METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

PICOTTO, GIANBARTOLO
 Distribuzione geografica
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Continente #
NA - Nord America 10.147
EU - Europa 4.581
AS - Asia 3.350
SA - Sud America 223
Continente sconosciuto - Info sul continente non disponibili 143
AF - Africa 54
OC - Oceania 11
Totale 18.509
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Nazione #
US - Stati Uniti d'America 9.955
SG - Singapore 1.525
RU - Federazione Russa 1.124
SE - Svezia 807
CN - Cina 662
UA - Ucraina 539
GB - Regno Unito 518
IT - Italia 457
DE - Germania 412
HK - Hong Kong 316
VN - Vietnam 314
FR - Francia 293
BR - Brasile 160
KR - Corea 150
CA - Canada 141
IN - India 88
PL - Polonia 84
IE - Irlanda 74
FI - Finlandia 72
JP - Giappone 68
BD - Bangladesh 41
MX - Messico 41
RS - Serbia 39
BE - Belgio 36
TR - Turchia 35
ES - Italia 29
ZA - Sudafrica 28
IQ - Iraq 26
AR - Argentina 21
ID - Indonesia 18
TH - Thailandia 17
EU - Europa 16
NL - Olanda 16
CO - Colombia 12
HR - Croazia 12
LT - Lituania 12
RO - Romania 10
AT - Austria 9
EC - Ecuador 9
IL - Israele 9
PH - Filippine 9
SA - Arabia Saudita 9
PK - Pakistan 8
TW - Taiwan 8
VE - Venezuela 8
AE - Emirati Arabi Uniti 7
CZ - Repubblica Ceca 7
MA - Marocco 7
NZ - Nuova Zelanda 6
AU - Australia 5
CL - Cile 5
DZ - Algeria 5
UZ - Uzbekistan 5
BG - Bulgaria 4
DK - Danimarca 4
KW - Kuwait 4
MY - Malesia 4
OM - Oman 4
TN - Tunisia 4
AZ - Azerbaigian 3
IR - Iran 3
JO - Giordania 3
LK - Sri Lanka 3
PE - Perù 3
PS - Palestinian Territory 3
PT - Portogallo 3
AL - Albania 2
BA - Bosnia-Erzegovina 2
BH - Bahrain 2
CH - Svizzera 2
EE - Estonia 2
GR - Grecia 2
HN - Honduras 2
KE - Kenya 2
MC - Monaco 2
NO - Norvegia 2
PA - Panama 2
PY - Paraguay 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AD - Andorra 1
AM - Armenia 1
BN - Brunei Darussalam 1
BO - Bolivia 1
BY - Bielorussia 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
EG - Egitto 1
ET - Etiopia 1
GA - Gabon 1
GD - Grenada 1
GE - Georgia 1
GT - Guatemala 1
GY - Guiana 1
HU - Ungheria 1
JM - Giamaica 1
KH - Cambogia 1
KZ - Kazakistan 1
MD - Moldavia 1
MU - Mauritius 1
NI - Nicaragua 1
Totale 18.375
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Città #
Cambridge 1.540
Ashburn 905
Fairfield 897
Singapore 852
Woodbridge 647
Chandler 588
Ann Arbor 510
Wilmington 495
Houston 487
San Jose 449
Seattle 390
Moscow 302
Hong Kong 300
Beijing 256
Jacksonville 248
Boardman 212
Council Bluffs 177
Nyköping 176
New York 148
Seoul 135
Los Angeles 128
San Mateo 119
Dearborn 92
Ho Chi Minh City 91
Hanoi 87
Toronto 74
Dublin 72
Lauterbourg 57
Tokyo 55
Strasbourg 49
Torino 49
Orem 45
Atlanta 43
Falkenstein 42
Santa Clara 42
Rome 41
Turin 40
London 39
Warsaw 38
Denver 37
Kraków 35
Montreal 35
Des Moines 33
Dallas 32
São Paulo 32
Brussels 30
Frankfurt am Main 30
Munich 29
Phoenix 29
Brooklyn 28
Milan 25
Ogden 25
Chennai 23
Las Vegas 23
Poplar 23
Johannesburg 22
Stockholm 21
Chicago 20
Guangzhou 20
Helsinki 20
Ankara 18
Manchester 18
Mexico City 17
San Diego 16
Da Nang 15
Mumbai 15
Redwood City 15
Haiphong 14
The Dalles 14
Boston 13
Braunschweig 13
Hanover 13
Nanjing 13
Monmouth Junction 11
San Francisco 11
Amsterdam 10
Biên Hòa 10
Columbus 10
Baghdad 8
Berlin 8
Caravino 8
Redmond 8
Shanghai 8
West Jordan 8
Zagreb 8
Dong Ket 7
Miami 7
Querétaro 7
Stoke-on-Trent 7
Thái Bình 7
Belgrade 6
Carate 6
Chiswick 6
Erbil 6
Haifa 6
Hangzhou 6
Mechelen 6
Ottawa 6
Quito 6
St Petersburg 6
Totale 11.886
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Nome #
Dynamics modeling of CMM probing systems 547
Comparison of the performance of the next generation of optical interferometers 441
Surface texture measurements of gear tooth 431
Calibration of a ball bearing ring segment 400
Design, manufacturing and calibration of a large ring segment 393
The Influence of Scanning Parameters on CMM Measurements 378
AFM analysis of MgB2 films and nanostructures 365
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' 354
A multi-electrode plane capacitive sensor for displacement measurements and attitude controls 334
A capacitive system for micro/nano positioning and attitude controls 332
Recent advances of the metrological AFM at INRIM 332
Coherence effects in Frequency-Modulated laser Spectroscopy 320
3D characterization of printed structures by stylus- and optical-based measurements 319
