(2018), p. 025002. [10.1088/2051-672x/aabe20] | 2018 | Roberto BellottiGianbartolo PicottoLuigi Ribotta + | Bellotti_2018_Surf._Topogr.__Metrol._Prop._6_025002.pdf; A function-driven characterization of printed conductors on PV cells_submitted manuscript.pdf |
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes / Bellotti, Roberto; Picotto Gian, Bartolo; Ribotta, Luigi. - In: NANOMANUFACTURING AND METROLOGY. - ISSN 2520-8128. - (2022). [10.1007/s41871-022-00125-x] | 2022 | Bellotti RobertoRibotta Luigi + | Bellotti2022.pdf |
AFM metrology of shape controlled TiO2 nanoparticles / Maurino, Valter; Pellegrino, Francesco; Bartolo Picotto, Gian; Ribotta, Luigi. - (2018). (Intervento presentato al convegno NanoInnovation 2018 Conference&Exhibition). | 2018 | Luigi Ribotta + | - |
Atomic force microscopy metrology of non-spherical nanoparticles / Maurino, Valter; Pellegrino, Francesco; Bartolo PICOTTO, Gian; Ribotta, Luigi. - (2020). (Intervento presentato al convegno 106° Congresso Nazionale Società Italiana di Fisica nel 14-18 Settembre 2020). | 2020 | Luigi Ribotta + | - |
Dimensional metrology at the nanoscale: quantitative characterization of nanoparticles by means of metrological atomic force microscopy / Ribotta, Luigi. - (2022). | 2022 | Luigi Ribotta | PhD_thesis_Ribotta.pdf |
INRiM Technical Report 26/2020 - Indoor and outdoor measurements of particulate matter concentration in air during wintertime performed in INRiM Campus and in the CNR Research Area of Turin by using particle counters / Ribotta, Luigi. - (2020). | 2020 | Luigi Ribotta | I.N.RI.M. TECHNICAL REPORT 26-2020.pdf |
Metrologia di superfici funzionali per la caratterizzazione di celle fotovoltaiche / Valentina, Furin; Gian Bartolo, Picotto; Ribotta, Luigi. - (2019). (Intervento presentato al convegno A&T - Automation & Testing - LA FIERA DEDICATA A INDUSTRIA 4.0, MISURE E PROVE, ROBOTICA, TECNOLOGIE INNOVATIVE). | 2019 | RIBOTTA, LUIGI + | 1218_Ribotta_INRIM_abstract esteso.pdf |
Metrological characterization of nanoparticles by mAFM / Maurino, Valter; Pellegrino, Francesco; Bartolo Picotto, Gian; Ribotta, Luigi. - (2019). (Intervento presentato al convegno 6th Nano Today Conference nel 16-20 Giugno 2019). | 2019 | Luigi Ribotta + | - |
Morphology-driven parameters of engineered functional surfaces / Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Picotto, Gianbartolo; Ribotta, Luigi. - (2017). (Intervento presentato al convegno MacroScale 2017 - Recent Developments in Traceable Dimensional Measurements tenutosi a Espoo, Finland nel October 17th to 19th, 2017). | 2017 | Bellotti, RobertoPicotto GianbartoloRIBOTTA, LUIGI + | - |
Nanodimensional characterization on nanowires: an interlaboratory comparison between AFMs / Ribotta, Luigi; Cara, Eleonora; Bellotti, Roberto; DE CARLO, Ivan; Fretto, Matteo; Delvallée, Alexandra; Knulst, Walter; Koops, Richard; Torre, Bruno; Boarino, Luca. - (2023). (Intervento presentato al convegno NanoScale 2023 (Euramet)). | 2023 | Luigi RibottaEleonora CaraRoberto BellottiIvan De CarloMatteo FrettoBruno TorreLuca Boarino + | Poster Ribotta NanoScale 2023 - Nanowires.pdf |
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells / Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Picotto, Gianbartolo; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - 7:3(2019), p. 035009. [10.1088/2051-672x/ab370e] | 2019 | Roberto BellottiGianbartolo PicottoLuigi Ribotta + | Bellotti_2019_Surf._Topogr.__Metrol._Prop._7_035009.pdf; Bellotti+et+al_2019_Surf._Topogr.__Metrol._Prop._10.1088_2051-672X_ab370e_Accepted Manuscript.pdf |
Quantitative 3D determination of dimensional parameters of surfaces by optical profilometer’s images / Ribotta, Luigi; Giura, Andrea; Zucco, Massimo. - (2023). (Intervento presentato al convegno NanoScale 2023 (Euramet)). | 2023 | Luigi ribottaAndrea GiuraMassimo Zucco | Poster Ribotta NanoScale 2023 - Program.pdf |
Quantitative analysis and processing of surfaces and profiles from profilometry images / Giura, A.; Zucco, M.; Balsamo, A.; Ribotta, L.. - (2023). (Intervento presentato al convegno Mathematical and Statistical Methods for Metrology tenutosi a Torino nel 2023-05-30/31). | 2023 | A. GiuraM. ZuccoA. BalsamoL. Ribotta | 2023-05 MSMM Torino - Profilometro (da booklet of abstracts).pdf |
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy / Maurino, Valter; Pellegrino, Francesco; bartolo picotto, Gian; Ribotta, Luigi. - In: ULTRAMICROSCOPY. - ISSN 0304-3991. - (2022). [10.1016/j.ultramic.2022.113480] | 2022 | Luigi Ribotta + | 1-s2.0-S0304399122000171-main.pdf; ULTRAM-D-21-00168R1_post+print (1).pdf |
Quarantena / Ribotta, Luigi. - (2020). | 2020 | luigi ribotta | - |
Software implementation for processing and quantitative analysis of surfaces and profiles from profilometry images / Giura, Andrea; Ribotta, Luigi. - (2023). | 2023 | Andrea GiuraLuigi Ribotta | May2023_TR_Giura_Ribotta.pdf |
Tip-sample characterization in the AFM study of a rod-shaped nanostructure / Picotto, G; Vallino, M; Ribotta, L. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 31:8(2020), p. 084001. [10.1088/1361-6501/ab7bc2] | 2020 | Picotto, GRibotta, L + | Picotto_2020_Meas._Sci._Technol._31_084001.pdf; Picotto+et+al_2020_Meas._Sci._Technol._10.1088_1361-6501_ab7bc2_accepted manuscript.pdf |
Tip-sample interaction in the AFM characterization of bio-plant nanostructures / Carofiglio, Marco; Damiani, Manuel; Giordano, Marco; Nguyen, Linh; Bartolo Picotto, Gian; Ribotta, Luigi; Vallino, Marta. - (2019). (Intervento presentato al convegno 6th Nano Today Conference nel 16-20 Giugno 2019). | 2019 | Luigi Ribotta + | - |