METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

PICOTTO, GIANBARTOLO
 Distribuzione geografica
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Continente #
NA - Nord America 9.926
EU - Europa 4.558
AS - Asia 3.336
SA - Sud America 217
AF - Africa 54
Continente sconosciuto - Info sul continente non disponibili 18
OC - Oceania 11
Totale 18.120
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Nazione #
US - Stati Uniti d'America 9.739
SG - Singapore 1.524
RU - Federazione Russa 1.124
SE - Svezia 807
CN - Cina 658
UA - Ucraina 539
GB - Regno Unito 517
IT - Italia 445
DE - Germania 411
HK - Hong Kong 316
VN - Vietnam 314
FR - Francia 292
BR - Brasile 157
KR - Corea 150
CA - Canada 139
IN - India 86
PL - Polonia 81
IE - Irlanda 74
FI - Finlandia 72
JP - Giappone 68
MX - Messico 41
RS - Serbia 39
BD - Bangladesh 38
BE - Belgio 36
TR - Turchia 34
ZA - Sudafrica 28
ES - Italia 27
IQ - Iraq 26
AR - Argentina 21
ID - Indonesia 17
TH - Thailandia 17
EU - Europa 16
NL - Olanda 16
HR - Croazia 12
LT - Lituania 11
RO - Romania 10
AT - Austria 9
CO - Colombia 9
EC - Ecuador 9
IL - Israele 9
PH - Filippine 9
SA - Arabia Saudita 9
TW - Taiwan 8
VE - Venezuela 8
AE - Emirati Arabi Uniti 7
MA - Marocco 7
PK - Pakistan 7
NZ - Nuova Zelanda 6
AU - Australia 5
CL - Cile 5
CZ - Repubblica Ceca 5
DZ - Algeria 5
UZ - Uzbekistan 5
BG - Bulgaria 4
DK - Danimarca 4
KW - Kuwait 4
MY - Malesia 4
OM - Oman 4
TN - Tunisia 4
AZ - Azerbaigian 3
IR - Iran 3
JO - Giordania 3
LK - Sri Lanka 3
PE - Perù 3
PS - Palestinian Territory 3
PT - Portogallo 3
AL - Albania 2
BA - Bosnia-Erzegovina 2
BH - Bahrain 2
CH - Svizzera 2
EE - Estonia 2
GR - Grecia 2
HN - Honduras 2
KE - Kenya 2
MC - Monaco 2
NO - Norvegia 2
PA - Panama 2
PY - Paraguay 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AD - Andorra 1
AM - Armenia 1
BN - Brunei Darussalam 1
BO - Bolivia 1
BY - Bielorussia 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
EG - Egitto 1
ET - Etiopia 1
GA - Gabon 1
GD - Grenada 1
GE - Georgia 1
GY - Guiana 1
HU - Ungheria 1
KH - Cambogia 1
MD - Moldavia 1
MU - Mauritius 1
NI - Nicaragua 1
NP - Nepal 1
SC - Seychelles 1
SI - Slovenia 1
Totale 18.115
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Città #
Cambridge 1.540
Fairfield 897
Ashburn 895
Singapore 851
Woodbridge 647
Chandler 588
Ann Arbor 510
Wilmington 493
Houston 485
San Jose 446
Seattle 388
Moscow 302
Hong Kong 300
Beijing 255
Jacksonville 248
Boardman 211
Nyköping 176
New York 148
Seoul 135
Los Angeles 126
Council Bluffs 121
San Mateo 119
Dearborn 92
Ho Chi Minh City 91
Hanoi 87
Toronto 74
Dublin 72
Lauterbourg 57
Tokyo 55
Strasbourg 49
Torino 49
Orem 45
Falkenstein 42
Atlanta 41
Turin 40
London 39
Rome 39
Santa Clara 37
Denver 36
Warsaw 36
Kraków 35
Montreal 35
Des Moines 33
São Paulo 32
Brussels 30
Frankfurt am Main 30
Munich 29
Dallas 28
Brooklyn 27
Ogden 25
Las Vegas 23
Milan 23
Poplar 23
Chennai 22
Johannesburg 22
Phoenix 22
Stockholm 21
Guangzhou 20
Helsinki 20
Manchester 18
Ankara 17
Chicago 17
Mexico City 17
San Diego 16
Da Nang 15
Mumbai 15
Redwood City 15
Haiphong 14
The Dalles 14
Braunschweig 13
Hanover 13
Nanjing 13
Boston 12
Monmouth Junction 11
San Francisco 11
Amsterdam 10
Biên Hòa 10
Columbus 10
Baghdad 8
Berlin 8
Caravino 8
Redmond 8
West Jordan 8
Zagreb 8
Dong Ket 7
Querétaro 7
Shanghai 7
Stoke-on-Trent 7
Thái Bình 7
Belgrade 6
Carate 6
Chiswick 6
Erbil 6
Haifa 6
Hangzhou 6
Mechelen 6
Miami 6
Ottawa 6
Quito 6
St Petersburg 6
Totale 11.772
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Nome #
Dynamics modeling of CMM probing systems 542
Comparison of the performance of the next generation of optical interferometers 437
Surface texture measurements of gear tooth 430
Calibration of a ball bearing ring segment 394
Design, manufacturing and calibration of a large ring segment 388
The Influence of Scanning Parameters on CMM Measurements 372
AFM analysis of MgB2 films and nanostructures 360
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' 351
A multi-electrode plane capacitive sensor for displacement measurements and attitude controls 331
A capacitive system for micro/nano positioning and attitude controls 329
Recent advances of the metrological AFM at INRIM 328
Coherence effects in Frequency-Modulated laser Spectroscopy 318
Comparison on Nanometrology: Nano 2—Step height 316
Calibration of surface roughness standards 315
