MANA, GIOVANNI

MANA, GIOVANNI  

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Citazione Data di pubblicazione Autori File
A DISPLACEMENT AND ANGLE INTERFEROMETER WITH SUBATOMIC RESOLUTION / Bergamin, A; Cavagnero, G; Mana, Giovanni. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 64:11(1993), pp. 3076-3081. [10.1063/1.1144362] 1993 MANA, GIOVANNI + -
A feasibility study for the measurement of the 30Si mole fraction of the AVO28 material by Instrumental Neutron Activation Analysis / D'Agostino, Giancarlo; Mana, Giovanni; Oddone, M; Prata, M; Bergamaschi, Luigi. - (2013). 2013 D'AGOSTINO, GIANCARLOMANA, GIOVANNIBERGAMASCHI, LUIGI + -
A finite element analysis of surface-stress effects on measurement of the Si lattice parameter / Quagliotti, D; Mana, Giovanni; Massa, Enrico; Sasso, CARLO PAOLO; Kuetgens, U.. - In: METROLOGIA. - ISSN 0026-1394. - 50:3(2013), pp. 243-248. [10.1088/0026-1394/50/3/243] 2013 MANA, GIOVANNIMASSA, ENRICOSASSO, CARLO PAOLO + -
A Fizeau interferometer for astrometry in space: the metrology point of view / Gai, M; Lattanzi, Mg; Mana, Giovanni. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 10:12(1999), pp. 1254-1260. [10.1088/0957-0233/10/12/318] 1999 MANA, GIOVANNI + -
A Fourier optics approach to the dynamical theory of X-ray diffraction - perfect crystals / Mana, Giovanni; Montanari, F.. - In: ACTA CRYSTALLOGRAPHICA. SECTION A, FOUNDATIONS OF CRYSTALLOGRAPHY. - ISSN 0108-7673. - 60:(2004), pp. 40-50. [10.1107/S0108767303022815] 2004 MANA, GIOVANNI + -
A Fourier optics approach to the dynamical theory of X-ray diffraction – continuously deformed crystals / Mana, Giovanni; Palmisano, C.. - In: ACTA CRYSTALLOGRAPHICA. SECTION A, FOUNDATIONS OF CRYSTALLOGRAPHY. - ISSN 0108-7673. - A60:(2004), pp. 283-293. 2004 MANA, GIOVANNI + -
A Fourier optics model of two-beam scanning laser interferometers / Bergamin, A; Cavagnero, G; Cordiali, L; Mana, Giovanni. - In: THE EUROPEAN PHYSICAL JOURNAL. D, ATOMIC, MOLECULAR AND OPTICAL PHYSICS. - ISSN 1434-6060. - 5:3(1999), pp. 433-440. [10.1007/s100530050275] 1999 MANA, GIOVANNI + -
A More Accurate Measurement of the Si-28 Lattice Parameter / Massa, Enrico; Sasso, CARLO PAOLO; Mana, Giovanni; Palmisano, C.. - In: JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA. - ISSN 0047-2689. - 44:3(2015), p. 031208. [10.1063/1.4917488] 2015 MASSA, ENRICOSASSO, CARLO PAOLOMANA, GIOVANNI + 2015_d220_AIP.pdf
A new analysis for diffraction correction in optical interferometry / Mana, G; Massa, E; Sasso, C. P; Andreas, B; Kuetgens, U.. - In: METROLOGIA. - ISSN 0026-1394. - 54:4(2017), pp. 559-565. [10.1088/1681-7575/aa76af] 2017 Mana, GMassa, ESasso, C. P + 2017 Metrologia diffraction correction.pdf
A NEW DETERMINATION OF N-A / Basile, G; Becker, P; Bergamin, A; Bettin, H; Cavagnero, G; Debievre, P; Kutgens, U; Mana, Giovanni; Mosca, M; Pajot, B; Panciera, R; Pasin, W; Pettorruso, S; Peuto, A; Sacconi, A; Stumpel, J; Valkiers, S; Vittone, E; Zosi, G.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 44:2(1995), pp. 538-541. [10.1109/19.377901] 1995 MANA, GIOVANNI + -
