Within the European iMERA-Plus project ‘Traceable Characterisation of Nanoparticles’ various particle measurement procedures were developed and finally a measurement comparison for particle size was carried out among seven laboratories across six national metrology institutes. Seven high quality particle samples made from three different materials and having nominal sizes in the range from 10 to 200 nm were used. The participants applied five fundamentally different measurement methods, atomic force microscopy, dynamic light scattering (DLS), small-angle x-ray scattering, scanning electron microscopy and scanning electron microscopy in transmission mode, and provided a total of 48 independent, traceable results. The comparison reference values were determined as weighted means based on the estimated measurement uncertainties of the participants. The comparison reference values have combined standard uncertainties smaller than 1.4 nm for particles with sizes up to 100 nm. All methods, except DLS, provided consistent results.
Traceable size determination of nanoparticles, a comparison among European metrology institutes / Felix, Meli; Tobias, Klein; Egbert, Buhr; Carl, Georg Frase; Gudrun, Gleber; Michael, Krumrey; Alexandru, Duta; Steluta, Duta; Virpi, Korpelainen; Bellotti, Roberto; Picotto, Gianbartolo; Robert, D. Boyd; Alexandre, Cuenat. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 1361-6501. - 23:(2012), p. 125005. [10.1088/0957-0233/23/12/125005]
Traceable size determination of nanoparticles, a comparison among European metrology institutes
PICOTTO, GIANBARTOLO;
2012
Abstract
Within the European iMERA-Plus project ‘Traceable Characterisation of Nanoparticles’ various particle measurement procedures were developed and finally a measurement comparison for particle size was carried out among seven laboratories across six national metrology institutes. Seven high quality particle samples made from three different materials and having nominal sizes in the range from 10 to 200 nm were used. The participants applied five fundamentally different measurement methods, atomic force microscopy, dynamic light scattering (DLS), small-angle x-ray scattering, scanning electron microscopy and scanning electron microscopy in transmission mode, and provided a total of 48 independent, traceable results. The comparison reference values were determined as weighted means based on the estimated measurement uncertainties of the participants. The comparison reference values have combined standard uncertainties smaller than 1.4 nm for particles with sizes up to 100 nm. All methods, except DLS, provided consistent results.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
