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EnglishHigh-accuracy dimensional measurements by laser interferometers require corrections because of diffraction, which makes the effective fringe-period different from the wavelength of a plane (or spherical) wave λ<sub>0</sub>. By using a combined X-ray and optical interferometer as a tool to investigate diffraction across a laser beam, we observed wavelength variations as large as 10<sup>-8</sup>λ<sub>0</sub>. We show that they originate from the wavefront evolution under paraxial propagation in the presence of wavefront- and intensity-profile perturbations.
Diffraction effects in length measurements by laser interferometry / Sasso, C P; Massa, E; Mana, G. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 24:6(2016), p. 6522-31.
| Titolo: | Diffraction effects in length measurements by laser interferometry |
| Autori: | |
| Data di pubblicazione: | 2016 |
| Rivista: | |
| Citazione: | Diffraction effects in length measurements by laser interferometry / Sasso, C P; Massa, E; Mana, G. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 24:6(2016), p. 6522-31. |
| Abstract: | High-accuracy dimensional measurements by laser interferometers require corrections because of diffraction, which makes the effective fringe-period different from the wavelength of a plane (or spherical) wave λ<sub>0</sub>. By using a combined X-ray and optical interferometer as a tool to investigate diffraction across a laser beam, we observed wavelength variations as large as 10<sup>-8</sup>λ<sub>0</sub>. We show that they originate from the wavefront evolution under paraxial propagation in the presence of wavefront- and intensity-profile perturbations. |
| Handle: | http://hdl.handle.net/11696/53077 |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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http://hdl.handle.net/11696/53077
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