PICOTTO, GIANBARTOLO
PICOTTO, GIANBARTOLO
AE Metrologia applicata e ingegneria
3D characterization of printed structures by stylus- and optical-based measurements
2018 Bellotti, Roberto; Maras, Claire; Picotto, Gian Bartolo; Pometto, Marco; Ribotta, Luigi
A capacitive system for micro/nano positioning and attitude controls
2008 Picotto, Gianbartolo; Pisani, Marco; Sosso, Andrea
A function-driven characterization of printed conductors on PV cells
2018 Bellotti, Roberto; Furin, Valentina; Maras, Claire; Picotto, Gianbartolo; Ribotta, Luigi
A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor
2011 Picotto, Gianbartolo
A metrological SPM for dimensional surface measurements
2001 Picotto, Gianbartolo; Pisani, Marco
A multi-electrode plane capacitive sensor for displacement measurements and attitude controls
2009 Picotto, Gianbartolo; Pisani, Marco; Sosso, Andrea
A novel AC current source for capacitance-based displacement measurements
1997 Nerino, R.; Sosso, Andrea; Picotto, Gianbartolo
A precision Z-stage for Scanning Probe Microscopy
2000 Picotto, Gianbartolo; Pisani, Marco
A sample scanning system with nanometric accuracy for quantitative SPM measurements
2001 Picotto, Gianbartolo; Pisani, Marco
A surface profile reconstruction method based on multisensor capacitive transducers
1994 Nerino, R; Cabiati, F; Picotto, Gianbartolo; Sacconi, A.
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support
2016 Jones, Christopher; Santiano, Marco; Downes, Stephen; Bellotti, Roberto; O’Connor, Daniel; Picotto, Gianbartolo
AFM analysis of MgB2 films and nanostructures
2007 Portesi, Chiara; Borini, S.; Picotto, Gianbartolo; Monticone, Eugenio
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016)
2020 Coveney, Tim; Matus, Michael; Wang, Shihua; Byman, Ville; Lassila, Antti; Alqahtani, Nasser; Alqahtani, Faisal; Sumner, Dean; Spiller, Jürg; Meli, Felix; Picotto, Gian Bartolo; Bellotti, Roberto; Sato, Osamu; Sharma, Rina; Moona, Girija; Kumar, Vinod; Rodríguez, Joaquín; Prieto, Emilio; Meral, İlker; Ganioğlu, Okhan; Salgado, José; Wójtowicz, Adam; Skalník, Pavel; Zelený, Vít; Stoup, John; Kotte, Gerard; Koops, Richard; Arizmendi, Edgar; Wang, Weinong; Jakobsson, Agneta; Duta, Alexandru; Dugheanu, Elena; Reain, Greg; Szikszai, Gábor
Calibration of a ball bearing ring segment
2017 Balsamo, Alessandro; Corona, Davide; Piccato, Aline; Picotto, Gianbartolo; Egidi, A.
Calibration of surface roughness standards
2017 Salgado, Null; Duta, Alexandru; Lewis, Andrew; Gunn, Dave; Picotto, Gianbartolo; Borovsky, Jiri; Nanits, Mats-Maidu; Mudronja, Vedran; Castellanos, Carlos Colin; Kornbilt, Fernando; Renegar, Brian; Souza, Marcos Motta de
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements
1994 Desogus, S; Lanyi, S; Nerino, R; Picotto, Gianbartolo
Coherence effects in Frequency-Modulated laser Spectroscopy
1992 Picotto, Gianbartolo; Wataghin, V.
Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC
1983 Bertinetto, F; Cordiale, P; Picotto, Gianbartolo; Chartier, J. M.; Felder, R; Glaser, M. G.
Comparison of the performance of the next generation of optical interferometers
2012 Pisani, Marco; Yacoot, A; Balling, P; Bancone, N; Birlikseven, C; Celik, M; Flueugge, J; Hamid, R; Koechert, P; Kren, P; Kuetgens, U; Lassila, A; Picotto, Gianbartolo; Sahin, E; Seppa, J; Tedaldi, M; Weichert, C.
