Sfoglia per Autore
Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals
1999 Bergamin, A; Cavagnero, G; Mana, Giovanni; Massa, Enrico; Zosi, G.
Imaging of Si-crystal lattice by phase-contrast x-ray microscopy
2000 A., Bergamin; G., Cavagnero; Mana, Giovanni; Massa, Enrico; G., Zosi
Do we know the wavelength of laser beams?
2000 Massa, Enrico
Simulation of the thermoelastic behavior of an LLL x-ray interferometer
2000 Bergamin, A; Cavagnero, G; Mana, Giovanni; Massa, Enrico; Zosi, G.
Measuring small lattice distortions in Si-crystals by phase-contrast x-ray topography
2000 Bergamin, A; Cavagnero, G; Mana, Giovanni; Massa, Enrico; Zosi, G.
A new scanning x-ray interferometer
2000 A., Bergamin; G., Cavagnero; Mana, Giovanni; Massa, Enrico; G., Zosi
Phase contrast imaging using an x-ray interferometer
2001 U., Berzano; Durando, Giovanni; Massa, Enrico
A micro-manipulator for scanning x-ray interferometry
2001 Durando, Giovanni; Massa, Enrico
Future visioni ai raggi X
2001 Massa, Enrico; Mana, Giovanni; Montanari, F.
Accuracy of laser beam center and width calculations
2001 Mana, Giovanni; Massa, Enrico; Rovera, A.
CVD diamond microdosimeters
2001 Manfredotti, C; LO GIUDICE, A; Ricciardi, C; Paolini, C; Massa, Enrico; Fizzotti, F; Vittone, E.
Remeasurement of the (220) lattice spacing of silicon
2002 G., Cavagnero; Durando, Giovanni; Mana, Giovanni; Massa, Enrico; G., Zosi
Retrieval of the phase profile of digitized interferograms
2003 Balsamo, Alessandro; Cavagnero, G; Mana, Giovanni; Massa, Enrico
A two-axis tip-tilt platform for x-ray interferometry
2003 Bergamin, A; Cavagnero, G; Durando, Giovanni; Mana, Giovanni; Massa, Enrico
Nanometrology at IMGC
2004 Bisi, Marco; Massa, Enrico; Pasquini, A; Picotto, G. B.; Pisani, Marco
Present status of the Avogadro constant determination from silicon crystal with natural isotopic composition
2004 K., Fujii; A., Waseda; N., Kuramoto; S., Mizushima; P., Becker; H., Bettin; A., Nicolaus; U., Kuetgens; S. VALKIERS P., Taylor; P., DE BIÈVRE; Mana, Giovanni; Massa, Enrico; R., Matyi
Nanometrologia all'IMGC/CNR
2004 Bisi, Marco; Germak, ALESSANDRO FRANCO LIDIA; Massa, Enrico; G. B., Picotto; Pisani, Marco
Comparison of IMGC and PTB absolute determinations of the Si (220) lattice spacing
2004 P., Beker; U., Kuetgens; Mana, Giovanni; Massa, Enrico
Measurement repetitions of the Si(220)lattice spacing
2004 G., Cavagnero; H., Fujimoto; Mana, Giovanni; Massa, Enrico; K., Nakayama; G., Zosi
Nanometrology at the IMGC
2005 Bisi, Marco; Massa, Enrico; Pasquini, A.; Picotto, Gianbartolo; Pisani, Marco
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals / Bergamin, A., Cavagnero, G., Mana, G., Massa, E., Zosi, G.. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 10:6(1999), pp. 549-553. [10.1088/0957-0233/10/6/321] | 1999 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Imaging of Si-crystal lattice by phase-contrast x-ray microscopy / A., Bergamin; G., Cavagnero; Mana, Giovanni; Massa, Enrico; G., Zosi. - (2000), pp. 107-108. (Intervento presentato al convegno CPEM tenutosi a Sydney Australia nel 2000 14-19 May). | 2000 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Do we know the wavelength of laser beams? / Massa, Enrico. - (2000), pp. 463-464. (Intervento presentato al convegno CPEM tenutosi a -Sydney Australia nel 2000 14-19 May). | 2000 | MASSA, ENRICO | - |
| Simulation of the thermoelastic behavior of an LLL x-ray interferometer / Bergamin, A., Cavagnero, G., Mana, G., Massa, E., Zosi, G.. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 71:4(2000), pp. 1716-1722. [10.1063/1.1150526] | 2000 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Measuring small lattice distortions in Si-crystals by phase-contrast x-ray topography / Bergamin, A., Cavagnero, G., Mana, G., Massa, E., Zosi, G.. - In: JOURNAL OF PHYSICS D. APPLIED PHYSICS. - ISSN 0022-3727. - 33:21(2000), pp. 2678-2682. [10.1088/0022-3727/33/21/302] | 2000 | MANA, GIOVANNIMASSA, ENRICO + | - |