A new low-uncertainty measurement of the31Si half-life / D'Agostino, Giancarlo; Di Luzio, M; Mana, Giovanni; Oddone, M.. - In: METROLOGIA. - ISSN 0026-1394. - 54:3(2017), pp. 410-416. [10.1088/1681-7575/aa6edf] 2017 D'AGOSTINO, GIANCARLODi Luzio, MMANA, GIOVANNI + dagostino_et_al.pdf2017 dagostino halflife.pdf
A new scanning x-ray interferometer / A., Bergamin; G., Cavagnero; Mana, Giovanni; Massa, Enrico; G., Zosi. - (2000), pp. 109-110. ((Intervento presentato al convegno CPEM tenutosi a Sydney Australia nel 14-19 May. 2000 MANA, GIOVANNIMASSA, ENRICO + -
A Possible Solution for the Discrepancy Between the INRIM and NMIJ Values of the Si Lattice-Parameter / H., Fujimoto; Mana, Giovanni; K., Nakayama. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 56:(2007), pp. 351-355. 2007 MANA, GIOVANNI + -
A two thickness interferometer for lattice strain investigations / Massa, Enrico; Melis, Claudio; Sasso, Carlo Paolo; Kuetgens, Ulrich; Mana, Giovanni. - (2016), pp. 1-2. ((Intervento presentato al convegno 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) [10.1109/CPEM.2016.7540796]. 2016 Massa, EnricoSasso, Carlo PaoloMana, Giovanni + 07540796.pdf
A two-axis tip-tilt platform for x-ray interferometry / Bergamin, A; Cavagnero, G; Durando, Giovanni; Mana, Giovanni; Massa, Enrico. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 14:6(2003), pp. 717-723. [10.1088/0957-0233/14/6/303] 2003 DURANDO, GIOVANNIMANA, GIOVANNIMASSA, ENRICO + -
Aberration effects in two-beam laser interferometers / Cavagnero, Giovanni; Mana, Giovanni; Massa, Enrico. - In: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA. A, OPTICS, IMAGE SCIENCE, AND VISION. - ISSN 1084-7529. - 23:8(2006), pp. 1951-1959. [10.1364/JOSAA.23.001951] 2006 MANA, GIOVANNIMASSA, ENRICO + -
ACCURACY ASSESSMENT OF A LEAST-SQUARES ESTIMATOR FOR SCANNING-X-RAY INTERFEROMETRY / Bergamin, A; Cavagnero, G; Mana, Giovanni. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 2:8(1991), pp. 725-734. [10.1088/0957-0233/2/8/004] 1991 MANA, GIOVANNI + -
Accuracy assessment of data analysis in absolute gravimetry / Durando, Giovanni; Mana, Giovanni; Mazzoleni, F.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 52:2(2003), pp. 500-503. [10.1109/TIM.2003.810044] 2003 DURANDO, GIOVANNIMANA, GIOVANNI + -
Accuracy of laser beam center and width calculations / Mana, Giovanni; Massa, Enrico; Rovera, A.. - In: APPLIED OPTICS. - ISSN 0003-6935. - 40:9(2001), pp. 1378-1385. [10.1364/AO.40.001378] 2001 MANA, GIOVANNIMASSA, ENRICO + -
Accurate measurements of the Avogadro and Planck constants by counting silicon atoms / Bettin, H; Fujii, K; Man, J; Mana, Giovanni; Massa, Enrico; Picard, A.. - In: ANNALEN DER PHYSIK. - ISSN 0003-3804. - 525:8-9(2013), pp. 680-687. [10.1002/andp.201300038] 2013 MANA, GIOVANNIMASSA, ENRICO + -