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EnglishHigh-accuracy dimensional measurements by laser interferometers require corrections because of diffraction, which makes the effective fringe-period different from the wavelength of a plane (or spherical) wave λ<sub>0</sub>. By using a combined X-ray and optical interferometer as a tool to investigate diffraction across a laser beam, we observed wavelength variations as large as 10<sup>-8</sup>λ<sub>0</sub>. We show that they originate from the wavefront evolution under paraxial propagation in the presence of wavefront- and intensity-profile perturbations.
| Titolo: | Diffraction effects in length measurements by laser interferometry |
| Autori: | |
| Data di pubblicazione: | 2016 |
| Rivista: | |
| Abstract: | High-accuracy dimensional measurements by laser interferometers require corrections because of diffraction, which makes the effective fringe-period different from the wavelength of a plane (or spherical) wave λ<sub>0</sub>. By using a combined X-ray and optical interferometer as a tool to investigate diffraction across a laser beam, we observed wavelength variations as large as 10<sup>-8</sup>λ<sub>0</sub>. We show that they originate from the wavefront evolution under paraxial propagation in the presence of wavefront- and intensity-profile perturbations. |
| Handle: | http://hdl.handle.net/11696/53077 |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
File in questo prodotto:
| File | Descrizione | Tipologia | Licenza | |
|---|---|---|---|---|
| oe-24-6-6522(1).pdf | Versione editoriale | Open Access Visualizza/Apri |
http://hdl.handle.net/11696/53077
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