METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

PICOTTO, GIANBARTOLO
 Distribuzione geografica
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Continente #
NA - Nord America 8.882
EU - Europa 3.915
AS - Asia 2.482
SA - Sud America 168
AF - Africa 37
Continente sconosciuto - Info sul continente non disponibili 18
OC - Oceania 10
Totale 15.512
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Nazione #
US - Stati Uniti d'America 8.715
SG - Singapore 1.185
SE - Svezia 806
RU - Federazione Russa 672
UA - Ucraina 537
GB - Regno Unito 496
CN - Cina 484
IT - Italia 404
DE - Germania 380
HK - Hong Kong 289
FR - Francia 230
KR - Corea 150
BR - Brasile 127
CA - Canada 127
VN - Vietnam 99
PL - Polonia 79
IN - India 74
IE - Irlanda 72
FI - Finlandia 63
JP - Giappone 61
BE - Belgio 36
MX - Messico 36
RS - Serbia 35
TR - Turchia 27
ES - Italia 24
ZA - Sudafrica 23
AR - Argentina 18
BD - Bangladesh 16
EU - Europa 16
ID - Indonesia 16
HR - Croazia 12
NL - Olanda 12
IQ - Iraq 10
RO - Romania 10
TH - Thailandia 10
AT - Austria 9
LT - Lituania 9
IL - Israele 8
PH - Filippine 7
SA - Arabia Saudita 7
AE - Emirati Arabi Uniti 6
NZ - Nuova Zelanda 6
CO - Colombia 5
CZ - Repubblica Ceca 5
PK - Pakistan 5
TW - Taiwan 5
AU - Australia 4
CL - Cile 4
DK - Danimarca 4
DZ - Algeria 4
VE - Venezuela 4
AZ - Azerbaigian 3
EC - Ecuador 3
IR - Iran 3
LK - Sri Lanka 3
OM - Oman 3
PE - Perù 3
BA - Bosnia-Erzegovina 2
BG - Bulgaria 2
CH - Svizzera 2
GR - Grecia 2
MA - Marocco 2
MC - Monaco 2
MY - Malesia 2
NO - Norvegia 2
PA - Panama 2
PS - Palestinian Territory 2
PT - Portogallo 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AD - Andorra 1
AL - Albania 1
AM - Armenia 1
BH - Bahrain 1
BN - Brunei Darussalam 1
BO - Bolivia 1
BY - Bielorussia 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
EE - Estonia 1
EG - Egitto 1
GD - Grenada 1
GE - Georgia 1
GY - Guiana 1
KE - Kenya 1
KH - Cambogia 1
KW - Kuwait 1
MU - Mauritius 1
NP - Nepal 1
PY - Paraguay 1
SC - Seychelles 1
SI - Slovenia 1
SK - Slovacchia (Repubblica Slovacca) 1
SN - Senegal 1
SR - Suriname 1
TN - Tunisia 1
XK - ???statistics.table.value.countryCode.XK??? 1
ZW - Zimbabwe 1
Totale 15.512
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Città #
Cambridge 1.540
Fairfield 897
Woodbridge 647
Ashburn 621
Singapore 592
Chandler 588
Ann Arbor 510
Wilmington 493
Houston 482
Seattle 388
Hong Kong 278
Jacksonville 246
Beijing 238
Boardman 211
Moscow 187
Nyköping 176
Seoul 135
New York 125
San Mateo 119
Los Angeles 114
Dearborn 92
Toronto 74
Dublin 70
Strasbourg 49
Tokyo 49
Torino 49
Turin 40
London 39
Atlanta 35
Kraków 35
Denver 34
Warsaw 34
Des Moines 32
Ho Chi Minh City 31
São Paulo 31
Brussels 30
Montreal 30
Rome 30
Munich 29
Council Bluffs 28
Hanoi 27
Santa Clara 27
Falkenstein 26
Ogden 25
Brooklyn 24
Dallas 23
Las Vegas 22
Stockholm 21
Johannesburg 20
Frankfurt am Main 19
Guangzhou 19
Poplar 19
Orem 18
Phoenix 18
Chennai 17
Chicago 17
San Diego 16
Ankara 15
Manchester 15
Redwood City 15
Mexico City 14
The Dalles 14
Braunschweig 13
Hanover 13
Milan 13
Mumbai 13
Nanjing 13
Helsinki 12
Boston 11
Monmouth Junction 11
San Francisco 10
Caravino 8
Columbus 8
Redmond 8
West Jordan 8
Zagreb 8
Amsterdam 7
Berlin 7
Dong Ket 7
Stoke-on-Trent 7
Carate 6
Chiswick 6
Haifa 6
Mechelen 6
Ottawa 6
Querétaro 6
Shanghai 6
St Petersburg 6
Bexley 5
Duncan 5
Falls Church 5
Milwaukee 5
Riyadh 5
Secaucus 5
Tappahannock 5
Biên Hòa 4
Cardiff 4
Haiphong 4
Hameln 4
Kwangju 4
Totale 10.139
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Nome #
Dynamics modeling of CMM probing systems 469
Comparison of the performance of the next generation of optical interferometers 406
Surface texture measurements of gear tooth 389
Design, manufacturing and calibration of a large ring segment 329
Calibration of a ball bearing ring segment 324
The Influence of Scanning Parameters on CMM Measurements 308
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' 302
AFM analysis of MgB2 films and nanostructures 298
Recent advances of the metrological AFM at INRIM 297
A multi-electrode plane capacitive sensor for displacement measurements and attitude controls 293
A capacitive system for micro/nano positioning and attitude controls 285
Coherence effects in Frequency-Modulated laser Spectroscopy 283
Comparison on Nanometrology: Nano 2—Step height 276
