MEDVED BERNACHEA, JUAN IGNACIO
MEDVED BERNACHEA, JUAN IGNACIO
QN Metrologia quantistica e nanotecnologie
An International Trilateral Comparison Among the Newest Generations of Digital and Josephson Impedance Bridges
2025 Ortolano, Massimo; Marzano, Martina; Overney, Frédéric; Eichenberger, Ali L.; Kucera, Jan; D'Elia, Vincenzo; Bartova, Lucie; Medved, Juan; Callegaro, Luca
Calibration of Magnitude Error of Lock-in Amplifiers and Noise Response
2024 Cultrera, Alessandro; Medved, Juan; Ortolano, Massimo; Durandetto, Paolo; Sosso, Andrea; Callegaro, Luca
Il progetto QuAHMET, Quantum anomalous Hall effect materials and devices for metrology: attività all'INRIM
2024 Callegaro, Luca; Marzano, Martina; Medved, Juan; Gould, C.; Hoffmann, J.; Huang, N.; -Kaneko, N. H.; Kucera, J.; Molenkamp, L. W.; Onbasli, M. C.; Ozbay, A. G.; Scherer, H.; Kumar, S.
Magnitude and Phase Calibration of Lock-In Amplifiers, and Analysis of the Noise Response
2025 Cultrera, Alessandro; Medved, Juan; Durandetto, Paolo; Ortolano, Massimo; Sosso, Andrea; Callegaro, Luca
MetSuperCap: Metrology for static and dynamic characterisation of supercapacitors
2025 Zucca, Mauro; Al-Zubaidi-R-Smith, Nawfal; Bartova, Lucie; Van Den Brom, Helko; Callegaro, Luca; Cultrera, Alessandro; Fast, Lars; Girimonte, Aldo; Hassanzadeh, Melika; Mariscotti, Andrea; Masouras, Athanasios; Medved, Juan; Musumeci, Salvatore; Nicol, Giovanna; Ouameur, Mohamed; Rietveld, Gert
Misure su effetto Hall quantistico in criostato senza elio
2024 Medved, Juan; Callegaro, Luca; Cassiago, Cristina; Cultrera, Alessandro; D’Elia, Vincenzo; Enrico, Emanuele; Gasparotto, Enrico; Marzano, Martina; Ortolano, Massimo; Pierz, Klaus
QuAHMET: Quantum anomalous Hall effect materials and devices for metrology
2025 Callegaro, Luca; Marzano, Martina; Medved, Juan; Gould, Charles; Hoffmann, Johannes; Huang, Nathaniel; Kaneko, Nobu-Hisa; Kucera, Jan; Molenkamp, Laurens W.; Onbasli, Mehmet Cengiz; Ozbay, Aisha Gokce; Scherer, Hansjörg; Kumar, Susmit
QuAHMET: Quantum anomalous Hall effect materials and devices for metrology
2024 Marzano, Martina; Callegaro, Luca; Medved, Juan; Gould, Charles; Hoffmann, Johannes; Huang, Nathaniel; Kaneko, Nobu-Hisa; Kučera, Jan; Molenkamp, Laurens W.; Onbasli, Mehmet Cengiz; Ozbay, Aisha Gokce; Scherer, Hansjoerg; Kumar, Susmit
Towards a realisation of the unit ohm from the quantum anomalous Hall effect at INRIM
2025 Juan, Medved; Marzano, Martina; Ortolano, Massimo; Callegaro, Luca
Traceable Measurements of Mutual Inductance Standards Applied to Large Capacitance Simulation in Electrochemical Impedance Spectroscopy
2024 Medved, Juan; Cultrera, Alessandro; Marzano, Martina; D'Elia, Vincenzo; Ortolano, Massimo; Callegaro, Luca
Trilateral Comparison Among Digital and Josephson Impedance Bridges
2024 Marzano, Martina; Ortolano, Massimo; Overney, Frédéric; Eichenberger, Ali L.; Kucera, Jan; D'Elia, Vincenzo; Bartova, Lucie; Medved, Juan; Callegaro, Luca
