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EnglishIn 2011, a discrepancy between the values of the Planck constant measured by counting Si atoms and by comparing mechanical and electrical powers prompted a review, among others, of the measurement of the spacing of Si-28 {220} lattice planes, either to confirm the measured value and its uncertainty or to identify errors. This exercise confirmed the result of the previous measurement and yields the additional value d(220) = 192 014 711.98(34) am having a reduced uncertainty. (C) 2015 AIP Publishing LLC.
A More Accurate Measurement of the Si-28 Lattice Parameter / Massa, Enrico; Sasso, Carlo Paolo; Mana, Giovanni; Palmisano, C.. - In: JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA. - ISSN 0047-2689. - 44:3(2015), p. 031208. [10.1063/1.4917488]
| Titolo: | A More Accurate Measurement of the Si-28 Lattice Parameter | |
| Autori: | ||
| Data di pubblicazione: | 2015 | |
| Rivista: | JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA | |
| Digital Object Identifier (DOI): | http://dx.doi.org/10.1063/1.4917488 | |
| Abstract: | In 2011, a discrepancy between the values of the Planck constant measured by counting Si atoms an...d by comparing mechanical and electrical powers prompted a review, among others, of the measurement of the spacing of Si-28 {220} lattice planes, either to confirm the measured value and its uncertainty or to identify errors. This exercise confirmed the result of the previous measurement and yields the additional value d(220) = 192 014 711.98(34) am having a reduced uncertainty. (C) 2015 AIP Publishing LLC. | |
| Full-text (pubblici): | open | |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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