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A DISPLACEMENT AND ANGLE INTERFEROMETER WITH SUBATOMIC RESOLUTION
1993 Bergamin, A; Cavagnero, G; Mana, Giovanni
A finite element analysis of surface-stress effects on measurement of the Si lattice parameter
2013 Quagliotti, D; Mana, Giovanni; Massa, Enrico; Sasso, CARLO PAOLO; Kuetgens, U.
A Fizeau interferometer for astrometry in space: the metrology point of view
1999 Gai, M; Lattanzi, Mg; Mana, Giovanni
A Fourier optics approach to the dynamical theory of X-ray diffraction - perfect crystals
2004 Mana, Giovanni; Montanari, F.
A Fourier optics approach to the dynamical theory of X-ray diffraction – continuously deformed crystals
2004 Mana, Giovanni; Palmisano, C.
A Fourier optics model of two-beam scanning laser interferometers
1999 Bergamin, A; Cavagnero, G; Cordiali, L; Mana, Giovanni
A More Accurate Measurement of the Si-28 Lattice Parameter
2015 Massa, Enrico; Sasso, CARLO PAOLO; Mana, Giovanni; Palmisano, C.
A new analysis for diffraction correction in optical interferometry
2017 Mana, G; Massa, E; Sasso, C. P; Andreas, B; Kuetgens, U.
A NEW DETERMINATION OF N-A
1995 Basile, G; Becker, P; Bergamin, A; Bettin, H; Cavagnero, G; Debievre, P; Kutgens, U; Mana, Giovanni; Mosca, M; Pajot, B; Panciera, R; Pasin, W; Pettorruso, S; Peuto, A; Sacconi, A; Stumpel, J; Valkiers, S; Vittone, E; Zosi, G.
A new low-uncertainty measurement of the31Si half-life
2017 D'Agostino, Giancarlo; Di Luzio, M; Mana, Giovanni; Oddone, M.
Citazione | Data di pubblicazione | Autori | File |
---|---|---|---|
A DISPLACEMENT AND ANGLE INTERFEROMETER WITH SUBATOMIC RESOLUTION / Bergamin, A; Cavagnero, G; Mana, Giovanni. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 64:11(1993), pp. 3076-3081. [10.1063/1.1144362] | 1993 | MANA, GIOVANNI + | - |
A finite element analysis of surface-stress effects on measurement of the Si lattice parameter / Quagliotti, D; Mana, Giovanni; Massa, Enrico; Sasso, CARLO PAOLO; Kuetgens, U.. - In: METROLOGIA. - ISSN 0026-1394. - 50:3(2013), pp. 243-248. [10.1088/0026-1394/50/3/243] | 2013 | MANA, GIOVANNIMASSA, ENRICOSASSO, CARLO PAOLO + | - |
A Fizeau interferometer for astrometry in space: the metrology point of view / Gai, M; Lattanzi, Mg; Mana, Giovanni. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 10:12(1999), pp. 1254-1260. [10.1088/0957-0233/10/12/318] | 1999 | MANA, GIOVANNI + | - |
A Fourier optics approach to the dynamical theory of X-ray diffraction - perfect crystals / Mana, Giovanni; Montanari, F.. - In: ACTA CRYSTALLOGRAPHICA. SECTION A, FOUNDATIONS OF CRYSTALLOGRAPHY. - ISSN 0108-7673. - 60:(2004), pp. 40-50. [10.1107/S0108767303022815] | 2004 | MANA, GIOVANNI + | - |
A Fourier optics approach to the dynamical theory of X-ray diffraction – continuously deformed crystals / Mana, Giovanni; Palmisano, C.. - In: ACTA CRYSTALLOGRAPHICA. SECTION A, FOUNDATIONS OF CRYSTALLOGRAPHY. - ISSN 0108-7673. - A60:(2004), pp. 283-293. | 2004 | MANA, GIOVANNI + | - |
