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Risultati 41 - 50 di 147 (tempo di esecuzione: 0.003 secondi).
Diffraction effects in length measurements by laser interferometry
2016 Sasso, CARLO PAOLO; Massa, Enrico; Mana, Giovanni
Diffraction Effects in Optical Interferometers Illuminated by Laser Sources
1989 Mana, Giovanni
Effect of recycled light in two-beam interferometry
2005 G., Cavagnero; Mana, Giovanni; Massa, Enrico
Effects of analyser deformation in scanning x-ray interferometry
2004 Mana, Giovanni; Palmisano, C; Zosi, G.
Electromagnetic quantities and units derived from classical relativistic electrodynamics
1988 Mana, Giovanni
Elemental characterization of the Avogadro silicon crystal WASO 04 by neutron activation analysis
2012 D'Agostino, Giancarlo; Bergamaschi, Luigi; Giordani, L.; Mana, Giovanni; Massa, Enrico; Oddone, M.
Ellipsoidal nested sampling, expression of the model uncertainty and measurement
2015 Palmisano, C.; Mana, G.; Gervino, G.
Estimation of the centre of a diffraction peak by triggering the goniometer-angle readings via photon detection
2010 Mana, Giovanni; Krempel, J; Ferroglio, L.
Fake tilts in differential wavefront sensing
2019 Massa, Enrico; Sasso, Carlo Paolo; Mana, Giovanni
Forward scattering in two-beam laser interferometry
2018 Mana, G; Massa, E; Sasso, C. P.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Diffraction effects in length measurements by laser interferometry / Sasso, CARLO PAOLO; Massa, Enrico; Mana, Giovanni. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 24:6(2016), p. 6522-31. [10.1364/OE.24.006522] | 2016 | SASSO, CARLO PAOLOMASSA, ENRICOMANA, GIOVANNI | oe-24-6-6522(1).pdf |
| Diffraction Effects in Optical Interferometers Illuminated by Laser Sources / Mana, Giovanni. - In: METROLOGIA. - ISSN 0026-1394. - 26:2(1989), pp. 87-93. [10.1088/0026-1394/26/2/002] | 1989 | MANA, GIOVANNI | - |
| Effect of recycled light in two-beam interferometry / G., Cavagnero; Mana, Giovanni; Massa, Enrico. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 76:(2005), pp. 053106-053106. [10.1063/1.1899483] | 2005 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Effects of analyser deformation in scanning x-ray interferometry / Mana, Giovanni; Palmisano, C; Zosi, G.. - In: METROLOGIA. - ISSN 0026-1394. - 41:(2004), pp. 238-245. | 2004 | MANA, GIOVANNI + | - |
| Electromagnetic quantities and units derived from classical relativistic electrodynamics / Mana, Giovanni. - In: AMERICAN JOURNAL OF PHYSICS. - ISSN 0002-9505. - 56:12(1988), p. 1081. [10.1119/1.15750] | 1988 | MANA, GIOVANNI | - |
| Elemental characterization of the Avogadro silicon crystal WASO 04 by neutron activation analysis / D'Agostino, Giancarlo; Bergamaschi, Luigi; Giordani, L.; Mana, Giovanni; Massa, Enrico; Oddone, M.. - In: METROLOGIA. - ISSN 0026-1394. - 49:6(2012), pp. 696-701. [10.1088/0026-1394/49/6/696] | 2012 | D'AGOSTINO, GIANCARLOBERGAMASCHI, LUIGIMANA, GIOVANNIMASSA, ENRICO + | - |
| Ellipsoidal nested sampling, expression of the model uncertainty and measurement / Palmisano, C.; Mana, G.; Gervino, G.. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 626:(2015), p. 012070. [10.1088/1742-6596/626/1/012070] | 2015 | G. Mana + | 2015 Int J Mod Phys nested sampling.pdf |
| Estimation of the centre of a diffraction peak by triggering the goniometer-angle readings via photon detection / Mana, Giovanni; Krempel, J; Ferroglio, L.. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 0021-8898. - 43:(2010), pp. 83-88. | 2010 | MANA, GIOVANNI + | - |
| Fake tilts in differential wavefront sensing / Massa, Enrico; Sasso, Carlo Paolo; Mana, Giovanni. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 27:24(2019), p. 34505-34518. [10.1364/OE.27.034505] | 2019 | Massa, EnricoSasso, Carlo PaoloMana, Giovanni | oe-27-24-34505.pdf |
| Forward scattering in two-beam laser interferometry / Mana, G; Massa, E; Sasso, C. P.. - In: METROLOGIA. - ISSN 0026-1394. - 55:2(2018), pp. 222-228. [10.1088/1681-7575/aaac4d] | 2018 | Mana, GMassa, ESasso, C. P. | Mana_2018_Metrologia_55_222.pdf |
Risultati 41 - 50 di 147 (tempo di esecuzione: 0.003 secondi).
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Tipologia
- 1 Contributo su Rivista 147
- 1 Contributo su Rivista::1.1 Arti... 147
Data di pubblicazione
- 2020 - 2024 14
- 2010 - 2019 61
- 2000 - 2009 40
- 1990 - 1999 27
- 1986 - 1989 5
Editore
- IOP 10
- Optical Society of America 5
- American Chemical Society 3
- INT UNION CRYSTALLOGRAPHY 3
- IOP PUBLISHING LTD 3
- Wiley 3
- American Chemical Society (ACS) 2
- Elsevier 2
- AIP 1
- American Institute of Physics 1
Rivista
- METROLOGIA 54
- IEEE TRANSACTIONS ON INSTRUMENTAT... 10
- MEASUREMENT SCIENCE & TECHNOLOGY 10
- JOURNAL OF APPLIED CRYSTALLOGRAPHY 6
- OPTICS EXPRESS 6
- REVIEW OF SCIENTIFIC INSTRUMENTS 6
- ANALYTICAL CHEMISTRY 5
- JOURNAL OF APPLIED CRYSTALLOGRAPHY 4
- ACTA CRYSTALLOGRAPHICA. SECTION A... 3
- CLASSICAL AND QUANTUM GRAVITY 3
Keyword
- Avogadro constant 10
- metrology 5
- diffraction 4
- data analysis 3
- dynamical theory of X-ray diffrac... 3
- kilogram 3
- optical interferometry 3
- silicon 3
- X-ray interferometry 3
- bent crystals 2
Lingua
- eng 92
- ita 2
Accesso al fulltext
- no fulltext 101
- open 25
- partially open 17
- reserved 4