Reconstruction errors due to the finite shape of the tip remain the major limitation of scanning probe microscopy for nanometer scale measurements. Carbon nanotubes are ideal SPM probes thanks to their nanometric diameter, high aspect-ratio and strength. In this work, the feasibility of a method to attach CNT on the apex of a Tungsten tip has been tested. By the fabricated CNT tip we successfully imaged a metalized rectangular grating obtaining a profile nearly rectangular in comparison with classic STM-W tip. The metallic behavior of CNT was also analyzed from I–V characteristics of the tunneling current.

STM carbon nanotube tips fabrication for critical dimension measurements / Pasquini, A; Picotto, G; Pisani, M. - In: SENSORS AND ACTUATORS. A, PHYSICAL. - ISSN 0924-4247. - 123-124(2005), pp. 655-659. [10.1016/j.sna.2005.02.03]

STM carbon nanotube tips fabrication for critical dimension measurements

PICOTTO, GIANBARTOLO;PISANI, MARCO
2005

Abstract

Reconstruction errors due to the finite shape of the tip remain the major limitation of scanning probe microscopy for nanometer scale measurements. Carbon nanotubes are ideal SPM probes thanks to their nanometric diameter, high aspect-ratio and strength. In this work, the feasibility of a method to attach CNT on the apex of a Tungsten tip has been tested. By the fabricated CNT tip we successfully imaged a metalized rectangular grating obtaining a profile nearly rectangular in comparison with classic STM-W tip. The metallic behavior of CNT was also analyzed from I–V characteristics of the tunneling current.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11696/30056
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