METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

RIBOTTA, LUIGI
 Distribuzione geografica
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Continente #
NA - Nord America 2.529
EU - Europa 2.257
AS - Asia 2.062
SA - Sud America 166
AF - Africa 42
OC - Oceania 6
Continente sconosciuto - Info sul continente non disponibili 2
Totale 7.064
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Nazione #
US - Stati Uniti d'America 2.391
SG - Singapore 892
RU - Federazione Russa 738
IT - Italia 680
CN - Cina 467
VN - Vietnam 266
DE - Germania 212
FR - Francia 137
HK - Hong Kong 135
BR - Brasile 120
GB - Regno Unito 98
KR - Corea 86
CA - Canada 77
SE - Svezia 76
PL - Polonia 54
FI - Finlandia 45
MX - Messico 43
NL - Olanda 40
IN - India 39
ES - Italia 37
UA - Ucraina 37
JP - Giappone 35
BD - Bangladesh 29
CH - Svizzera 27
ZA - Sudafrica 23
IE - Irlanda 19
IQ - Iraq 18
AR - Argentina 17
TR - Turchia 17
AT - Austria 11
BE - Belgio 10
EC - Ecuador 9
ID - Indonesia 9
TW - Taiwan 9
LT - Lituania 8
PK - Pakistan 8
VE - Venezuela 8
UZ - Uzbekistan 6
AE - Emirati Arabi Uniti 5
CO - Colombia 5
PH - Filippine 5
RO - Romania 5
AU - Australia 4
CR - Costa Rica 4
DO - Repubblica Dominicana 4
IL - Israele 4
MY - Malesia 4
PE - Perù 4
SA - Arabia Saudita 4
TH - Thailandia 4
AZ - Azerbaigian 3
DZ - Algeria 3
EG - Egitto 3
GE - Georgia 3
KG - Kirghizistan 3
KZ - Kazakistan 3
RS - Serbia 3
SI - Slovenia 3
BG - Bulgaria 2
BY - Bielorussia 2
CZ - Repubblica Ceca 2
EE - Estonia 2
GR - Grecia 2
GT - Guatemala 2
HN - Honduras 2
JM - Giamaica 2
JO - Giordania 2
KE - Kenya 2
MA - Marocco 2
NZ - Nuova Zelanda 2
SN - Senegal 2
TN - Tunisia 2
XK - ???statistics.table.value.countryCode.XK??? 2
AO - Angola 1
BA - Bosnia-Erzegovina 1
BF - Burkina Faso 1
BS - Bahamas 1
CL - Cile 1
DK - Danimarca 1
ET - Etiopia 1
GA - Gabon 1
GD - Grenada 1
HU - Ungheria 1
KH - Cambogia 1
KW - Kuwait 1
LA - Repubblica Popolare Democratica del Laos 1
LB - Libano 1
LV - Lettonia 1
MD - Moldavia 1
MT - Malta 1
NG - Nigeria 1
NI - Nicaragua 1
NP - Nepal 1
OM - Oman 1
PA - Panama 1
PT - Portogallo 1
PY - Paraguay 1
UY - Uruguay 1
Totale 7.064
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Città #
Singapore 517
Ashburn 405
San Jose 256
Turin 231
Moscow 179
Council Bluffs 162
New York 127
Hong Kong 119
Beijing 110
Dallas 81
Boardman 77
Seoul 77
Falkenstein 75
Los Angeles 75
Ho Chi Minh City 71
Hanoi 67
Rome 67
Chandler 60
Cambridge 51
Milan 50
Helsinki 36
Lauterbourg 36
Montreal 35
Warsaw 35
Munich 34
Tokyo 33
Orem 32
Fairfield 31
Strasbourg 30
Denver 29
Des Moines 29
São Paulo 29
Houston 27
Mexico City 26
Atlanta 25
Frankfurt am Main 25
Seattle 24
Nyköping 23
Stockholm 23
Amsterdam 22
Ann Arbor 22
Chicago 21
Genoa 20
Brooklyn 19
Dublin 19
Chennai 18
Phoenix 18
Santa Clara 18
Wilmington 18
Woodbridge 17
Assago 16
Johannesburg 16
Zurich 16
Chongqing 14
Poplar 14
Ankara 12
Boston 12
Guangzhou 12
Haiphong 12
Manchester 12
West Jordan 12
London 11
Miami 11
Toronto 11
Da Nang 10
Wroclaw 10
Brussels 9
Jacksonville 9
Ogden 9
Padua 9
San Mateo 9
Shenzhen 9
Vancouver 9
Xi'an 9
Biên Hòa 8
Florence 8
Columbus 7
Dong Ket 7
Opera 7
Bologna 6
Braunschweig 6
Krakow 6
Lappeenranta 6
Naples 6
Nuremberg 6
Querétaro 6
Roubaix 6
San Francisco 6
Shanghai 6
Tashkent 6
Baghdad 5
Bexley 5
City of London 5
Mumbai 5
New Delhi 5
North Bergen 5
Paris 5
Pisa 5
Quảng Ngãi 5
Trieste 5
Totale 4.057
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Nome #
Morphology-driven parameters of engineered functional surfaces 313
3D characterization of printed structures by stylus- and optical-based measurements 310
A function-driven characterization of printed conductors on PV cells 300
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 265
Tip-sample characterization in the AFM study of a rod-shaped nanostructure 243
Nanoporous Copper Films via Dynamic Hydrogen Bubbling: A Promising SERS Substrate for Sensitive Detection of Methylene Blue 233
Nanodimensional characterization on nanowires: an interlaboratory comparison between AFMs 215
Quantitative analysis and processing of surfaces and profiles from profilometry images 211
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes 204
Characterization of surface finiture of different steels on mechanical components for energy harvesting 194
Metrologia di superfici funzionali per la caratterizzazione di celle fotovoltaiche 191
GeoTOP project: geometric measurements 187
