METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

RIBOTTA, LUIGI
 Distribuzione geografica
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Continente #
NA - Nord America 2.273
EU - Europa 2.184
AS - Asia 2.029
SA - Sud America 166
AF - Africa 41
OC - Oceania 6
Continente sconosciuto - Info sul continente non disponibili 2
Totale 6.701
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Nazione #
US - Stati Uniti d'America 2.144
SG - Singapore 886
RU - Federazione Russa 738
IT - Italia 626
CN - Cina 457
VN - Vietnam 264
DE - Germania 212
FR - Francia 134
HK - Hong Kong 133
BR - Brasile 120
GB - Regno Unito 96
KR - Corea 86
SE - Svezia 76
CA - Canada 69
PL - Polonia 54
FI - Finlandia 45
MX - Messico 43
IN - India 39
ES - Italia 37
UA - Ucraina 37
NL - Olanda 36
JP - Giappone 35
ZA - Sudafrica 23
CH - Svizzera 21
IE - Irlanda 19
IQ - Iraq 18
AR - Argentina 17
TR - Turchia 17
BD - Bangladesh 16
AT - Austria 11
BE - Belgio 10
EC - Ecuador 9
ID - Indonesia 9
TW - Taiwan 9
LT - Lituania 8
PK - Pakistan 8
VE - Venezuela 8
UZ - Uzbekistan 6
AE - Emirati Arabi Uniti 5
CO - Colombia 5
PH - Filippine 5
RO - Romania 5
AU - Australia 4
DO - Repubblica Dominicana 4
IL - Israele 4
MY - Malesia 4
PE - Perù 4
SA - Arabia Saudita 4
TH - Thailandia 4
AZ - Azerbaigian 3
CR - Costa Rica 3
EG - Egitto 3
GE - Georgia 3
KG - Kirghizistan 3
KZ - Kazakistan 3
BG - Bulgaria 2
BY - Bielorussia 2
CZ - Repubblica Ceca 2
DZ - Algeria 2
EE - Estonia 2
GR - Grecia 2
GT - Guatemala 2
HN - Honduras 2
JM - Giamaica 2
JO - Giordania 2
KE - Kenya 2
MA - Marocco 2
NZ - Nuova Zelanda 2
RS - Serbia 2
SN - Senegal 2
TN - Tunisia 2
XK - ???statistics.table.value.countryCode.XK??? 2
AO - Angola 1
BA - Bosnia-Erzegovina 1
BF - Burkina Faso 1
BS - Bahamas 1
CL - Cile 1
DK - Danimarca 1
ET - Etiopia 1
GA - Gabon 1
GD - Grenada 1
HU - Ungheria 1
KH - Cambogia 1
KW - Kuwait 1
LA - Repubblica Popolare Democratica del Laos 1
LB - Libano 1
LV - Lettonia 1
MD - Moldavia 1
MT - Malta 1
NG - Nigeria 1
NI - Nicaragua 1
NP - Nepal 1
OM - Oman 1
PA - Panama 1
PT - Portogallo 1
PY - Paraguay 1
UY - Uruguay 1
Totale 6.701
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Città #
Singapore 516
Ashburn 372
San Jose 236
Turin 231
Moscow 179
New York 121
Hong Kong 119
Beijing 109
Boardman 77
Dallas 77
Seoul 77
Falkenstein 75
Ho Chi Minh City 71
Los Angeles 71
Hanoi 65
Rome 65
Chandler 60
Council Bluffs 54
Cambridge 51
Milan 42
Helsinki 36
Lauterbourg 36
Warsaw 35
Munich 34
Montreal 33
Tokyo 33
Orem 32
Fairfield 31
Strasbourg 30
Des Moines 29
São Paulo 29
Denver 28
Mexico City 26
Frankfurt am Main 25
Houston 25
Seattle 24
Atlanta 23
Nyköping 23
Stockholm 23
Ann Arbor 22
Amsterdam 20
Chicago 20
Genoa 20
Dublin 19
Brooklyn 18
Chennai 18
Wilmington 18
Phoenix 17
Woodbridge 17
Assago 16
Johannesburg 16
Santa Clara 15
Chongqing 14
Poplar 14
Zurich 13
Ankara 12
Boston 12
Guangzhou 12
Haiphong 12
Manchester 12
West Jordan 12
London 11
Toronto 11
Da Nang 10
Miami 10
Wroclaw 10
Brussels 9
Jacksonville 9
Ogden 9
San Mateo 9
Shenzhen 9
Xi'an 9
Biên Hòa 8
Florence 8
Vancouver 8
Columbus 7
Dong Ket 7
Bologna 6
Braunschweig 6
Krakow 6
Lappeenranta 6
Nuremberg 6
Querétaro 6
Roubaix 6
Shanghai 6
Tashkent 6
Baghdad 5
Bexley 5
City of London 5
Mumbai 5
Naples 5
New Delhi 5
Paris 5
Pisa 5
Quảng Ngãi 5
San Francisco 5
Abbiategrasso 4
Buenos Aires 4
Bắc Giang 4
Concord 4
Totale 3.836
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Nome #
Morphology-driven parameters of engineered functional surfaces 310
3D characterization of printed structures by stylus- and optical-based measurements 301
A function-driven characterization of printed conductors on PV cells 296
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 260
Tip-sample characterization in the AFM study of a rod-shaped nanostructure 240
Nanoporous Copper Films via Dynamic Hydrogen Bubbling: A Promising SERS Substrate for Sensitive Detection of Methylene Blue 213
Nanodimensional characterization on nanowires: an interlaboratory comparison between AFMs 212
Quantitative analysis and processing of surfaces and profiles from profilometry images 204
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes 194
Characterization of surface finiture of different steels on mechanical components for energy harvesting 192
