METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

GIURA, ANDREA
 Distribuzione geografica
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Continente #
NA - Nord America 1.254
EU - Europa 1.217
AS - Asia 1.168
Continente sconosciuto - Info sul continente non disponibili 103
SA - Sud America 97
AF - Africa 20
OC - Oceania 3
Totale 3.862
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Nazione #
US - Stati Uniti d'America 1.169
SG - Singapore 472
RU - Federazione Russa 413
IT - Italia 401
CN - Cina 296
VN - Vietnam 153
DE - Germania 123
HK - Hong Kong 76
BR - Brasile 70
FR - Francia 65
CA - Canada 45
KR - Corea 41
PL - Polonia 34
GB - Regno Unito 33
FI - Finlandia 28
MX - Messico 27
CH - Svizzera 26
BD - Bangladesh 24
ES - Italia 22
IN - India 21
JP - Giappone 21
NL - Olanda 21
SE - Svezia 17
AR - Argentina 13
TW - Taiwan 9
AT - Austria 8
ZA - Sudafrica 8
IQ - Iraq 7
TR - Turchia 7
IE - Irlanda 6
AE - Emirati Arabi Uniti 5
UA - Ucraina 5
VE - Venezuela 5
CR - Costa Rica 4
EC - Ecuador 4
ID - Indonesia 4
LT - Lituania 4
PH - Filippine 4
PK - Pakistan 4
UZ - Uzbekistan 4
AU - Australia 3
AZ - Azerbaigian 3
CO - Colombia 3
DZ - Algeria 3
JM - Giamaica 3
SA - Arabia Saudita 3
BE - Belgio 2
DO - Repubblica Dominicana 2
EG - Egitto 2
GE - Georgia 2
GR - Grecia 2
GT - Guatemala 2
IL - Israele 2
JO - Giordania 2
KG - Kirghizistan 2
RO - Romania 2
AO - Angola 1
BF - Burkina Faso 1
BY - Bielorussia 1
DK - Danimarca 1
ET - Etiopia 1
GD - Grenada 1
HN - Honduras 1
KH - Cambogia 1
KZ - Kazakistan 1
LA - Repubblica Popolare Democratica del Laos 1
LB - Libano 1
MA - Marocco 1
MT - Malta 1
MY - Malesia 1
NG - Nigeria 1
NP - Nepal 1
PE - Perù 1
PT - Portogallo 1
RS - Serbia 1
SN - Senegal 1
TN - Tunisia 1
UY - Uruguay 1
Totale 3.759
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Città #
Singapore 273
Ashburn 191
Turin 181
San Jose 119
Moscow 109
Council Bluffs 101
Beijing 66
Hong Kong 64
New York 64
Dallas 54
Falkenstein 45
Ho Chi Minh City 45
Seoul 40
Los Angeles 39
Rome 37
Milan 35
Hanoi 34
Boardman 29
Munich 25
Denver 23
Montreal 23
Helsinki 22
Lauterbourg 19
Tokyo 19
Warsaw 19
Orem 18
Des Moines 17
Mexico City 17
São Paulo 17
Santa Clara 16
Stockholm 16
Zurich 16
Atlanta 15
Phoenix 15
Amsterdam 14
Chicago 14
Chongqing 14
Frankfurt am Main 14
Brooklyn 11
Chennai 10
Haiphong 9
Assago 8
Boston 8
Guangzhou 8
Houston 8
Johannesburg 8
Poplar 8
Xi'an 8
Bologna 7
London 7
Seattle 7
Dublin 6
Florence 6
Genoa 6
Krakow 6
Opera 6
Shenzhen 6
West Jordan 6
Wroclaw 6
Ankara 5
Mumbai 5
Querétaro 5
Salvirola 5
Toronto 5
Abbiategrasso 4
Bexley 4
Buenos Aires 4
Buffalo 4
Cleveland 4
Da Nang 4
Lappeenranta 4
Lucerne 4
Manchester 4
Marcallo con Casone 4
Melbourne 4
Nuremberg 4
Quảng Ngãi 4
Roubaix 4
Salvador 4
Schlieren 4
Shanghai 4
Taichung 4
Tashkent 4
Vancouver 4
Baghdad 3
Changsha 3
City of London 3
Enschede 3
Innsbruck 3
Kingston 3
Manila 3
Memphis 3
New Delhi 3
North Charleston 3
Ogden 3
Paris 3
Piscataway 3
St Louis 3
Taipei 3
Trieste 3
Totale 2.187
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Nome #
Nanoporous Copper Films via Dynamic Hydrogen Bubbling: A Promising SERS Substrate for Sensitive Detection of Methylene Blue 241
Quantitative analysis and processing of surfaces and profiles from profilometry images 219
Characterization of surface finiture of different steels on mechanical components for energy harvesting 198
GeoTOP project: geometric measurements 194
Silicon nanowires: fabrication and quantitative dimensional characterisation by AFM 192
Metrological Confirmation of the Stylus Profilometer Taylor Hobson Form Talysurf PGI Novus S 10 189
Development of control programs for automatic calibration of roughness and step standards 188
Preliminary characterisation of electrical and mechanical quantities on a MEMS-SPM device 166
A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness 166
AFM tip reconstruction with known tip characterisers in Python environment 166
AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires 166
SurfILE: An Open-Source Python Package for Surface Topography Analysis 164
Software implementation for processing and quantitative analysis of surfaces and profiles from profilometry images 164
3D reconstruction of AFM tip by using known tip characterizers 158
Quantitative 3D determination of dimensional parameters of surfaces by optical profilometer’s images 151
Surface slope measurement of steep silicon V-grooves using high NA Linnik interferometry 150
3D reconstruction of AFM tip by using automatic shape recognition in Python environment 144
Early Biological Response to Poly(ε-Caprolactone)/Alumina-Toughened Zirconia Composites Obtained by 3D Printing for Peri-Implant Application 142
Traceable Dimensional Metrology of Nanoparticles and Nanostructures 135
Setup for form measurements with chromatic confocal sensor 132
Design and development of the Moore three axis measuring machine control system 125
Electrostatic MEMS generator/actuator of nanoforces traceable to electrical and mechanical quantities 73
Calibration of Atomic Force Microscope soft cantilevers based on μ-LDV: metrological insight on the constitutive experimental parameters of Sader's formulas for flexural and torsional effective spring constant 48
CMM measurement of injection-moulded plastic lenses and steel moulds: strategies for the determination of the reference system 46
Metrology and traceability at the nanoscale using AFM 37
Traceable characterisation of AFM probes: new ways to reconstruct tip shape and calibrate cantilevers 35
Metrological characterisation of Machine Vision Systems for the analysis of surfaces from advanced manufacturing 34
Microgeometric measurements of plastic lenses and metallic inserts by optical profilometry 26
AFM tip reconstruction with known tip characterizers, algorithms and applications in nanometrology 13
Totale 3.862
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Categoria #
all - tutte 15.399
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 15.399
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2022/202321 0 0 0 0 0 0 4 1 1 1 6 8
2023/2024208 25 8 8 15 21 5 23 7 20 16 11 49
2024/2025693 38 20 43 30 43 55 67 30 104 28 90 145
2025/20262.799 136 133 177 469 272 597 256 121 193 245 132 68
2026/2027141 62 79 0 0 0 0 0 0 0 0 0 0
Totale 3.862