METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

BELLOTTI, ROBERTO
 Distribuzione geografica
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Continente #
NA - Nord America 1.850
EU - Europa 1.482
AS - Asia 1.061
SA - Sud America 119
AF - Africa 39
OC - Oceania 6
Continente sconosciuto - Info sul continente non disponibili 3
Totale 4.560
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Nazione #
US - Stati Uniti d'America 1.793
SG - Singapore 450
IT - Italia 397
RU - Federazione Russa 267
CN - Cina 209
GB - Regno Unito 177
SE - Svezia 175
HK - Hong Kong 169
DE - Germania 148
BR - Brasile 93
UA - Ucraina 91
FR - Francia 86
VN - Vietnam 66
KR - Corea 56
PL - Polonia 38
IN - India 30
CA - Canada 29
JP - Giappone 29
ZA - Sudafrica 25
MX - Messico 22
FI - Finlandia 17
NL - Olanda 17
BE - Belgio 13
IE - Irlanda 13
ID - Indonesia 10
TR - Turchia 10
AR - Argentina 9
ES - Italia 9
AT - Austria 8
CH - Svizzera 7
CO - Colombia 7
EC - Ecuador 7
BD - Bangladesh 6
LT - Lituania 5
TW - Taiwan 5
AU - Australia 4
EG - Egitto 4
RO - Romania 4
AZ - Azerbaigian 3
CR - Costa Rica 2
EE - Estonia 2
EU - Europa 2
IQ - Iraq 2
KE - Kenya 2
NP - Nepal 2
NZ - Nuova Zelanda 2
PA - Panama 2
PT - Portogallo 2
TH - Thailandia 2
TN - Tunisia 2
VE - Venezuela 2
AO - Angola 1
BA - Bosnia-Erzegovina 1
BY - Bielorussia 1
CZ - Repubblica Ceca 1
DO - Repubblica Dominicana 1
DZ - Algeria 1
GA - Gabon 1
IL - Israele 1
IR - Iran 1
JM - Giamaica 1
KG - Kirghizistan 1
KW - Kuwait 1
LB - Libano 1
LK - Sri Lanka 1
MA - Marocco 1
MD - Moldavia 1
MY - Malesia 1
NO - Norvegia 1
PH - Filippine 1
PK - Pakistan 1
PS - Palestinian Territory 1
PY - Paraguay 1
RS - Serbia 1
SA - Arabia Saudita 1
SN - Senegal 1
UG - Uganda 1
UZ - Uzbekistan 1
XK - ???statistics.table.value.countryCode.XK??? 1
Totale 4.560
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Città #
Singapore 251
Cambridge 246
Ashburn 197
Hong Kong 164
Chandler 147
Turin 115
Fairfield 100
Ann Arbor 78
Beijing 73
Moscow 65
Boardman 64
New York 63
Seattle 49
Seoul 49
Houston 48
Los Angeles 46
Falkenstein 42
Jacksonville 42
Nyköping 36
Woodbridge 36
Rome 35
Wilmington 32
Strasbourg 31
Tokyo 29
Milan 25
San Mateo 24
Warsaw 24
Genoa 23
Des Moines 22
Dallas 21
Munich 21
Council Bluffs 20
London 19
Atlanta 18
Brooklyn 16
Ho Chi Minh City 16
Santa Clara 16
Hanoi 15
Stockholm 15
São Paulo 15
Brussels 13
Dublin 13
Helsinki 13
Johannesburg 13
Montreal 13
Chongqing 12
Amsterdam 11
Boston 11
Denver 11
Frankfurt am Main 11
Toronto 11
Mexico City 10
Phoenix 10
Chicago 9
Dearborn 9
Manchester 9
Chennai 8
Ogden 8
Ankara 7
Braunschweig 7
Dong Ket 7
Mumbai 7
Orem 7
Assago 6
Fragagnano 6
Hanover 6
Krakow 6
Pisa 6
Poplar 6
San Diego 6
Nuremberg 5
San Francisco 5
Shanghai 5
Wroclaw 5
Bexley 4
Biên Hòa 4
Bologna 4
Columbus 4
Guangzhou 4
Las Vegas 4
Miami 4
Rio de Janeiro 4
Suwon 4
Taichung 4
The Dalles 4
West Jordan 4
Xi'an 4
Zurich 4
Abbiategrasso 3
Annapolis 3
Baku 3
Goiânia 3
Haiphong 3
Milwaukee 3
Nanjing 3
Naples 3
Redwood City 3
Roubaix 3
Segrate 3
Shijiazhuang 3
Totale 2.732
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Nome #
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' 298
Recent advances of the metrological AFM at INRIM 294
Morphology-driven parameters of engineered functional surfaces 267
Strain measurements of cylinder magnetostrictive samples by interferometer readings 262
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support 261
Analisi delle incertezze associate al campione nazionale di portate di gas dell’INRIM denominato MeGas 253
Renewal of the gage-block interferometer at INRIM 245
A function-driven characterization of printed conductors on PV cells 236
Droplet volume variability as a critical factor for accuracy of absolute quantification using droplet digital PCR 232
3D characterization of printed structures by stylus- and optical-based measurements 232
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 209
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) 185
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale 179
Metrological features of the Large Piston Prover at INRIM 176
Nanodimensional characterization on nanowires: an interlaboratory comparison between AFMs 157
From data to nutrition: the impact of computing infrastructure and artificial intelligence 150
Calibration of atomic force microscope cantilevers based on μ-LDV: Metrological insight on the constitutive experimental parameters of Sader's formula for spring constant 137
Silicon nanowires: fabrication and quantitative dimensional characterisation by AFM 133
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes 132
Metrological Confirmation of the Stylus Profilometer Taylor Hobson Form Talysurf PGI Novus S 10 125
AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires 123
A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness 120
Development of control programs for automatic calibration of roughness and step standards 95
Traceable Dimensional Metrology of Nanoparticles and Nanostructures 94
Design and development of the Moore three axis measuring machine control system 72
Totale 4.667
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Categoria #
all - tutte 26.360
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 26.360
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021222 0 0 0 0 0 23 47 13 50 47 24 18
2021/2022265 42 27 16 21 25 6 14 20 25 24 12 33
2022/2023377 41 35 31 51 33 57 20 30 28 10 21 20
2023/2024343 23 12 28 33 30 21 41 15 55 17 23 45
2024/2025899 47 22 54 18 48 55 50 71 227 57 95 155
2025/20261.688 142 220 179 529 332 286 0 0 0 0 0 0
Totale 4.667