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PICOTTO, GIANBARTOLO
 Distribuzione geografica
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Continente #
NA - Nord America 9.004
EU - Europa 4.037
AS - Asia 2.555
SA - Sud America 176
AF - Africa 42
Continente sconosciuto - Info sul continente non disponibili 18
OC - Oceania 10
Totale 15.842
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Nazione #
US - Stati Uniti d'America 8.831
SG - Singapore 1.226
SE - Svezia 806
RU - Federazione Russa 781
UA - Ucraina 537
GB - Regno Unito 503
CN - Cina 490
IT - Italia 404
DE - Germania 380
HK - Hong Kong 289
FR - Francia 230
KR - Corea 150
BR - Brasile 131
CA - Canada 130
VN - Vietnam 112
PL - Polonia 81
IN - India 77
IE - Irlanda 72
FI - Finlandia 63
JP - Giappone 63
MX - Messico 39
BE - Belgio 36
RS - Serbia 35
TR - Turchia 28
ES - Italia 25
ZA - Sudafrica 25
AR - Argentina 18
BD - Bangladesh 17
EU - Europa 16
ID - Indonesia 16
HR - Croazia 12
IQ - Iraq 12
NL - Olanda 12
LT - Lituania 11
RO - Romania 10
TH - Thailandia 10
AT - Austria 9
IL - Israele 8
AE - Emirati Arabi Uniti 7
PH - Filippine 7
SA - Arabia Saudita 7
VE - Venezuela 7
CO - Colombia 6
NZ - Nuova Zelanda 6
CZ - Repubblica Ceca 5
MA - Marocco 5
PK - Pakistan 5
TW - Taiwan 5
AU - Australia 4
CL - Cile 4
DK - Danimarca 4
DZ - Algeria 4
AZ - Azerbaigian 3
EC - Ecuador 3
IR - Iran 3
LK - Sri Lanka 3
OM - Oman 3
PE - Perù 3
PS - Palestinian Territory 3
BA - Bosnia-Erzegovina 2
BG - Bulgaria 2
CH - Svizzera 2
GR - Grecia 2
KW - Kuwait 2
MC - Monaco 2
MY - Malesia 2
NO - Norvegia 2
PA - Panama 2
PT - Portogallo 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AD - Andorra 1
AL - Albania 1
AM - Armenia 1
BH - Bahrain 1
BN - Brunei Darussalam 1
BO - Bolivia 1
BY - Bielorussia 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
EE - Estonia 1
EG - Egitto 1
GD - Grenada 1
GE - Georgia 1
GY - Guiana 1
HU - Ungheria 1
JO - Giordania 1
KE - Kenya 1
KH - Cambogia 1
MU - Mauritius 1
NP - Nepal 1
PY - Paraguay 1
SC - Seychelles 1
SI - Slovenia 1
SK - Slovacchia (Repubblica Slovacca) 1
SN - Senegal 1
SR - Suriname 1
TN - Tunisia 1
XK - ???statistics.table.value.countryCode.XK??? 1
ZW - Zimbabwe 1
Totale 15.842
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Città #
Cambridge 1.540
Fairfield 897
Ashburn 674
Woodbridge 647
Singapore 630
Chandler 588
Ann Arbor 510
Wilmington 493
Houston 483
Seattle 388
Hong Kong 278
Moscow 252
Jacksonville 246
Beijing 239
Boardman 211
Nyköping 176
Seoul 135
New York 133
Los Angeles 121
San Mateo 119
Dearborn 92
Toronto 74
Dublin 70
Tokyo 51
Strasbourg 49
Torino 49
Turin 40
London 39
Atlanta 38
Warsaw 36
Denver 35
Ho Chi Minh City 35
Kraków 35
Council Bluffs 33
Des Moines 32
Montreal 32
São Paulo 31
Brussels 30
Rome 30
Munich 29
Hanoi 27
Santa Clara 27
Brooklyn 26
Falkenstein 26
Ogden 25
Orem 25
Dallas 23
Poplar 23
Las Vegas 22
Johannesburg 21
Stockholm 21
Chennai 20
Frankfurt am Main 19
Guangzhou 19
Phoenix 19
Chicago 17
Ankara 16
Mexico City 16
San Diego 16
Manchester 15
Redwood City 15
The Dalles 14
Braunschweig 13
Hanover 13
Milan 13
Mumbai 13
Nanjing 13
Boston 12
Helsinki 12
Monmouth Junction 11
San Francisco 10
Caravino 8
Columbus 8
Redmond 8
San Jose 8
West Jordan 8
Zagreb 8
Amsterdam 7
Berlin 7
Dong Ket 7
Querétaro 7
Stoke-on-Trent 7
Carate 6
Chiswick 6
Haifa 6
Mechelen 6
Ottawa 6
Shanghai 6
St Petersburg 6
Bexley 5
Biên Hòa 5
Duncan 5
Falls Church 5
Haiphong 5
Milwaukee 5
Raleigh 5
Riyadh 5
Secaucus 5
Tappahannock 5
Calgary 4
Totale 10.361
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Nome #
Dynamics modeling of CMM probing systems 482
Comparison of the performance of the next generation of optical interferometers 410
Surface texture measurements of gear tooth 394
Design, manufacturing and calibration of a large ring segment 337
Calibration of a ball bearing ring segment 332
The Influence of Scanning Parameters on CMM Measurements 318
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' 308
AFM analysis of MgB2 films and nanostructures 306
Recent advances of the metrological AFM at INRIM 302
A multi-electrode plane capacitive sensor for displacement measurements and attitude controls 298
A capacitive system for micro/nano positioning and attitude controls 294
Coherence effects in Frequency-Modulated laser Spectroscopy 289
Comparison on Nanometrology: Nano 2—Step height 283
