RIBOTTA, LUIGI

RIBOTTA, LUIGI  

AE Metrologia applicata e ingegneria  

Risultati 1 - 5 di 5 (tempo di esecuzione: 0.013 secondi).
Citazione Data di pubblicazione Autore(i) File
3D characterization of printed structures by stylus- and optical-based measurements / Bellotti, Roberto; Maras, Claire; Picotto, Gian Bartolo; Pometto, Marco; Ribotta, Luigi. - (2018), pp. 493-494. ((Intervento presentato al convegno 18th international conference of the european society for precision engineering and nanotechnology tenutosi a Venice, Italy nel Monday 4th to Friday 8th June 2018. 2018 Bellotti, RobertoPicotto, Gian BartoloPometto, MarcoRibotta, Luigi + 3D characterization of printed structures by stylus- and optical-based measurements_euspen 2018 .pdf
A function-driven characterization of printed conductors on PV cells / Bellotti, Roberto; Furin, Valentina; Maras, Claire; Picotto, Gianbartolo; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - 6:2(2018), p. 025002. [10.1088/2051-672x/aabe20] 2018 Roberto BellottiGianbartolo PicottoLuigi Ribotta + Bellotti_2018_Surf._Topogr.__Metrol._Prop._6_025002.pdfA function-driven characterization of printed conductors on PV cells_submitted manuscript.pdf
Morphology-driven parameters of engineered functional surfaces / Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Picotto, Gianbartolo; Ribotta, Luigi. - (2017). ((Intervento presentato al convegno MacroScale 2017 - Recent Developments in Traceable Dimensional Measurements tenutosi a Espoo, Finland nel October 17th to 19th, 2017. 2017 Bellotti, RobertoPicotto GianbartoloRIBOTTA, LUIGI + -
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells / Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Picotto, Gianbartolo; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - 7:3(2019), p. 035009. [10.1088/2051-672x/ab370e] 2019 Roberto BellottiGianbartolo PicottoLuigi Ribotta + Bellotti_2019_Surf._Topogr.__Metrol._Prop._7_035009.pdfBellotti+et+al_2019_Surf._Topogr.__Metrol._Prop._10.1088_2051-672X_ab370e_Accepted Manuscript.pdf
Tip-sample characterization in the AFM study of a rod-shaped nanostructure / Picotto, G; Vallino, M; Ribotta, L. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 31:8(2020), p. 084001. [10.1088/1361-6501/ab7bc2] 2020 Picotto, GRibotta, L + Picotto_2020_Meas._Sci._Technol._31_084001.pdfPicotto+et+al_2020_Meas._Sci._Technol._10.1088_1361-6501_ab7bc2_accepted manuscript.pdf