Morphology-driven parameters of engineered functional surfaces 313
Vickers Hardness Indentations measured with Atomic Force Microscopy 311
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support 310
Strain measurements of cylinder magnetostrictive samples by interferometer readings 310
Nanoparticle Characterization - Supplementary Comparison on Nanoparticle Size 310
3D characterization of printed structures by stylus- and optical-based measurements 310
Renewal of the gage-block interferometer at INRIM 308
A sample scanning system with nanometric accuracy for quantitative SPM measurements 305
Correlation between Photoactivity and STM Topographic Parameters of TiO2 Polycrystalline Film 301
A function-driven characterization of printed conductors on PV cells 300
Traceable size determination of nanoparticles, a comparison among European metrology institutes 298
A metrological SPM for dimensional surface measurements 294
Large ring segment standard 294
A surface profile reconstruction method based on multisensor capacitive transducers 291
The INRIM 1D comparator for diameter gauges and linear artefacts 284
A novel AC current source for capacitance-based displacement measurements 281
EURAMET Project 866 "Interferometric Calibration of microdisplacement actuators" - Final Report 279
Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC 271
Structural and electrical characterisation of Mo films for transition-edge sensors 268
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 265
Two scanning tunneling microscope devices for large samples 260
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements 257
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements 255
Nanometrology at the IMGC 253
Increase of maximum detectable slope with optical profilers, through controlled tilting and image processing 251
Fabrication of superconducting MgB2 nanostructures 250
A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor 247
Recent progresses in He-Ne lasers stabilized to 127I2 246
Tip-sample characterization in the AFM study of a rod-shaped nanostructure 243
Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings 242
Helium-Neon lasers stabilized to iodine at 605 nm 240
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) 239
Structural and surface properties of sputtered Nb films for multilayer devices 238
Surface characterization of electroformed mirrors for an X-ray telescope 237
STM characterization of InP gratings for DFB laser fabrication 236
The IMGC calibration setup for microdisplacement actuators 236
STM carbon nanotube tips fabrication for critical dimension measurements 234
Surface characterization of sputtering niobium films by scanning tunneling microscopy 222
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale 219
International Intercomparison of Scanning Tunneling Microscopy 214
Final report on EUROMET.L-K4: Calibration of diameter standards, Group 1 213
A precision Z-stage for Scanning Probe Microscopy 204
Interferometric calibration of microdisplacement actuators 203
Comparison on step height measurements in the nano and micrometre range by scanning force microscopes 201
Key comparison EURAMET.L-K8.2013 calibration of surface roughness standards 200
Nanoscale metrology 183
Topography reconstruction by means of optical scatterometry 182
MICROHARDNESS MEASUREMENTS BY SCANNING TUNNELING MICROSCOPE RID 181
Groove depth measurements on roughness reference standards of the Croatian National Laboratory for Length (LFSB) 170
Intercomparison of scanning probe microscopes 162
STM tips fabrication for critical dimension measurement 157
Displacement measurements of piezoelectric actuators in the nanosize-range 136
Measurement of groove depth standards in the range 1 μm up to 1 mm (EURAMET project 1407) 120
Totale 18.245
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Categoria #
all - tutte 89.841
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 89.841
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202175 0 0 0 0 0 0 0 0 0 0 0 75
2021/20221.205 228 54 87 80 125 65 112 90 123 117 49 75
2022/20231.470 87 91 104 166 159 296 7 149 239 36 72 64
2023/2024787 61 65 117 73 53 35 137 10 129 29 24 54
2024/20251.513 84 29 112 28 89 86 170 100 375 47 231 162
2025/20265.723 283 347 307 807 594 1.519 774 236 283 359 127 87
Totale 18.245