Comparison on Nanometrology: Nano 2—Step height 318
Calibration of surface roughness standards 318
Renewal of the gage-block interferometer at INRIM 317
Nanoparticle Characterization - Supplementary Comparison on Nanoparticle Size 317
Morphology-driven parameters of engineered functional surfaces 315
Vickers Hardness Indentations measured with Atomic Force Microscopy 313
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support 313
Strain measurements of cylinder magnetostrictive samples by interferometer readings 312
A sample scanning system with nanometric accuracy for quantitative SPM measurements 308
A function-driven characterization of printed conductors on PV cells 307
Correlation between Photoactivity and STM Topographic Parameters of TiO2 Polycrystalline Film 305
Traceable size determination of nanoparticles, a comparison among European metrology institutes 300
A metrological SPM for dimensional surface measurements 299
Large ring segment standard 297
The INRIM 1D comparator for diameter gauges and linear artefacts 294
A surface profile reconstruction method based on multisensor capacitive transducers 293
A novel AC current source for capacitance-based displacement measurements 288
EURAMET Project 866 "Interferometric Calibration of microdisplacement actuators" - Final Report 284
Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC 273
Structural and electrical characterisation of Mo films for transition-edge sensors 270
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 268
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) 265
Two scanning tunneling microscope devices for large samples 262
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements 261
Nanometrology at the IMGC 257
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements 257
Fabrication of superconducting MgB2 nanostructures 255
Increase of maximum detectable slope with optical profilers, through controlled tilting and image processing 252
A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor 249
Recent progresses in He-Ne lasers stabilized to 127I2 248
Tip-sample characterization in the AFM study of a rod-shaped nanostructure 248
Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings 244
Helium-Neon lasers stabilized to iodine at 605 nm 242
Structural and surface properties of sputtered Nb films for multilayer devices 240
The IMGC calibration setup for microdisplacement actuators 240
Surface characterization of electroformed mirrors for an X-ray telescope 240
STM characterization of InP gratings for DFB laser fabrication 238
STM carbon nanotube tips fabrication for critical dimension measurements 238
Surface characterization of sputtering niobium films by scanning tunneling microscopy 227
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale 226
International Intercomparison of Scanning Tunneling Microscopy 217
Final report on EUROMET.L-K4: Calibration of diameter standards, Group 1 213
A precision Z-stage for Scanning Probe Microscopy 207
Interferometric calibration of microdisplacement actuators 206
Comparison on step height measurements in the nano and micrometre range by scanning force microscopes 203
Key comparison EURAMET.L-K8.2013 calibration of surface roughness standards 203
Topography reconstruction by means of optical scatterometry 185
Nanoscale metrology 184
MICROHARDNESS MEASUREMENTS BY SCANNING TUNNELING MICROSCOPE RID 184
Groove depth measurements on roughness reference standards of the Croatian National Laboratory for Length (LFSB) 171
Intercomparison of scanning probe microscopes 164
STM tips fabrication for critical dimension measurement 162
Displacement measurements of piezoelectric actuators in the nanosize-range 141
Measurement of groove depth standards in the range 1 μm up to 1 mm (EURAMET project 1407) 125
Totale 18.509
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Categoria #
all - tutte 92.001
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 92.001
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022977 0 54 87 80 125 65 112 90 123 117 49 75
2022/20231.470 87 91 104 166 159 296 7 149 239 36 72 64
2023/2024787 61 65 117 73 53 35 137 10 129 29 24 54
2024/20251.513 84 29 112 28 89 86 170 100 375 47 231 162
2025/20265.759 283 347 307 807 594 1.519 774 236 283 359 127 123
2026/2027228 64 164 0 0 0 0 0 0 0 0 0 0
Totale 18.509