METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

RIBOTTA, LUIGI
 Distribuzione geografica
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Continente #
NA - Nord America 2.676
EU - Europa 2.266
AS - Asia 2.052
Continente sconosciuto - Info sul continente non disponibili 187
SA - Sud America 170
AF - Africa 41
OC - Oceania 6
Totale 7.398
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Nazione #
US - Stati Uniti d'America 2.527
SG - Singapore 878
RU - Federazione Russa 723
IT - Italia 699
CN - Cina 467
VN - Vietnam 265
DE - Germania 215
FR - Francia 139
HK - Hong Kong 136
BR - Brasile 122
GB - Regno Unito 98
CA - Canada 86
KR - Corea 84
SE - Svezia 75
PL - Polonia 55
FI - Finlandia 44
MX - Messico 43
ES - Italia 39
NL - Olanda 39
IN - India 38
UA - Ucraina 36
JP - Giappone 35
BD - Bangladesh 34
CH - Svizzera 27
ZA - Sudafrica 22
IE - Irlanda 18
IQ - Iraq 18
AR - Argentina 17
TR - Turchia 17
AT - Austria 11
BE - Belgio 10
EC - Ecuador 10
ID - Indonesia 10
TW - Taiwan 9
LT - Lituania 8
PK - Pakistan 8
VE - Venezuela 8
CO - Colombia 6
UZ - Uzbekistan 6
AE - Emirati Arabi Uniti 5
CR - Costa Rica 5
PH - Filippine 5
RO - Romania 5
SI - Slovenia 5
AU - Australia 4
DO - Repubblica Dominicana 4
IL - Israele 4
MY - Malesia 4
PE - Perù 4
SA - Arabia Saudita 4
TH - Thailandia 4
AZ - Azerbaigian 3
DZ - Algeria 3
EG - Egitto 3
GE - Georgia 3
JM - Giamaica 3
KG - Kirghizistan 3
KZ - Kazakistan 3
RS - Serbia 3
BG - Bulgaria 2
BY - Bielorussia 2
CZ - Repubblica Ceca 2
EE - Estonia 2
GR - Grecia 2
GT - Guatemala 2
HN - Honduras 2
JO - Giordania 2
KE - Kenya 2
MA - Marocco 2
NZ - Nuova Zelanda 2
SN - Senegal 2
TN - Tunisia 2
XK - ???statistics.table.value.countryCode.XK??? 2
AO - Angola 1
BA - Bosnia-Erzegovina 1
BF - Burkina Faso 1
CL - Cile 1
DK - Danimarca 1
ET - Etiopia 1
GA - Gabon 1
GD - Grenada 1
HU - Ungheria 1
IR - Iran 1
KH - Cambogia 1
KW - Kuwait 1
LA - Repubblica Popolare Democratica del Laos 1
LB - Libano 1
LV - Lettonia 1
MD - Moldavia 1
MT - Malta 1
NG - Nigeria 1
NI - Nicaragua 1
NP - Nepal 1
OM - Oman 1
PA - Panama 1
PR - Porto Rico 1
PT - Portogallo 1
PY - Paraguay 1
UY - Uruguay 1
Totale 7.213
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Città #
Singapore 512
Ashburn 406
San Jose 253
Turin 229
Council Bluffs 193
Moscow 175
New York 125
Hong Kong 119
Beijing 110
Dallas 83
Los Angeles 79
Falkenstein 75
Seoul 75
Boardman 74
Ho Chi Minh City 71
Hanoi 67
Rome 67
Chandler 60
Milan 53
Cambridge 51
Montreal 38
Munich 37
Helsinki 35
Lauterbourg 35
Warsaw 35
Tokyo 33
Orem 32
Fairfield 31
Strasbourg 30
Des Moines 29
São Paulo 29
Denver 28
Houston 28
Santa Clara 27
Atlanta 26
Mexico City 26
Seattle 26
Frankfurt am Main 25
Phoenix 24
Stockholm 23
Ann Arbor 22
Chicago 22
Nyköping 22
Amsterdam 21
Brooklyn 20
Wilmington 20
Genoa 19
Dublin 18
Chennai 17
Woodbridge 17
Assago 16
Johannesburg 16
Zurich 16
Chongqing 14
Poplar 14
Boston 13
Ankara 12
Guangzhou 12
Haiphong 12
Manchester 12
Miami 12
Toronto 12
London 11
Da Nang 10
West Jordan 10
Wroclaw 10
Brussels 9
Jacksonville 9
Opera 9
Padua 9
San Mateo 9
Shenzhen 9
Xi'an 9
Biên Hòa 8
Florence 8
Ogden 8
Vancouver 8
Bologna 7
Columbus 7
Dong Ket 7
Salt Lake City 7
Braunschweig 6
Krakow 6
Lappeenranta 6
Naples 6
Nuremberg 6
Querétaro 6
Roubaix 6
San Francisco 6
Shanghai 6
Tashkent 6
Baghdad 5
Bexley 5
Buffalo 5
City of London 5
Cleveland 5
Maribor 5
Mumbai 5
New Delhi 5
Newark 5
Totale 4.102
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Nome #
3D characterization of printed structures by stylus- and optical-based measurements 319
Morphology-driven parameters of engineered functional surfaces 315
A function-driven characterization of printed conductors on PV cells 307
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 268
Tip-sample characterization in the AFM study of a rod-shaped nanostructure 248
Nanoporous Copper Films via Dynamic Hydrogen Bubbling: A Promising SERS Substrate for Sensitive Detection of Methylene Blue 241
Nanodimensional characterization on nanowires: an interlaboratory comparison between AFMs 224
Quantitative analysis and processing of surfaces and profiles from profilometry images 219
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes 210
Characterization of surface finiture of different steels on mechanical components for energy harvesting 198
Metrologia di superfici funzionali per la caratterizzazione di celle fotovoltaiche 195