A Fourier optics model of two-beam scanning laser interferometers / Bergamin, A; Cavagnero, G; Cordiali, L; Mana, Giovanni. - In: THE EUROPEAN PHYSICAL JOURNAL. D, ATOMIC, MOLECULAR AND OPTICAL PHYSICS. - ISSN 1434-6060. - 5:3(1999), pp. 433-440. [10.1007/s100530050275] | 1999 | MANA, GIOVANNI + | - |
A More Accurate Measurement of the Si-28 Lattice Parameter / Massa, Enrico; Sasso, CARLO PAOLO; Mana, Giovanni; Palmisano, C.. - In: JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA. - ISSN 0047-2689. - 44:3(2015), p. 031208. [10.1063/1.4917488] | 2015 | MASSA, ENRICOSASSO, CARLO PAOLOMANA, GIOVANNI + | 2015_d220_AIP.pdf |
A new analysis for diffraction correction in optical interferometry / Mana, G; Massa, E; Sasso, C. P; Andreas, B; Kuetgens, U.. - In: METROLOGIA. - ISSN 0026-1394. - 54:4(2017), pp. 559-565. [10.1088/1681-7575/aa76af] | 2017 | Mana, GMassa, ESasso, C. P + | 2017 Metrologia diffraction correction.pdf |
A NEW DETERMINATION OF N-A / Basile, G; Becker, P; Bergamin, A; Bettin, H; Cavagnero, G; Debievre, P; Kutgens, U; Mana, Giovanni; Mosca, M; Pajot, B; Panciera, R; Pasin, W; Pettorruso, S; Peuto, A; Sacconi, A; Stumpel, J; Valkiers, S; Vittone, E; Zosi, G.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 44:2(1995), pp. 538-541. [10.1109/19.377901] | 1995 | MANA, GIOVANNI + | - |
A new low-uncertainty measurement of the31Si half-life / D'Agostino, Giancarlo; Di Luzio, M; Mana, Giovanni; Oddone, M.. - In: METROLOGIA. - ISSN 0026-1394. - 54:3(2017), pp. 410-416. [10.1088/1681-7575/aa6edf] | 2017 | D'AGOSTINO, GIANCARLODi Luzio, MMANA, GIOVANNI + | dagostino_et_al.pdf; 2017 dagostino halflife.pdf |
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Opzioni
Scopri
Tipologia
- 1 Contributo su Rivista 147
- 1 Contributo su Rivista::1.1 Arti... 147
Data di pubblicazione
- 2020 - 2024 14
- 2010 - 2019 61
- 2000 - 2009 40
- 1990 - 1999 27
- 1986 - 1989 5
Editore
- IOP 10
- Optical Society of America 5
- American Chemical Society 3
- INT UNION CRYSTALLOGRAPHY 3
- IOP PUBLISHING LTD 3
- Wiley 3
- American Chemical Society (ACS) 2
- Elsevier 2
- AIP 1
- American Institute of Physics 1
Rivista
- METROLOGIA 54
- IEEE TRANSACTIONS ON INSTRUMENTAT... 10
- MEASUREMENT SCIENCE & TECHNOLOGY 10
- JOURNAL OF APPLIED CRYSTALLOGRAPHY 6
- OPTICS EXPRESS 6
- REVIEW OF SCIENTIFIC INSTRUMENTS 6
- ANALYTICAL CHEMISTRY 5
- JOURNAL OF APPLIED CRYSTALLOGRAPHY 4
- ACTA CRYSTALLOGRAPHICA. SECTION A... 3
- CLASSICAL AND QUANTUM GRAVITY 3
Keyword
- Avogadro constant 10
- metrology 5
- diffraction 4
- data analysis 3
- dynamical theory of X-ray diffrac... 3
- kilogram 3
- optical interferometry 3
- silicon 3
- X-ray interferometry 3
- bent crystals 2
Lingua
- eng 92
- ita 2
Accesso al fulltext
- no fulltext 101
- open 25
- partially open 17
- reserved 4