MASSA, ENRICO

MASSA, ENRICO  

AE Metrologia applicata e ingegneria  

Mostra records
Risultati 1 - 20 di 88 (tempo di esecuzione: 0.014 secondi).
Citazione Data di pubblicazione Autori File
A finite element analysis of surface-stress effects on measurement of the Si lattice parameter / Quagliotti D; Mana G; Massa E; Sasso C; Kuetgens U. - In: METROLOGIA. - ISSN 0026-1394. - 50:3(2013), pp. 243-248. [10.1088/0026-1394/50/3/243] 2013 MANA, GIOVANNIMASSA, ENRICOSASSO, CARLO PAOLO + -
A micro-manipulator for scanning x-ray interferometry / G. DURANDO; MASSA E. - 2(2001), pp. 426-429. ((Intervento presentato al convegno 2nd euspen International Conference tenutosi a Turin nel 27 - 31 MAY. 2001 DURANDO, GIOVANNIMASSA, ENRICO -
A new scanning x-ray interferometer / A. BERGAMIN; G. CAVAGNERO; G. MANA; MASSA E; G. ZOSI. - (2000), pp. 109-110. ((Intervento presentato al convegno CPEM tenutosi a Sydney Australia nel 14-19 May. 2000 MANA, GIOVANNIMASSA, ENRICO + -
A two-axis tip-tilt platform for x-ray interferometry / Bergamin A; Cavagnero G; Durando G; Mana G; Massa E. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 14:6(2003), pp. 717-723. [10.1088/0957-0233/14/6/303] 2003 DURANDO, GIOVANNIMANA, GIOVANNIMASSA, ENRICO + -
Aberration effects in two-beam laser interferometers / Cavagnero Giovanni; Mana G; Massa Enrico. - In: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA. A, OPTICS, IMAGE SCIENCE, AND VISION. - ISSN 1084-7529. - 23:8(2006), pp. 1951-1959. [10.1364/JOSAA.23.001951] 2006 MANA, GIOVANNIMASSA, ENRICO + -
Accuracy of laser beam center and width calculations / Mana G; Massa E; Rovera A. - In: APPLIED OPTICS. - ISSN 0003-6935. - 40:9(2001), pp. 1378-1385. [10.1364/AO.40.001378] 2001 MANA, GIOVANNIMASSA, ENRICO + -
Accuracy of Temperature Measurements of the Avogadro-Project / Massa, Enrico; Mai, Torsten; Kuramoto, Naoki; Nicolaus, Arnold; Friedrich, Kathrin; Sasso, Carlo Paolo; Eppers, Daniela; Fujii, Kenichi. - (2018), pp. 1-2. ((Intervento presentato al convegno 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) tenutosi a Paris (France) nel 8-13 July 2018 [10.1109/CPEM.2018.8501059]. 2018 Massa, EnricoSasso, Carlo Paolo + -
Accurate measurements of the Avogadro and Planck constants by counting silicon atoms / Bettin H; Fujii K; Man J; Mana G; Massa E; Picard A. - In: ANNALEN DER PHYSIK. - ISSN 0003-3804. - 525:8-9(2013), pp. 680-687. [10.1002/andp.201300038] 2013 MANA, GIOVANNIMASSA, ENRICO + -
ADVANCES IN THE MEASUREMENT OF THE 28Si LATTICE PARAMETER / MASSA E; MANA G; KESSLER E G. - (2010), pp. 133-134. ((Intervento presentato al convegno CPEM 2010 tenutosi a Daejeon, Korea nel June 13-18, 2010. 2010 MASSA, ENRICOMANA, GIOVANNI + -
An automated resistor network to inspect the linearity of resistance-thermometry measurements / Massa E; Mana G. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 24:10(2013). [10.1088/0957-0233/24/10/107001] 2013 MASSA, ENRICOMANA, GIOVANNI -
Assessment of the accuracy of the 28Si (220) plane spacing / Mana, G.; Massa, E.; Sasso, C.. - (2014), pp. 396-397. ((Intervento presentato al convegno 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) [10.1109/CPEM.2014.6898426]. 2014 Mana, G.Massa, E.Sasso, C. 06898426.pdf
Avogadro constant measurements using enriched 28Si monocrystals / Fujii, K; Massa, E; Bettin, H; Kuramoto, N; Mana, G. - In: METROLOGIA. - ISSN 0026-1394. - 55:1(2018), pp. L1-L4. [10.1088/1681-7575/aa9abd] 2018 Massa, EMana, G + Fujii_2018_Metrologia_55_L1.pdf
Bayesian model selection applied to linear regressions with weighted data / Mana, Giovanni; Massa, Enrico; Sasso, Carlo Paolo. - In: METROLOGIA. - ISSN 0026-1394. - 56:2(2019). [10.1088/1681-7575/ab0338] 2019 Mana, GiovanniMassa, EnricoSasso, Carlo Paolo 2019_Bayesian model selection.pdf2019_Bayesian_model_revised.pdf
Calibration of a silicon crystal for absolute nuclear spectroscopy / MASSA E; MANA G; KUETGENS U; FERROGLIO L. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 0021-8898. - 43(2010), pp. 293-296. 2010 MASSA, ENRICOMANA, GIOVANNI + -
Comparison of IMGC and PTB absolute determinations of the Si (220) lattice spacing / P. BEKER; U. KUETGENS; G. MANA; MASSA E. - (2004), pp. 441-442. ((Intervento presentato al convegno CPEM tenutosi a London nel 27th June 2nd July. 2004 MANA, GIOVANNIMASSA, ENRICO + -
Comparison of the INRIM and PTB lattice-spacing standards / MASSA E; MANA G; KUETGENS U. - In: METROLOGIA. - ISSN 0026-1394. - 46(2009), pp. 249-253. 2009 MASSA, ENRICOMANA, GIOVANNI + -
CONFIRMATION OF THE IMGC AND PTB DETERMINATIONS OF THE SILICON LATTICE SPACING / G. CAVAGNERO; G. MANA; MASSA E; P. BECKER; U. KUETGENS. - (2006), pp. 66-67. ((Intervento presentato al convegno CPEM tenutosi a Turin nel 10-14 July. 2006 MANA, GIOVANNIMASSA, ENRICO + -
Confirmation of the INRiM and PTB determinations of the Si lattice parameter / BECKER P; CAVAGNERO G; KUETGENS U; MANA G; MASSA E. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 56(2007), pp. 230-234. 2007 MANA, GIOVANNIMASSA, ENRICO + -
The Correlation of the NA Measurements by Counting 28Si Atoms / Mana, Giovanni; Massa, Enrico; Sasso, CARLO PAOLO; Stock, M.; Fujii, K.; Kuramoto, N.; Mizushima, S.; Narukawa, T.; Borys, M.; Busch, I.; Nicolaus, A.; Pramann, A.. - In: JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA. - ISSN 0047-2689. - 44:3(2015), p. 031209. [10.1063/1.4921240] 2015 MANA, GIOVANNIMASSA, ENRICOSASSO, CARLO PAOLO + 2015_correlation_NA.pdf2015_correlation_NA_revised.pdf
Counting atoms / Massa, Enrico; Mana, Giovanni. - In: NATURE PHYSICS. - ISSN 1745-2473. - 12:5(2016), pp. 522-522. [10.1038/nphys3754] 2016 MASSA, ENRICOMANA, GIOVANNI 2016_nature_counting_atoms.pdf2016_draft_Nature_counting_atoms.pdf