METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

PICOTTO, GIANBARTOLO
 Distribuzione geografica
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Continente #
NA - Nord America 9.757
EU - Europa 4.529
AS - Asia 3.309
SA - Sud America 215
AF - Africa 54
Continente sconosciuto - Info sul continente non disponibili 18
OC - Oceania 11
Totale 17.893
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Nazione #
US - Stati Uniti d'America 9.575
SG - Singapore 1.517
RU - Federazione Russa 1.124
SE - Svezia 807
CN - Cina 651
UA - Ucraina 539
GB - Regno Unito 515
IT - Italia 424
DE - Germania 411
HK - Hong Kong 314
VN - Vietnam 314
FR - Francia 292
BR - Brasile 156
KR - Corea 150
CA - Canada 135
IN - India 86
PL - Polonia 81
IE - Irlanda 74
FI - Finlandia 72
JP - Giappone 68
MX - Messico 41
BE - Belgio 36
RS - Serbia 35
TR - Turchia 34
ZA - Sudafrica 28
BD - Bangladesh 27
ES - Italia 27
IQ - Iraq 26
AR - Argentina 21
ID - Indonesia 17
TH - Thailandia 17
EU - Europa 16
NL - Olanda 15
HR - Croazia 12
LT - Lituania 11
RO - Romania 10
AT - Austria 9
EC - Ecuador 9
IL - Israele 9
PH - Filippine 9
SA - Arabia Saudita 9
CO - Colombia 8
TW - Taiwan 8
VE - Venezuela 8
AE - Emirati Arabi Uniti 7
MA - Marocco 7
PK - Pakistan 7
NZ - Nuova Zelanda 6
AU - Australia 5
CL - Cile 5
CZ - Repubblica Ceca 5
DZ - Algeria 5
UZ - Uzbekistan 5
BG - Bulgaria 4
DK - Danimarca 4
KW - Kuwait 4
MY - Malesia 4
OM - Oman 4
TN - Tunisia 4
AZ - Azerbaigian 3
IR - Iran 3
JO - Giordania 3
LK - Sri Lanka 3
PE - Perù 3
PS - Palestinian Territory 3
PT - Portogallo 3
AL - Albania 2
BA - Bosnia-Erzegovina 2
BH - Bahrain 2
CH - Svizzera 2
EE - Estonia 2
GR - Grecia 2
KE - Kenya 2
MC - Monaco 2
NO - Norvegia 2
PA - Panama 2
PY - Paraguay 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AD - Andorra 1
AM - Armenia 1
BN - Brunei Darussalam 1
BO - Bolivia 1
BY - Bielorussia 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
EG - Egitto 1
ET - Etiopia 1
GA - Gabon 1
GD - Grenada 1
GE - Georgia 1
GY - Guiana 1
HN - Honduras 1
HU - Ungheria 1
KH - Cambogia 1
MU - Mauritius 1
NI - Nicaragua 1
NP - Nepal 1
SC - Seychelles 1
SI - Slovenia 1
SK - Slovacchia (Repubblica Slovacca) 1
Totale 17.889
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Città #
Cambridge 1.540
Fairfield 897
Ashburn 865
Singapore 848
Woodbridge 647
Chandler 588
Ann Arbor 510
Wilmington 493
Houston 483
San Jose 425
Seattle 388
Moscow 302
Hong Kong 298
Beijing 254
Jacksonville 246
Boardman 211
Nyköping 176
New York 142
Seoul 135
Los Angeles 123
San Mateo 119
Dearborn 92
Ho Chi Minh City 91
Hanoi 87
Council Bluffs 76
Toronto 74
Dublin 72
Lauterbourg 57
Tokyo 55
Strasbourg 49
Torino 49
Orem 45
Falkenstein 42
Atlanta 41
Turin 40
London 39
Rome 39
Warsaw 36
Denver 35
Kraków 35
Des Moines 33
Montreal 32
São Paulo 32
Brussels 30
Frankfurt am Main 30
Munich 29
Santa Clara 29
Brooklyn 26
Ogden 25
Dallas 24
Poplar 23
Chennai 22
Johannesburg 22
Las Vegas 22
Stockholm 21
Guangzhou 20
Helsinki 20
Phoenix 20
Manchester 18
Ankara 17
Chicago 17
Mexico City 17
San Diego 16
Da Nang 15
Mumbai 15
Redwood City 15
Haiphong 14
Milan 14
The Dalles 14
Braunschweig 13
Hanover 13
Nanjing 13
Boston 12
Monmouth Junction 11
San Francisco 11
Amsterdam 10
Biên Hòa 10
Baghdad 8
Berlin 8
Caravino 8
Columbus 8
Redmond 8
West Jordan 8
Zagreb 8
Dong Ket 7
Querétaro 7
Shanghai 7
Stoke-on-Trent 7
Thái Bình 7
Carate 6
Chiswick 6
Erbil 6
Haifa 6
Hangzhou 6
Mechelen 6
Ottawa 6
Quito 6
St Petersburg 6
Bexley 5
Cardiff 5
Totale 11.624
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Nome #
Dynamics modeling of CMM probing systems 537
Comparison of the performance of the next generation of optical interferometers 436
Surface texture measurements of gear tooth 430
Calibration of a ball bearing ring segment 393
Design, manufacturing and calibration of a large ring segment 385
The Influence of Scanning Parameters on CMM Measurements 367
AFM analysis of MgB2 films and nanostructures 354
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' 347
A multi-electrode plane capacitive sensor for displacement measurements and attitude controls 331
A capacitive system for micro/nano positioning and attitude controls 328
Recent advances of the metrological AFM at INRIM 327
Coherence effects in Frequency-Modulated laser Spectroscopy 317
Calibration of surface roughness standards 313