Comparison on Nanometrology: Nano 2—Step height
2003 L., Koenders; Picotto, Gianbartolo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| 3D characterization of printed structures by stylus- and optical-based measurements / Bellotti, Roberto; Maras, Claire; Picotto, Gian Bartolo; Pometto, Marco; Ribotta, Luigi. - (2018), pp. 493-494. (Intervento presentato al convegno 18th international conference of the european society for precision engineering and nanotechnology tenutosi a Venice, Italy nel Monday 4th to Friday 8th June 2018). | 2018 | Bellotti, RobertoPicotto, Gian BartoloPometto, MarcoRibotta, Luigi + | 3D characterization of printed structures by stylus- and optical-based measurements_euspen 2018 .pdf |
| A capacitive system for micro/nano positioning and attitude controls / Picotto, Gianbartolo; Pisani, Marco; Sosso, Andrea. - (2008). | 2008 | PICOTTO, GIANBARTOLOPISANI, MARCOSOSSO, ANDREA | - |
| A function-driven characterization of printed conductors on PV cells / Bellotti, Roberto; Furin, Valentina; Maras, Claire; Picotto, Gianbartolo; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - 6:2(2018), p. 025002. [10.1088/2051-672x/aabe20] | 2018 | Roberto BellottiGianbartolo PicottoLuigi Ribotta + | Bellotti_2018_Surf._Topogr.__Metrol._Prop._6_025002.pdf; A function-driven characterization of printed conductors on PV cells_submitted manuscript.pdf |
| A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor / Picotto, Gianbartolo. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 22:(2011), pp. 094027-094033. [10.1088/0957-0233/22/9/094027] | 2011 | PICOTTO, GIANBARTOLO | - |
| A metrological SPM for dimensional surface measurements / Picotto, Gianbartolo; Pisani, Marco. - Vol. 1:(2001), pp. 402-405. | 2001 | PICOTTO, GIANBARTOLOPISANI, MARCO | - |
| A multi-electrode plane capacitive sensor for displacement measurements and attitude controls / Picotto, Gianbartolo; Pisani, Marco; Sosso, Andrea. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 20:8(2009), pp. 084011-084014. [10.1088/0957-0233/20/8/084011] | 2009 | PICOTTO, GIANBARTOLOPISANI, MARCOSOSSO, ANDREA | - |
| A novel AC current source for capacitance-based displacement measurements / Nerino, R.; Sosso, Andrea; Picotto, Gianbartolo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 46:2(1997), pp. 640-643. [10.1109/19.572051] | 1997 | SOSSO, ANDREAPICOTTO, GIANBARTOLO + | - |
| A precision Z-stage for Scanning Probe Microscopy / Picotto, Gianbartolo; Pisani, Marco. - PTB-Bericht F-39:(2000), pp. 164-168. | 2000 | PICOTTO, GIANBARTOLOPISANI, MARCO | - |
| A sample scanning system with nanometric accuracy for quantitative SPM measurements / Picotto, Gianbartolo; Pisani, Marco. - In: ULTRAMICROSCOPY. - ISSN 0304-3991. - 1:(2001), pp. 1-12. | 2001 | PICOTTO, GIANBARTOLOPISANI, MARCO | - |
| A surface profile reconstruction method based on multisensor capacitive transducers / Nerino, R; Cabiati, F; Picotto, Gianbartolo; Sacconi, A.. - In: MEASUREMENT. - ISSN 0263-2241. - 13:(1994), pp. 77-84. | 1994 | PICOTTO, GIANBARTOLO + | - |
| A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support / Jones, Christopher; Santiano, Marco; Downes, Stephen; Bellotti, Roberto; O’Connor, Daniel; Picotto, Gianbartolo. - P1.63(2016), pp. 171-172. (Intervento presentato al convegno Euspen’s 16th International Conference & Exhibition tenutosi a Nottingham (UK) nel May 30th – 3rd June 2016). | 2016 | Marco SantianoRoberto BellottiGianbartolo Picotto + | A universal substrate ... Proc. EUSPEN 2016.pdf |