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| An International Trilateral Comparison Among the Newest Generations of Digital and Josephson Impedance Bridges / Ortolano, Massimo; Marzano, Martina; Overney, Frédéric; Eichenberger, Ali L.; Kucera, Jan; D'Elia, Vincenzo; Bartova, Lucie; Medved, Juan; Callegaro, Luca. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 74:(2025), pp. 1-9. [10.1109/tim.2025.3541803] | 2025 | Ortolano, MassimoMarzano, MartinaD'Elia, VincenzoMedved, JuanCallegaro, Luca + | 2025_TIM_Ortolano_An_International_Trilateral_Comparison_Among_the_Newest_Generations_of_Digital_and_Josephson_Impedance_Bridges.pdf |
| Calibration of Magnitude Error of Lock-in Amplifiers and Noise Response / Cultrera, Alessandro; Medved, Juan; Ortolano, Massimo; Durandetto, Paolo; Sosso, Andrea; Callegaro, Luca. - (2024), pp. 1-2. [10.1109/cpem61406.2024.10646144] | 2024 | Cultrera, AlessandroMedved, JuanOrtolano, MassimoDurandetto, PaoloSosso, AndreaCallegaro, Luca | 20231122_CPEM_short_abstract_Lockin_input_noise_and_gain_calibration_sub.pdf; Calibration_of_Magnitude_Error_of_Lock-in_Amplifiers_and_Noise_Response.pdf |
| Il progetto QuAHMET, Quantum anomalous Hall effect materials and devices for metrology: attività all'INRIM / Callegaro, Luca; Marzano, Martina; Medved, Juan; Gould, C.; Hoffmann, J.; Huang, N.; -Kaneko, N. H.; Kucera, J.; Molenkamp, L. W.; Onbasli, M. C.; Ozbay, A. G.; Scherer, H.; Kumar, S.. - (2024), pp. 215-216. | 2024 | Luca CallegaroMartina MarzanoJuan Medved + | 20240510_GMEE2024_QuAHMET.pdf |
| Magnitude and Phase Calibration of Lock-In Amplifiers, and Analysis of the Noise Response / Cultrera, Alessandro; Medved, Juan; Durandetto, Paolo; Ortolano, Massimo; Sosso, Andrea; Callegaro, Luca. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 74:(2025), pp. 1-15. [10.1109/tim.2025.3553954] | 2025 | Cultrera, AlessandroMedved, JuanDurandetto, PaoloOrtolano, MassimoSosso, AndreaCallegaro, Luca | Magnitude_and_Phase_Calibration_of_Lock-In_Amplifiers_and_Analysis_of_the_Noise_Response (3).pdf |
| MetSuperCap: Metrology for static and dynamic characterisation of supercapacitors / Zucca, Mauro; Al-Zubaidi-R-Smith, Nawfal; Bartova, Lucie; Van Den Brom, Helko; Callegaro, Luca; Cultrera, Alessandro; Fast, Lars; Girimonte, Aldo; Hassanzadeh, Melika; Mariscotti, Andrea; Masouras, Athanasios; Medved, Juan; Musumeci, Salvatore; Nicol, Giovanna; Ouameur, Mohamed; Rietveld, Gert. - In: MEASUREMENT. SENSORS. - ISSN 2665-9174. - 38:(2025), pp. 101434-101434. [10.1016/j.measen.2024.101434] | 2025 | Zucca, MauroCallegaro, LucaCultrera, AlessandroHassanzadeh, MelikaMedved, JuanRietveld, Gert + | 1-s2.0-S2665917424004100-main.pdf |
| Misure su effetto Hall quantistico in criostato senza elio / Medved, Juan; Callegaro, Luca; Cassiago, Cristina; Cultrera, Alessandro; D’Elia, Vincenzo; Enrico, Emanuele; Gasparotto, Enrico; Marzano, Martina; Ortolano, Massimo; Pierz, Klaus. - (2024), pp. 205-206. ( VIII Forum Nazionale delle Misure 2024 San Vincenzo (LI) 12-14 Settembre 2024). | 2024 | Juan MedvedLuca CallegaroCristina CassiagoAlessandro CultreraVincenzo D’EliaEmanuele EnricoEnrico GasparottoMartina MarzanoMassimo Ortolano + | Juan_Medved_01.pdf |
