X-ray phase-contrast topography has been improved by using phase modulation and computing techniques to determine lattice distortions inside near-perfect Si monocrystals. The technique presented is based on the detection of the spatially varying phase shift at the output of a monolithic x-ray interferometer of the triple Laue type using phase modulation and a multi-element detector. Information was obtained about the degree of perfection of crystals being used in the determination of the (220) lattice plane spacing of silicon and of the Avogadro constant.

Measuring small lattice distortions in Si-crystals by phase-contrast x-ray topography / Bergamin, A; Cavagnero, G; Mana, Giovanni; Massa, Enrico; Zosi, G.. - In: JOURNAL OF PHYSICS D. APPLIED PHYSICS. - ISSN 0022-3727. - 33:21(2000), pp. 2678-2682. [10.1088/0022-3727/33/21/302]

Measuring small lattice distortions in Si-crystals by phase-contrast x-ray topography

MANA, GIOVANNI;MASSA, ENRICO;
2000

Abstract

X-ray phase-contrast topography has been improved by using phase modulation and computing techniques to determine lattice distortions inside near-perfect Si monocrystals. The technique presented is based on the detection of the spatially varying phase shift at the output of a monolithic x-ray interferometer of the triple Laue type using phase modulation and a multi-element detector. Information was obtained about the degree of perfection of crystals being used in the determination of the (220) lattice plane spacing of silicon and of the Avogadro constant.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11696/33491
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 8
  • ???jsp.display-item.citation.isi??? 9
social impact