Calibration of surface roughness standards 279
Traceable size determination of nanoparticles, a comparison among European metrology institutes 278
Vickers Hardness Indentations measured with Atomic Force Microscopy 277
Correlation between Photoactivity and STM Topographic Parameters of TiO2 Polycrystalline Film 276
Morphology-driven parameters of engineered functional surfaces 275
Strain measurements of cylinder magnetostrictive samples by interferometer readings 274
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support 273
A sample scanning system with nanometric accuracy for quantitative SPM measurements 271
The INRIM 1D comparator for diameter gauges and linear artefacts 258
A metrological SPM for dimensional surface measurements 256
Renewal of the gage-block interferometer at INRIM 256
Large ring segment standard 251
Nanoparticle Characterization - Supplementary Comparison on Nanoparticle Size 251
Structural and electrical characterisation of Mo films for transition-edge sensors 250
A surface profile reconstruction method based on multisensor capacitive transducers 250
A novel AC current source for capacitance-based displacement measurements 249
3D characterization of printed structures by stylus- and optical-based measurements 247
A function-driven characterization of printed conductors on PV cells 244
Two scanning tunneling microscope devices for large samples 239
Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC 238
EURAMET Project 866 "Interferometric Calibration of microdisplacement actuators" - Final Report 237
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements 233
Fabrication of superconducting MgB2 nanostructures 224
Increase of maximum detectable slope with optical profilers, through controlled tilting and image processing 223
Recent progresses in He-Ne lasers stabilized to 127I2 221
A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor 218
Structural and surface properties of sputtered Nb films for multilayer devices 218
Nanometrology at the IMGC 217
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 217
Helium-Neon lasers stabilized to iodine at 605 nm 216
STM characterization of InP gratings for DFB laser fabrication 213
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements 212
The IMGC calibration setup for microdisplacement actuators 210
Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings 208
Surface characterization of electroformed mirrors for an X-ray telescope 208
Tip-sample characterization in the AFM study of a rod-shaped nanostructure 204
STM carbon nanotube tips fabrication for critical dimension measurements 199
Surface characterization of sputtering niobium films by scanning tunneling microscopy 196
International Intercomparison of Scanning Tunneling Microscopy 196
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) 194
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale 190
Final report on EUROMET.L-K4: Calibration of diameter standards, Group 1 187
A precision Z-stage for Scanning Probe Microscopy 182
Comparison on step height measurements in the nano and micrometre range by scanning force microscopes 179
Interferometric calibration of microdisplacement actuators 177
Key comparison EURAMET.L-K8.2013 calibration of surface roughness standards 164
Groove depth measurements on roughness reference standards of the Croatian National Laboratory for Length (LFSB) 156
Nanoscale metrology 153
Topography reconstruction by means of optical scatterometry 153
MICROHARDNESS MEASUREMENTS BY SCANNING TUNNELING MICROSCOPE RID 148
STM tips fabrication for critical dimension measurement 132
Intercomparison of scanning probe microscopes 132
Displacement measurements of piezoelectric actuators in the nanosize-range 116
Measurement of groove depth standards in the range 1 μm up to 1 mm (EURAMET project 1407) 89
Totale 15.967
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Categoria #
all - tutte 84.632
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 84.632
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021883 0 0 0 0 0 105 240 22 216 143 82 75
2021/20221.205 228 54 87 80 125 65 112 90 123 117 49 75
2022/20231.470 87 91 104 166 159 296 7 149 239 36 72 64
2023/2024787 61 65 117 73 53 35 137 10 129 29 24 54
2024/20251.513 84 29 112 28 89 86 170 100 375 47 231 162
2025/20263.445 283 347 307 807 594 1.107 0 0 0 0 0 0
Totale 15.967