GeoTOP project: geometric measurements 194
Silicon nanowires: fabrication and quantitative dimensional characterisation by AFM 192
Calibration of atomic force microscope cantilevers based on μ-LDV: Metrological insight on the constitutive experimental parameters of Sader's formula for spring constant 192
Metrological Confirmation of the Stylus Profilometer Taylor Hobson Form Talysurf PGI Novus S 10 189
Development of control programs for automatic calibration of roughness and step standards 188
Dimensional metrology at the nanoscale: quantitative characterization of nanoparticles by means of metrological atomic force microscopy 186
Preliminary characterisation of electrical and mechanical quantities on a MEMS-SPM device 166
A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness 166
AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires 166
AFM tip reconstruction with known tip characterisers in Python environment 165
SurfILE: An Open-Source Python Package for Surface Topography Analysis 164
Software implementation for processing and quantitative analysis of surfaces and profiles from profilometry images 164
3D reconstruction of AFM tip by using known tip characterizers 157
Characterization of aluminum nitride film properties for high signal-to-noise ratio piezoelectric micro-electromechanical system microphones 154
Atomic force microscopy metrology of non-spherical nanoparticles 154
INRiM Technical Report 26/2020 - Indoor and outdoor measurements of particulate matter concentration in air during wintertime performed in INRiM Campus and in the CNR Research Area of Turin by using particle counters 153
Surface slope measurement of steep silicon V-grooves using high NA Linnik interferometry 150
Quantitative 3D determination of dimensional parameters of surfaces by optical profilometer’s images 150
3D reconstruction of AFM tip by using automatic shape recognition in Python environment 144
Early Biological Response to Poly(ε-Caprolactone)/Alumina-Toughened Zirconia Composites Obtained by 3D Printing for Peri-Implant Application 142
AFM metrology of shape controlled TiO2 nanoparticles 142
Traceable Dimensional Metrology of Nanoparticles and Nanostructures 135
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy 133
Design and development of the Moore three axis measuring machine control system 125
Metrological characterization of nanoparticles by mAFM 107
Tip-sample interaction in the AFM characterization of bio-plant nanostructures 95
Tip-sample interactions in the AFM study of rod-shaped nanostructures 88
Traceable Optical Metrology Software for Geometric Conformity Assessment of Complex 3D Parts 86
Electrostatic MEMS generator/actuator of nanoforces traceable to electrical and mechanical quantities 73
Calibration of Atomic Force Microscope soft cantilevers based on μ-LDV: metrological insight on the constitutive experimental parameters of Sader's formulas for flexural and torsional effective spring constant 48
CMM measurement of injection-moulded plastic lenses and steel moulds: strategies for the determination of the reference system 46
Traceable machine vision systems for digital industrial applications: the DI-Vision project 41
Metrology and traceability at the nanoscale using AFM 37
Traceable characterisation of AFM probes: new ways to reconstruct tip shape and calibrate cantilevers 35
Metrological characterisation of Machine Vision Systems for the analysis of surfaces from advanced manufacturing 34
Robust reference data generation and evaluation of data fusion algorithms in dimensional metrology with traceability to the SI metre 29
Traceable Machine Vision Systems To The Si Metre Definition For Advanced Manufacturing 26
Microgeometric measurements of plastic lenses and metallic inserts by optical profilometry 26
AFM tip reconstruction with known tip characterizers, algorithms and applications in nanometrology 12
Totale 7.398
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Categoria #
all - tutte 35.166
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 35.166
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022107 0 9 6 8 13 2 6 9 12 13 10 19
2022/2023264 35 14 13 22 16 25 45 19 27 5 25 18
2023/2024489 43 35 33 35 38 24 60 32 62 33 28 66
2024/20251.200 55 34 83 37 88 92 95 65 213 50 152 236
2025/20264.757 222 224 298 769 453 1.036 479 191 317 417 241 110
2026/2027238 114 124 0 0 0 0 0 0 0 0 0 0
Totale 7.398