Silicon nanowires: fabrication and quantitative dimensional characterisation by AFM 185
Calibration of atomic force microscope cantilevers based on μ-LDV: Metrological insight on the constitutive experimental parameters of Sader's formula for spring constant 185
Dimensional metrology at the nanoscale: quantitative characterization of nanoparticles by means of metrological atomic force microscopy 183
Metrological Confirmation of the Stylus Profilometer Taylor Hobson Form Talysurf PGI Novus S 10 182
Development of control programs for automatic calibration of roughness and step standards 178
A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness 165
AFM tip reconstruction with known tip characterisers in Python environment 164
Preliminary characterisation of electrical and mechanical quantities on a MEMS-SPM device 162
Software implementation for processing and quantitative analysis of surfaces and profiles from profilometry images 162
AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires 161
SurfILE: An Open-Source Python Package for Surface Topography Analysis 160
3D reconstruction of AFM tip by using known tip characterizers 156
Atomic force microscopy metrology of non-spherical nanoparticles 153
INRiM Technical Report 26/2020 - Indoor and outdoor measurements of particulate matter concentration in air during wintertime performed in INRiM Campus and in the CNR Research Area of Turin by using particle counters 151
Characterization of aluminum nitride film properties for high signal-to-noise ratio piezoelectric micro-electromechanical system microphones 146
Quantitative 3D determination of dimensional parameters of surfaces by optical profilometer’s images 146
Surface slope measurement of steep silicon V-grooves using high NA Linnik interferometry 143
3D reconstruction of AFM tip by using automatic shape recognition in Python environment 142
Early Biological Response to Poly(ε-Caprolactone)/Alumina-Toughened Zirconia Composites Obtained by 3D Printing for Peri-Implant Application 142
AFM metrology of shape controlled TiO2 nanoparticles 140
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy 133
Traceable Dimensional Metrology of Nanoparticles and Nanostructures 133
Design and development of the Moore three axis measuring machine control system 119
Metrological characterization of nanoparticles by mAFM 105
Quarantena 105
Tip-sample interaction in the AFM characterization of bio-plant nanostructures 91
Tip-sample interactions in the AFM study of rod-shaped nanostructures 87
Traceable Optical Metrology Software for Geometric Conformity Assessment of Complex 3D Parts 75
Electrostatic MEMS generator/actuator of nanoforces traceable to electrical and mechanical quantities 62
CMM measurement of injection-moulded plastic lenses and steel moulds: strategies for the determination of the reference system 41
Calibration of Atomic Force Microscope soft cantilevers based on μ-LDV: metrological insight on the constitutive experimental parameters of Sader's formulas for flexural and torsional effective spring constant 38
Metrology and traceability at the nanoscale using AFM 32
Traceable machine vision systems for digital industrial applications: the DI-Vision project 30
Traceable characterisation of AFM probes: new ways to reconstruct tip shape and calibrate cantilevers 30
Metrological characterisation of Machine Vision Systems for the analysis of surfaces from advanced manufacturing 27
Traceable Machine Vision Systems To The Si Metre Definition For Advanced Manufacturing 23
Robust reference data generation and evaluation of data fusion algorithms in dimensional metrology with traceability to the SI metre 22
Microgeometric measurements of plastic lenses and metallic inserts by optical profilometry 20
AFM tip reconstruction with known tip characterizers, algorithms and applications in nanometrology 7
Totale 7.252
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Categoria #
all - tutte 34.145
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 34.145
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20219 0 0 0 0 0 0 0 0 0 0 0 9
2021/2022128 21 9 6 8 13 2 6 9 12 13 10 19
2022/2023274 35 14 13 22 16 25 49 20 28 5 28 19
2023/2024513 46 38 35 36 41 26 64 32 63 35 29 68
2024/20251.216 56 34 84 37 89 95 95 66 216 52 155 237
2025/20264.799 223 227 300 776 455 1.054 492 193 319 420 243 97
Totale 7.252