High-accuracy dimensional measurements by laser interferometers require corrections because of diffraction, which makes the effective fringe-period different from the wavelength of a plane (or spherical) wave λ0. By using a combined X-ray and optical interferometer as a tool to investigate diffraction across a laser beam, we observed wavelength variations as large as 10-8λ0. We show that they originate from the wavefront evolution under paraxial propagation in the presence of wavefront- and intensity-profile perturbations.

Diffraction effects in length measurements by laser interferometry / Sasso, CARLO PAOLO; Massa, Enrico; Mana, Giovanni. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 24:6(2016), p. 6522-31. [10.1364/OE.24.006522]

Diffraction effects in length measurements by laser interferometry

SASSO, CARLO PAOLO;MASSA, ENRICO;MANA, GIOVANNI
2016

Abstract

High-accuracy dimensional measurements by laser interferometers require corrections because of diffraction, which makes the effective fringe-period different from the wavelength of a plane (or spherical) wave λ0. By using a combined X-ray and optical interferometer as a tool to investigate diffraction across a laser beam, we observed wavelength variations as large as 10-8λ0. We show that they originate from the wavefront evolution under paraxial propagation in the presence of wavefront- and intensity-profile perturbations.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11696/53077
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