| QuAHMET: Quantum anomalous Hall effect materials and devices for metrology / Callegaro, Luca; Marzano, Martina; Medved, Juan; Gould, Charles; Hoffmann, Johannes; Huang, Nathaniel; Kaneko, Nobu-Hisa; Kucera, Jan; Molenkamp, Laurens W.; Onbasli, Mehmet Cengiz; Ozbay, Aisha Gokce; Scherer, Hansjörg; Kumar, Susmit. - In: MEASUREMENT. SENSORS. - ISSN 2665-9174. - 38:(2025), p. 101437. [10.1016/j.measen.2024.101437] | 2025 | Callegaro, LucaMarzano, MartinaMedved, Juan + | 1-s2.0-S2665917424004136-main.pdf |
| QuAHMET: Quantum anomalous Hall effect materials and devices for metrology / Marzano, Martina; Callegaro, Luca; Medved, Juan; Gould, Charles; Hoffmann, Johannes; Huang, Nathaniel; Kaneko, Nobu-Hisa; Kučera, Jan; Molenkamp, Laurens W.; Onbasli, Mehmet Cengiz; Ozbay, Aisha Gokce; Scherer, Hansjoerg; Kumar, Susmit. - (2024), pp. 1-2. ( Conference on Precision Electromagnetic Measurements (CPEM) Denver (US) 8-12 Luglio 2024) [10.1109/cpem61406.2024.10645997]. | 2024 | Marzano, MartinaCallegaro, LucaMedved, Juan + | 20240412_QuAHMET_CPEM2024_summary_paper_revised_fixed.pdf; QuAHMET_Quantum_anomalous_Hall_effect_materials_and_devices_for_metrology.pdf |
| Towards a realisation of the unit ohm from the quantum anomalous Hall effect at INRIM / Juan, Medved; Marzano, Martina; Ortolano, Massimo; Callegaro, Luca. - (2025). ( INTERNATIONAL SCHOOL OF PHYSICS “ENRICO FERMI” Varenna (Ita) ). | 2025 | Medved JuanMarzano MartinaOrtolano MassimoCallegaro Luca | Varenna_2025_Poster_Medved.pdf |
| Traceable Measurements of Mutual Inductance Standards Applied to Large Capacitance Simulation in Electrochemical Impedance Spectroscopy / Medved, Juan; Cultrera, Alessandro; Marzano, Martina; D'Elia, Vincenzo; Ortolano, Massimo; Callegaro, Luca. - (2024), pp. 1-2. ( 2024 Conference on Precision Electromagnetic Measurements (CPEM) Denver, CO, USA 6-11 Jul 2024) [10.1109/cpem61406.2024.10646077]. | 2024 | Medved, JuanCultrera, AlessandroMarzano, MartinaD'Elia, VincenzoOrtolano, MassimoCallegaro, Luca | 2024022350.pdf; Traceable_Measurements_of_Mutual_Inductance_Standards_Applied_to_Large_Capacitance_Simulation_in_Electrochemical_Impedance_Spectroscopy.pdf |
| Trilateral Comparison Among Digital and Josephson Impedance Bridges / Marzano, Martina; Ortolano, Massimo; Overney, Frédéric; Eichenberger, Ali L.; Kucera, Jan; D'Elia, Vincenzo; Bartova, Lucie; Medved, Juan; Callegaro, Luca. - (2024), pp. 1-2. ( 2024 Conference on Precision Electromagnetic Measurements (CPEM) Denver (US) 8-12 Luglio 2024) [10.1109/cpem61406.2024.10646159]. | 2024 | Marzano, MartinaOrtolano, MassimoD'Elia, VincenzoMedved, JuanCallegaro, Luca + | Trilateral_Comparison_Among_Digital_and_Josephson_Impedance_Bridges.pdf; accepted.pdf |