| A new scanning x-ray interferometer / A., B., G., C., Mana, G., Massa, E., G., Z.. - (2000), pp. 109-110. (CPEM Sydney Australia 14-19 May). | 2000 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Phase contrast imaging using an x-ray interferometer / U., Berzano; Durando, Giovanni; Massa, Enrico. - 1:(2001), pp. 574-577. ( Euspen Turin 27 - 31 MAY). | 2001 | DURANDO, GIOVANNIMASSA, ENRICO + | - |
| A micro-manipulator for scanning x-ray interferometry / Durando, G., Massa, E.. - 2:(2001), pp. 426-429. (2nd euspen International Conference Turin 27 - 31 MAY). | 2001 | DURANDO, GIOVANNIMASSA, ENRICO | - |
| Future visioni ai raggi X / Massa, E., Mana, G., Montanari, F.. - In: SAPERE. - ISSN 0036-4681. - (2001). | 2001 | MASSA, ENRICOMANA, GIOVANNI + | - |
| Accuracy of laser beam center and width calculations / Mana, G., Massa, E., Rovera, A.. - In: APPLIED OPTICS. - ISSN 0003-6935. - 40:9(2001), pp. 1378-1385. [10.1364/AO.40.001378] | 2001 | MANA, GIOVANNIMASSA, ENRICO + | - |
| CVD diamond microdosimeters / Manfredotti, C., LO GIUDICE, A., Ricciardi, C., Paolini, C., Massa, E., Fizzotti, F., Vittone, E.. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - 458:(2001), pp. 360-364. | 2001 | MASSA, ENRICO + | - |
| Remeasurement of the (220) lattice spacing of silicon / G., C., Durando, G., Mana, G., Massa, E., G., Z.. - (2002), pp. 562-563. (CPEM Ottawa, Ontario Canada 16-21 June 2002). | 2002 | DURANDO, GIOVANNIMANA, GIOVANNIMASSA, ENRICO + | - |
| Retrieval of the phase profile of digitized interferograms / Balsamo, A., Cavagnero, G., Mana, G., Massa, E.. - In: JOURNAL OF OPTICS. A, PURE AND APPLIED OPTICS. - ISSN 1464-4258. - 5:4(2003), pp. 418-424. [10.1088/1464-4258/5/4/318] | 2003 | BALSAMO, ALESSANDROMANA, GIOVANNIMASSA, ENRICO + | - |
| A two-axis tip-tilt platform for x-ray interferometry / Bergamin, A., Cavagnero, G., Durando, G., Mana, G., Massa, E.. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 14:6(2003), pp. 717-723. [10.1088/0957-0233/14/6/303] | 2003 | DURANDO, GIOVANNIMANA, GIOVANNIMASSA, ENRICO + | - |
| Nanometrology at IMGC / Bisi, M., Massa, E., Pasquini, A., Picotto, G.B., Pisani, M.. - (2004), pp. 0-0. (nanoscale 2004 Braunschweig, Germany March 25-26, 2004). | 2004 | BISI, MARCOMASSA, ENRICOPISANI, MARCO + | - |
| Present status of the Avogadro constant determination from silicon crystal with natural isotopic composition / K., F., A., W., N., K., S., M., P., B., H., B., A., N., U., K., S. VALKIERS P., T., P., D.B., Mana, G., Massa, E., R., M.. - (2004), pp. 143-144. (CPEM London 27th June 2nd July). | 2004 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Nanometrologia all'IMGC/CNR / Bisi, M., Germak, A.F.L., Massa, E., G. B., P., Pisani, M.. - In: NANOTEC IT NEWSLETTER. - 1:(2004), pp. 7-10. | 2004 | BISI, MARCOGERMAK, ALESSANDRO FRANCO LIDIAMASSA, ENRICOPISANI, MARCO + | - |
| Comparison of IMGC and PTB absolute determinations of the Si (220) lattice spacing / P., B., U., K., Mana, G., Massa, E.. - (2004), pp. 441-442. (CPEM London 27th June 2nd July). | 2004 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Measurement repetitions of the Si(220)lattice spacing / G., C., H., F., Mana, G., Massa, E., K., N., G., Z.. - In: METROLOGIA. - ISSN 0026-1394. - 41:(2004), pp. 56-64. | 2004 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Nanometrology at the IMGC / Bisi, M., Massa, E., Pasquini, A., Picotto, G., Pisani, M.. - (2005), pp. 22-37. [10.1002/3527606661.ch2] | 2005 | BISI, MARCOMASSA, ENRICOPICOTTO, GIANBARTOLOPISANI, MARCO + | - |
Legenda icone
- file ad accesso aperto
- file disponibili sulla rete interna
- file disponibili agli utenti autorizzati
- file disponibili solo agli amministratori
- file sotto embargo
- nessun file disponibile