Traceable size determination of nanoparticles, a comparison among European metrology institutes 275
Vickers Hardness Indentations measured with Atomic Force Microscopy 273
Calibration of surface roughness standards 273
Morphology-driven parameters of engineered functional surfaces 271
Correlation between Photoactivity and STM Topographic Parameters of TiO2 Polycrystalline Film 270
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support 267
Strain measurements of cylinder magnetostrictive samples by interferometer readings 265
A sample scanning system with nanometric accuracy for quantitative SPM measurements 263
The INRIM 1D comparator for diameter gauges and linear artefacts 255
A metrological SPM for dimensional surface measurements 253
Renewal of the gage-block interferometer at INRIM 250
Nanoparticle Characterization - Supplementary Comparison on Nanoparticle Size 248
Structural and electrical characterisation of Mo films for transition-edge sensors 245
A surface profile reconstruction method based on multisensor capacitive transducers 245
A novel AC current source for capacitance-based displacement measurements 243
Large ring segment standard 242
A function-driven characterization of printed conductors on PV cells 241
3D characterization of printed structures by stylus- and optical-based measurements 237
Two scanning tunneling microscope devices for large samples 236
EURAMET Project 866 "Interferometric Calibration of microdisplacement actuators" - Final Report 234
Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC 233
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements 228
Fabrication of superconducting MgB2 nanostructures 221
Increase of maximum detectable slope with optical profilers, through controlled tilting and image processing 219
Recent progresses in He-Ne lasers stabilized to 127I2 218
Structural and surface properties of sputtered Nb films for multilayer devices 214
Nanometrology at the IMGC 213
Helium-Neon lasers stabilized to iodine at 605 nm 213
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 213
A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor 212
STM characterization of InP gratings for DFB laser fabrication 212
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements 208
The IMGC calibration setup for microdisplacement actuators 206
Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings 204
Surface characterization of electroformed mirrors for an X-ray telescope 204
Tip-sample characterization in the AFM study of a rod-shaped nanostructure 202
STM carbon nanotube tips fabrication for critical dimension measurements 195
International Intercomparison of Scanning Tunneling Microscopy 194
Surface characterization of sputtering niobium films by scanning tunneling microscopy 192
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) 190
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale 185
Final report on EUROMET.L-K4: Calibration of diameter standards, Group 1 183
A precision Z-stage for Scanning Probe Microscopy 176
Comparison on step height measurements in the nano and micrometre range by scanning force microscopes 174
Interferometric calibration of microdisplacement actuators 174
Key comparison EURAMET.L-K8.2013 calibration of surface roughness standards 159
Groove depth measurements on roughness reference standards of the Croatian National Laboratory for Length (LFSB) 151
Topography reconstruction by means of optical scatterometry 150
Nanoscale metrology 149
MICROHARDNESS MEASUREMENTS BY SCANNING TUNNELING MICROSCOPE RID 145
STM tips fabrication for critical dimension measurement 129
Intercomparison of scanning probe microscopes 128
Displacement measurements of piezoelectric actuators in the nanosize-range 113
Measurement of groove depth standards in the range 1 μm up to 1 mm (EURAMET project 1407) 85
Totale 15.637
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Categoria #
all - tutte 83.982
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 83.982
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021883 0 0 0 0 0 105 240 22 216 143 82 75
2021/20221.205 228 54 87 80 125 65 112 90 123 117 49 75
2022/20231.470 87 91 104 166 159 296 7 149 239 36 72 64
2023/2024787 61 65 117 73 53 35 137 10 129 29 24 54
2024/20251.513 84 29 112 28 89 86 170 100 375 47 231 162
2025/20263.115 283 347 307 807 594 777 0 0 0 0 0 0
Totale 15.637