METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

PICOTTO, GIANBARTOLO
 Distribuzione geografica
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Continente #
NA - Nord America 10.668
EU - Europa 4.624
AS - Asia 3.367
SA - Sud America 254
Continente sconosciuto - Info sul continente non disponibili 144
AF - Africa 55
OC - Oceania 11
Totale 19.123
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Nazione #
US - Stati Uniti d'America 10.416
SG - Singapore 1.525
RU - Federazione Russa 1.124
SE - Svezia 807
CN - Cina 663
UA - Ucraina 539
GB - Regno Unito 529
IT - Italia 478
DE - Germania 414
VN - Vietnam 318
HK - Hong Kong 316
FR - Francia 293
BR - Brasile 171
CA - Canada 168
KR - Corea 151
IN - India 90
PL - Polonia 84
IE - Irlanda 74
FI - Finlandia 72
JP - Giappone 68
BD - Bangladesh 45
MX - Messico 41
RS - Serbia 39
BE - Belgio 36
TR - Turchia 35
ES - Italia 29
ZA - Sudafrica 28
IQ - Iraq 26
AR - Argentina 24
CO - Colombia 20
ID - Indonesia 18
TH - Thailandia 17
EC - Ecuador 16
EU - Europa 16
NL - Olanda 16
RO - Romania 13
HR - Croazia 12
LT - Lituania 12
CR - Costa Rica 10
HN - Honduras 10
PH - Filippine 10
AT - Austria 9
IL - Israele 9
PK - Pakistan 9
SA - Arabia Saudita 9
VE - Venezuela 9
TW - Taiwan 8
AE - Emirati Arabi Uniti 7
CZ - Repubblica Ceca 7
MA - Marocco 7
NZ - Nuova Zelanda 6
AU - Australia 5
CL - Cile 5
DZ - Algeria 5
EE - Estonia 5
MY - Malesia 5
UZ - Uzbekistan 5
BG - Bulgaria 4
CH - Svizzera 4
DK - Danimarca 4
KW - Kuwait 4
NI - Nicaragua 4
OM - Oman 4
PA - Panama 4
TN - Tunisia 4
AL - Albania 3
AZ - Azerbaigian 3
GT - Guatemala 3
IR - Iran 3
JM - Giamaica 3
JO - Giordania 3
KE - Kenya 3
LK - Sri Lanka 3
PE - Perù 3
PR - Porto Rico 3
PS - Palestinian Territory 3
PT - Portogallo 3
BA - Bosnia-Erzegovina 2
BH - Bahrain 2
GR - Grecia 2
MC - Monaco 2
NO - Norvegia 2
NP - Nepal 2
PY - Paraguay 2
SV - El Salvador 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AD - Andorra 1
AM - Armenia 1
BM - Bermuda 1
BN - Brunei Darussalam 1
BO - Bolivia 1
BY - Bielorussia 1
CI - Costa d'Avorio 1
CW - ???statistics.table.value.countryCode.CW??? 1
EG - Egitto 1
ET - Etiopia 1
GA - Gabon 1
GD - Grenada 1
GE - Georgia 1
GP - Guadalupe 1
Totale 18.982
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Città #
Cambridge 1.540
Ashburn 960
Fairfield 897
Singapore 852
Woodbridge 647
Chandler 588
San Jose 540
Ann Arbor 510
Wilmington 495
Houston 487
Seattle 390
Moscow 302
Hong Kong 300
Beijing 256
Jacksonville 248
Boardman 212
Council Bluffs 177
Nyköping 176
New York 157
Seoul 135
Los Angeles 131
San Mateo 119
Ho Chi Minh City 93
Dearborn 92
Hanoi 88
Toronto 76
Dublin 72
Lauterbourg 57
Tokyo 55
Atlanta 49
Strasbourg 49
Torino 49
Phoenix 47
Orem 46
Santa Clara 46
Rome 44
Turin 43
Falkenstein 42
San Diego 40
Denver 39
London 39
Dallas 38
Glen Cove 38
Warsaw 38
Montreal 37
São Paulo 37
Kraków 35
Chicago 34
Des Moines 33
Frankfurt am Main 31
Brussels 30
Brooklyn 29
Munich 29
Ogden 27
Milan 26
Chennai 23
Las Vegas 23
Poplar 23
Johannesburg 22
Stockholm 21
Guangzhou 20
Helsinki 20
Ankara 18
Manchester 18
Mexico City 17
Da Nang 15
Mumbai 15
Redwood City 15
Haiphong 14
The Dalles 14
Boston 13
Braunschweig 13
Hanover 13
Nanjing 13
San Francisco 12
Columbus 11
Monmouth Junction 11
Amsterdam 10
Biên Hòa 10
Berlin 9
Miami 9
Quito 9
Baghdad 8
Caravino 8
Redmond 8
Shanghai 8
West Jordan 8
Zagreb 8
Dong Ket 7
Ottawa 7
Querétaro 7
San José 7
Stoke-on-Trent 7
Thái Bình 7
Belgrade 6
Bogotá 6
Calgary 6
Carate 6
Chiswick 6
Erbil 6
Totale 12.184
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Nome #
Dynamics modeling of CMM probing systems 557
Comparison of the performance of the next generation of optical interferometers 450
Surface texture measurements of gear tooth 442
Calibration of a ball bearing ring segment 419
Design, manufacturing and calibration of a large ring segment 400
The Influence of Scanning Parameters on CMM Measurements 386
AFM analysis of MgB2 films and nanostructures 373
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' 362
A multi-electrode plane capacitive sensor for displacement measurements and attitude controls 345
A capacitive system for micro/nano positioning and attitude controls 344
Recent advances of the metrological AFM at INRIM 339
3D characterization of printed structures by stylus- and optical-based measurements 334
Vickers Hardness Indentations measured with Atomic Force Microscopy 329