| AFM analysis of MgB2 films and nanostructures / Portesi, Chiara; Borini, S.; Picotto, Gianbartolo; Monticone, Eugenio. - In: SURFACE SCIENCE. - ISSN 0039-6028. - 601:1(2007), pp. 58-62. [10.1016/j.susc.2006.09.004] | 2007 | PORTESI, CHIARAPICOTTO, GIANBARTOLOMONTICONE, EUGENIO + | - |
| Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) / Coveney, Tim; Matus, Michael; Wang, Shihua; Byman, Ville; Lassila, Antti; Alqahtani, Nasser; Alqahtani, Faisal; Sumner, Dean; Spiller, Jürg; Meli, Felix; Picotto, Gian Bartolo; Bellotti, Roberto; Sato, Osamu; Sharma, Rina; Moona, Girija; Kumar, Vinod; Rodríguez, Joaquín; Prieto, Emilio; Meral, İlker; Ganioğlu, Okhan; Salgado, José; Wójtowicz, Adam; Skalník, Pavel; Zelený, Vít; Stoup, John; Kotte, Gerard; Koops, Richard; Arizmendi, Edgar; Wang, Weinong; Jakobsson, Agneta; Duta, Alexandru; Dugheanu, Elena; Reain, Greg; Szikszai, Gábor. - In: METROLOGIA. - ISSN 0026-1394. - 57:1A(2020), pp. 04002-04002. [10.1088/0026-1394/57/1A/04002] | 2020 | Picotto, Gian BartoloBellotti, Roberto + | EURAMET.L-K5-2016.pdf |
| Calibration of a ball bearing ring segment / Balsamo, Alessandro; Corona, Davide; Piccato, Aline; Picotto, Gianbartolo; Egidi, A.. - (2017), pp. 1-9. | 2017 | BALSAMO, ALESSANDROCORONA, DAVIDEPICCATO, ALINEPICOTTO, GIANBARTOLOEgidi, A. | 2017 TR 20 - DriveTrain - Calibration of a ring segment.pdf |
| Calibration of surface roughness standards / Salgado, Null; Duta, Alexandru; Lewis, Andrew; Gunn, Dave; Picotto, Gianbartolo; Borovsky, Jiri; Nanits, Mats-Maidu; Mudronja, Vedran; Castellanos, Carlos Colin; Kornbilt, Fernando; Renegar, Brian; Souza, Marcos Motta de. - In: METROLOGIA. - ISSN 0026-1394. - 54:1A(2017), pp. 04005-04005. [10.1088/0026-1394/54/1A/04005] | 2017 | Picotto, Gianbartolo + | EURAMET.L-K8.PDF |
| Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements / Desogus, S; Lanyi, S; Nerino, R; Picotto, Gianbartolo. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 12:(1994), pp. 1665-1668. | 1994 | PICOTTO, GIANBARTOLO + | - |
| Coherence effects in Frequency-Modulated laser Spectroscopy / Picotto, Gianbartolo; Wataghin, V.. - In: JOURNAL OF PHYSICS. B, ATOMIC MOLECULAR AND OPTICAL PHYSICS. - ISSN 0953-4075. - 25:(1992), pp. 2489-2500. | 1992 | PICOTTO, GIANBARTOLO + | - |
| Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC / Bertinetto, F; Cordiale, P; Picotto, Gianbartolo; Chartier, J. M.; Felder, R; Glaser, M. G.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 32:(1983), pp. 72-76. | 1983 | PICOTTO, GIANBARTOLO + | - |
| Comparison of the performance of the next generation of optical interferometers / Pisani, Marco; Yacoot, A; Balling, P; Bancone, N; Birlikseven, C; Celik, M; Flueugge, J; Hamid, R; Koechert, P; Kren, P; Kuetgens, U; Lassila, A; Picotto, Gianbartolo; Sahin, E; Seppa, J; Tedaldi, M; Weichert, C.. - In: METROLOGIA. - ISSN 0026-1394. - 49:(2012), pp. 455-467. [doi:10.1088/0026-1394/49/4/455] | 2012 | PISANI, MARCOPICOTTO, GIANBARTOLO + | - |
| Comparison on Nanometrology: Nano 2—Step height / L., Koenders; Picotto, Gianbartolo. - In: METROLOGIA. - ISSN 0026-1394. - 40:(2003), p. 04001. | 2003 | PICOTTO, GIANBARTOLO + | - |