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EnglishHigh-accuracy dimensional measurements by laser interferometers require corrections because of diffraction, which makes the effective fringe-period different from the wavelength of a plane (or spherical) wave λ0. By using a combined X-ray and optical interferometer as a tool to investigate diffraction across a laser beam, we observed wavelength variations as large as 10-8λ0. We show that they originate from the wavefront evolution under paraxial propagation in the presence of wavefront- and intensity-profile perturbations.
Diffraction effects in length measurements by laser interferometry / Sasso, Carlo Paolo; Massa, Enrico; Mana, Giovanni. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 24:6(2016), p. 6522-31. [10.1364/OE.24.006522]
| Titolo: | Diffraction effects in length measurements by laser interferometry | |
| Autori: | ||
| Data di pubblicazione: | 2016 | |
| Rivista: | OPTICS EXPRESS | |
| Digital Object Identifier (DOI): | http://dx.doi.org/10.1364/OE.24.006522 | |
| Abstract: | High-accuracy dimensional measurements by laser interferometers require corrections because of di...ffraction, which makes the effective fringe-period different from the wavelength of a plane (or spherical) wave λ0. By using a combined X-ray and optical interferometer as a tool to investigate diffraction across a laser beam, we observed wavelength variations as large as 10-8λ0. We show that they originate from the wavefront evolution under paraxial propagation in the presence of wavefront- and intensity-profile perturbations. | |
| Full-text (pubblici): | open | |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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http://hdl.handle.net/11696/53077
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