Nanoparticle Characterization - Supplementary Comparison on Nanoparticle Size 328
Renewal of the gage-block interferometer at INRIM 327
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support 324
Morphology-driven parameters of engineered functional surfaces 324
Coherence effects in Frequency-Modulated laser Spectroscopy 324
Calibration of surface roughness standards 324
Comparison on Nanometrology: Nano 2—Step height 322
A function-driven characterization of printed conductors on PV cells 322
Strain measurements of cylinder magnetostrictive samples by interferometer readings 320
A sample scanning system with nanometric accuracy for quantitative SPM measurements 316
Correlation between Photoactivity and STM Topographic Parameters of TiO2 Polycrystalline Film 312
Traceable size determination of nanoparticles, a comparison among European metrology institutes 312
Large ring segment standard 308
A metrological SPM for dimensional surface measurements 305
The INRIM 1D comparator for diameter gauges and linear artefacts 303
A surface profile reconstruction method based on multisensor capacitive transducers 301
A novel AC current source for capacitance-based displacement measurements 300
EURAMET Project 866 "Interferometric Calibration of microdisplacement actuators" - Final Report 294
Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC 284
Structural and electrical characterisation of Mo films for transition-edge sensors 280
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 277
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) 277
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements 274
Two scanning tunneling microscope devices for large samples 268
Nanometrology at the IMGC 264
Fabrication of superconducting MgB2 nanostructures 262
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements 262
Increase of maximum detectable slope with optical profilers, through controlled tilting and image processing 261
Tip-sample characterization in the AFM study of a rod-shaped nanostructure 258
Recent progresses in He-Ne lasers stabilized to 127I2 257
A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor 256
STM carbon nanotube tips fabrication for critical dimension measurements 252
Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings 251
The IMGC calibration setup for microdisplacement actuators 250
STM characterization of InP gratings for DFB laser fabrication 249
Helium-Neon lasers stabilized to iodine at 605 nm 249
Surface characterization of electroformed mirrors for an X-ray telescope 246
Structural and surface properties of sputtered Nb films for multilayer devices 244
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale 241
Surface characterization of sputtering niobium films by scanning tunneling microscopy 234
International Intercomparison of Scanning Tunneling Microscopy 225
A precision Z-stage for Scanning Probe Microscopy 220
Final report on EUROMET.L-K4: Calibration of diameter standards, Group 1 217
Key comparison EURAMET.L-K8.2013 calibration of surface roughness standards 212
Interferometric calibration of microdisplacement actuators 210
Comparison on step height measurements in the nano and micrometre range by scanning force microscopes 207
MICROHARDNESS MEASUREMENTS BY SCANNING TUNNELING MICROSCOPE RID 197
Topography reconstruction by means of optical scatterometry 194
Nanoscale metrology 189
Groove depth measurements on roughness reference standards of the Croatian National Laboratory for Length (LFSB) 177
Intercomparison of scanning probe microscopes 176
STM tips fabrication for critical dimension measurement 170
Displacement measurements of piezoelectric actuators in the nanosize-range 152
Measurement of groove depth standards in the range 1 μm up to 1 mm (EURAMET project 1407) 135
Totale 19.123
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Categoria #
all - tutte 94.534
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 94.534
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022836 0 0 0 80 125 65 112 90 123 117 49 75
2022/20231.470 87 91 104 166 159 296 7 149 239 36 72 64
2023/2024787 61 65 117 73 53 35 137 10 129 29 24 54
2024/20251.513 84 29 112 28 89 86 170 100 375 47 231 162
2025/20265.759 283 347 307 807 594 1.519 774 236 283 359 127 123
2026/2027842 64 204 309 265 0 0 0 0 0 0 0 0
Totale 19.123