Comparison on Nanometrology: Nano 2—Step height 312
Morphology-driven parameters of engineered functional surfaces 310
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support 307
Strain measurements of cylinder magnetostrictive samples by interferometer readings 307
Vickers Hardness Indentations measured with Atomic Force Microscopy 306
Renewal of the gage-block interferometer at INRIM 304
A sample scanning system with nanometric accuracy for quantitative SPM measurements 304
3D characterization of printed structures by stylus- and optical-based measurements 301
Correlation between Photoactivity and STM Topographic Parameters of TiO2 Polycrystalline Film 300
Traceable size determination of nanoparticles, a comparison among European metrology institutes 297
A function-driven characterization of printed conductors on PV cells 296
Nanoparticle Characterization - Supplementary Comparison on Nanoparticle Size 296
A metrological SPM for dimensional surface measurements 293
Large ring segment standard 293
The INRIM 1D comparator for diameter gauges and linear artefacts 283
A surface profile reconstruction method based on multisensor capacitive transducers 283
A novel AC current source for capacitance-based displacement measurements 277
EURAMET Project 866 "Interferometric Calibration of microdisplacement actuators" - Final Report 273
Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC 270
Structural and electrical characterisation of Mo films for transition-edge sensors 265
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 260
Two scanning tunneling microscope devices for large samples 258
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements 254
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements 252
Nanometrology at the IMGC 249
Fabrication of superconducting MgB2 nanostructures 249
Increase of maximum detectable slope with optical profilers, through controlled tilting and image processing 245
Recent progresses in He-Ne lasers stabilized to 127I2 243
A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor 242
Tip-sample characterization in the AFM study of a rod-shaped nanostructure 240
Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings 238
Helium-Neon lasers stabilized to iodine at 605 nm 237
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) 237
Structural and surface properties of sputtered Nb films for multilayer devices 236
STM characterization of InP gratings for DFB laser fabrication 233
The IMGC calibration setup for microdisplacement actuators 233
Surface characterization of electroformed mirrors for an X-ray telescope 230
STM carbon nanotube tips fabrication for critical dimension measurements 230
Surface characterization of sputtering niobium films by scanning tunneling microscopy 216
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale 216
International Intercomparison of Scanning Tunneling Microscopy 211
Final report on EUROMET.L-K4: Calibration of diameter standards, Group 1 210
A precision Z-stage for Scanning Probe Microscopy 201
Interferometric calibration of microdisplacement actuators 200
Comparison on step height measurements in the nano and micrometre range by scanning force microscopes 199
Key comparison EURAMET.L-K8.2013 calibration of surface roughness standards 195
Topography reconstruction by means of optical scatterometry 180
Nanoscale metrology 177
MICROHARDNESS MEASUREMENTS BY SCANNING TUNNELING MICROSCOPE RID 172
Groove depth measurements on roughness reference standards of the Croatian National Laboratory for Length (LFSB) 168
Intercomparison of scanning probe microscopes 162
STM tips fabrication for critical dimension measurement 153
Displacement measurements of piezoelectric actuators in the nanosize-range 135
Measurement of groove depth standards in the range 1 μm up to 1 mm (EURAMET project 1407) 115
Totale 18.018
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Categoria #
all - tutte 88.049
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 88.049
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021300 0 0 0 0 0 0 0 0 0 143 82 75
2021/20221.205 228 54 87 80 125 65 112 90 123 117 49 75
2022/20231.470 87 91 104 166 159 296 7 149 239 36 72 64
2023/2024787 61 65 117 73 53 35 137 10 129 29 24 54
2024/20251.513 84 29 112 28 89 86 170 100 375 47 231 162
2025/20265.496 283 347 307 807 594 1.519 774 236 283 346 0 0
Totale 18.018