Metrologia di superfici funzionali per la caratterizzazione di celle fotovoltaiche 186
Silicon nanowires: fabrication and quantitative dimensional characterisation by AFM 180
Calibration of atomic force microscope cantilevers based on μ-LDV: Metrological insight on the constitutive experimental parameters of Sader's formula for spring constant 180
Metrological Confirmation of the Stylus Profilometer Taylor Hobson Form Talysurf PGI Novus S 10 177
Development of control programs for automatic calibration of roughness and step standards 177
Dimensional metrology at the nanoscale: quantitative characterization of nanoparticles by means of metrological atomic force microscopy 177
GeoTOP project: geometric measurements 176
AFM tip reconstruction with known tip characterisers in Python environment 162
A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness 160
Software implementation for processing and quantitative analysis of surfaces and profiles from profilometry images 158
AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires 158
Preliminary characterisation of electrical and mechanical quantities on a MEMS-SPM device 156
3D reconstruction of AFM tip by using known tip characterizers 153
Atomic force microscopy metrology of non-spherical nanoparticles 149
INRiM Technical Report 26/2020 - Indoor and outdoor measurements of particulate matter concentration in air during wintertime performed in INRiM Campus and in the CNR Research Area of Turin by using particle counters 146
SurfILE: An Open-Source Python Package for Surface Topography Analysis 145
Quantitative 3D determination of dimensional parameters of surfaces by optical profilometer’s images 141
3D reconstruction of AFM tip by using automatic shape recognition in Python environment 138
Early Biological Response to Poly(ε-Caprolactone)/Alumina-Toughened Zirconia Composites Obtained by 3D Printing for Peri-Implant Application 138
Surface slope measurement of steep silicon V-grooves using high NA Linnik interferometry 137
AFM metrology of shape controlled TiO2 nanoparticles 137
Characterization of aluminum nitride film properties for high signal-to-noise ratio piezoelectric micro-electromechanical system microphones 136
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy 126
Traceable Dimensional Metrology of Nanoparticles and Nanostructures 126
Design and development of the Moore three axis measuring machine control system 114
Quarantena 103
Metrological characterization of nanoparticles by mAFM 101
Tip-sample interaction in the AFM characterization of bio-plant nanostructures 91
Tip-sample interactions in the AFM study of rod-shaped nanostructures 85
Electrostatic MEMS generator/actuator of nanoforces traceable to electrical and mechanical quantities 49
Traceable Optical Metrology Software for Geometric Conformity Assessment of Complex 3D Parts 34
Calibration of Atomic Force Microscope soft cantilevers based on μ-LDV: metrological insight on the constitutive experimental parameters of Sader's formulas for flexural and torsional effective spring constant 28
CMM measurement of injection-moulded plastic lenses and steel moulds: strategies for the determination of the reference system 25
Metrology and traceability at the nanoscale using AFM 19
Metrological characterisation of Machine Vision Systems for the analysis of surfaces from advanced manufacturing 18
Traceable machine vision systems for digital industrial applications: the DI-Vision project 17
null 16
Microgeometric measurements of plastic lenses and metallic inserts by optical profilometry 15
Traceable Machine Vision Systems To The Si Metre Definition For Advanced Manufacturing 14
Robust reference data generation and evaluation of data fusion algorithms in dimensional metrology with traceability to the SI metre 11
Totale 6.881
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Categoria #
all - tutte 32.525
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 32.525
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202145 0 0 0 0 0 0 0 0 0 27 9 9
2021/2022128 21 9 6 8 13 2 6 9 12 13 10 19
2022/2023274 35 14 13 22 16 25 49 20 28 5 28 19
2023/2024513 46 38 35 36 41 26 64 32 63 35 29 68
2024/20251.216 56 34 84 37 89 95 95 66 216 52 155 237
2025/20264.428 223 227 300 776 455 1.054 492 193 319 389 0 0
Totale 6.881