BELLOTTI, ROBERTO

BELLOTTI, ROBERTO  

AE Metrologia applicata e ingegneria  

Risultati 1 - 12 di 12 (tempo di esecuzione: 0.004 secondi).
Citazione Data di pubblicazione Autore(i) File
3D characterization of printed structures by stylus- and optical-based measurements / Bellotti, Roberto; Maras, Claire; Picotto, Gian Bartolo; Pometto, Marco; Ribotta, Luigi. - (2018), pp. 493-494. ((Intervento presentato al convegno 18th international conference of the european society for precision engineering and nanotechnology tenutosi a Venice, Italy nel Monday 4th to Friday 8th June 2018. 2018 Bellotti, RobertoPicotto, Gian BartoloPometto, MarcoRibotta, Luigi + 3D characterization of printed structures by stylus- and optical-based measurements_euspen 2018 .pdf
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) / Coveney, Tim; Matus, Michael; Wang, Shihua; Byman, Ville; Lassila, Antti; Alqahtani, Nasser; Alqahtani, Faisal; Sumner, Dean; Spiller, Jürg; Meli, Felix; Picotto, Gian Bartolo; Bellotti, Roberto; Sato, Osamu; Sharma, Rina; Moona, Girija; Kumar, Vinod; Rodríguez, Joaquín; Prieto, Emilio; Meral, İlker; Ganioğlu, Okhan; Salgado, José; Wójtowicz, Adam; Skalník, Pavel; Zelený, Vít; Stoup, John; Kotte, Gerard; Koops, Richard; Arizmendi, Edgar; Wang, Weinong; Jakobsson, Agneta; Duta, Alexandru; Dugheanu, Elena; Reain, Greg; Szikszai, Gábor. - In: METROLOGIA. - ISSN 0026-1394. - 57:1A(2020), pp. 04002-04002. [10.1088/0026-1394/57/1A/04002] 2020 Picotto, Gian BartoloBellotti, Roberto + EURAMET.L-K5-2016.pdf
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale / Picotto, Gian Bartolo; Bellotti, Roberto; Sosso, Andrea. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 31:10(2020), p. 104006. [10.1088/1361-6501/ab9038] 2020 Picotto, Gian BartoloBellotti, RobertoSosso, Andrea Picotto+et+al_2020_Meas._Sci._Technol._10.1088_1361-6501_ab9038_accepted manuscript.pdfPicotto_2020_Meas._Sci._Technol._31_104006.pdf
Droplet volume variability as a critical factor for accuracy of absolute quantification using droplet digital PCR / Bogožalec Košir, Alexandra; Divieto, Carla; Pavšič, Jernej; Pavarelli, Stefano; Dobnik, David; Dreo, Tanja; Bellotti, Roberto; Sassi, MARIA PAOLA; Žel, Jana. - In: ANALYTICAL AND BIOANALYTICAL CHEMISTRY. - ISSN 1618-2642. - 409:28(2017), pp. 6689-6697. [10.1007/s00216-017-0625-y] 2017 Carla DivietoStefano PavarelliRoberto BellottiMaria Paola Sassi + 216_2017_Article_625.pdf
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' / Mudronja, Vedran; Šimunovic, Vedran; Acko, Bojan; Matus, Michael; Bánréti, Edit; István, Dicso; Thalmann, Rudolf; Lassila, Antti; Lillepea, Lauri; Picotto, Gianbartolo; Bellotti, Roberto; Pometto, Marco; Ganioglu, Okhan; Meral, Ilker; Antonio Salgado, José; Georges, Vailleau. - In: METROLOGIA. - ISSN 0026-1394. - 52:1A(2015), pp. 04003-04003. [10.1088/0026-1394/52/1A/04003] 2015 Picotto, GianbartoloBellotti, RobertoPOMETTO, MARCO + EURAMET.L-S21.pdf
A function-driven characterization of printed conductors on PV cells / Bellotti, Roberto; Furin, Valentina; Maras, Claire; Picotto, Gianbartolo; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - 6:2(2018), p. 025002. [10.1088/2051-672x/aabe20] 2018 Roberto BellottiGianbartolo PicottoLuigi Ribotta + Bellotti_2018_Surf._Topogr.__Metrol._Prop._6_025002.pdfA function-driven characterization of printed conductors on PV cells_submitted manuscript.pdf
Morphology-driven parameters of engineered functional surfaces / Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Picotto, Gianbartolo; Ribotta, Luigi. - (2017). ((Intervento presentato al convegno MacroScale 2017 - Recent Developments in Traceable Dimensional Measurements tenutosi a Espoo, Finland nel October 17th to 19th, 2017. 2017 Bellotti, RobertoPicotto GianbartoloRIBOTTA, LUIGI + -
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells / Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Picotto, Gianbartolo; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - 7:3(2019), p. 035009. [10.1088/2051-672x/ab370e] 2019 Roberto BellottiGianbartolo PicottoLuigi Ribotta + Bellotti_2019_Surf._Topogr.__Metrol._Prop._7_035009.pdfBellotti+et+al_2019_Surf._Topogr.__Metrol._Prop._10.1088_2051-672X_ab370e_Accepted Manuscript.pdf
Recent advances of the metrological AFM at INRIM / Bellotti, R.; Picotto, Gianbartolo. - 9173(2014), p. 917304. ((Intervento presentato al convegno Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII, 917304 (27 August 2014) tenutosi a San Diego (USA) nel 27 August 2014. 2014 Bellotti, R.Picotto, Gianbartolo -
Renewal of the gage-block interferometer at INRIM / Bellotti, Roberto; Franco, Mauro; Picotto, Gianbartolo; Pometto, Marco. - MacroScale website papers(2015). ((Intervento presentato al convegno MacroScale 2014 - Recent developments in traceable dimensional measurements tenutosi a Vienna (Austria) nel 28th-30th October 2014. 2015 Bellotti, RobertoFRANCO, MAUROPicotto, GianbartoloPometto, Marco Renewal of .. Macroscale2014.pdf
Strain measurements of cylinder magnetostrictive samples by interferometer readings / Bellotti, Roberto; Mei, Pasquale; Picotto, Gianbartolo; Santiano, Marco; Zucca, Mauro. - :P6.19(2017), pp. 379-380. ((Intervento presentato al convegno 17th International EUSPEN Conference & Exhibition tenutosi a Hannover (DE) nel 29th May - 2nd June 2017. 2017 Bellotti, RobertoPicotto, GianbartoloSantiano, MarcoZucca, Mauro + Strain measurements ..._EUSPEN Conf Proceedings 2017.pdf
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support / Jones, Christopher; Santiano, Marco; Downes, Stephen; Bellotti, Roberto; O’Connor, Daniel; Picotto, Gianbartolo. - :P1.63(2016), pp. 171-172. ((Intervento presentato al convegno Euspen’s 16th International Conference & Exhibition tenutosi a Nottingham (UK) nel May 30th – 3rd June 2016. 2016 Marco SantianoRoberto BellottiGianbartolo Picotto + A universal substrate ... Proc. EUSPEN 2016.pdf