Two-beam interferometry is a tool of high-precision length-metrology, where displacements are measured to within sub-nanometer resolution and accuracy. Differential wavefront sensing - via phase detection by segmented photodiodes - adds the capability of simultaneously measuring the target translation and rotation. This paper gives an analytical model explaining the observation of fake tilts by a combined x-ray and optical interferometer.
Fake tilts in differential wavefront sensing / Massa, Enrico; Sasso, Carlo Paolo; Mana, Giovanni. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 27:24(2019), p. 34505-34518.
Titolo: | Fake tilts in differential wavefront sensing |
Autori: | |
Data di pubblicazione: | 2019 |
Rivista: | |
Citazione: | Fake tilts in differential wavefront sensing / Massa, Enrico; Sasso, Carlo Paolo; Mana, Giovanni. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 27:24(2019), p. 34505-34518. |
Handle: | http://hdl.handle.net/11696/62225 |
Appare nelle tipologie: | 1.1 Articolo in rivista |
File in questo prodotto:
File | Descrizione | Tipologia | Licenza | |
---|---|---|---|---|
oe-27-24-34505.pdf | © XXXX Optical Society of America. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved. | Versione editoriale | PUBBLICO - Tutti i diritti riservati | Visibile a tuttiVisualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.