Sfoglia per Autore
Present State of the Avogadro Constant Determination From Silicon Crystals With Natural Isotopic Compositions
2005 K., Fujii; A., Waseda; N., Kuramoto; S., Mizushima; P., Becker; H., Bettin; A., Nicolaus; U., Kuetgens; S., Valkiers; P., Taylor; P., DE BIÈVRE; Mana, Giovanni; Massa, Enrico; R., Matyi; E. G., Kessler; M., Hanke
Nanometrology at the IMGC
2005 Bisi, Marco; Massa, Enrico; Pasquini, A.; Picotto, Gianbartolo; Pisani, Marco
PRECISION MEASUREMENT OF THE MOLAR PLANCK'S CONSTANT
2006 M., Jentschel; J., Krempel; P., Mutti; Mana, Giovanni; Massa, Enrico; P., Becker
CONFIRMATION OF THE IMGC AND PTB DETERMINATIONS OF THE SILICON LATTICE SPACING
2006 G., Cavagnero; Mana, Giovanni; Massa, Enrico; P., Becker; U., Kuetgens
NEW DEVELOPMENTS TOWARDS CENTIMETER X-RAY INTERFEROMETRY
2006 A., Bergamin; G., Cavagnero; L., Ferroglio; Mana, Giovanni; Massa, Enrico; G., Zosi
Aberration effects in two-beam laser interferometers
2006 Cavagnero, Giovanni; Mana, Giovanni; Massa, Enrico
On the effect of broadband emission in external-cavity diode-laser interferometry
2007 Galzerano, G; Mana, Giovanni; Massa, Enrico
Confirmation of the INRiM and PTB determinations of the Si lattice parameter
2007 Becker, P; Cavagnero, G; Kuetgens, U; Mana, Giovanni; Massa, Enrico
Status of the international effort on the x-ray crystal density work and its progress towards a measurement of the Avogadro constant
2008 K., Fujii; A., Waseda; N., Kuramoto; P., Becker; A., Nicolaus; M., Krumrey; H. U., Danzebrink; I., Busch; H., Bettin; Mana, Giovanni; Massa, Enrico; S., Valkiers; W., Giardini; E., Kessler; S., Downes; A., Picard; H., Riemann
Silicon lattice-parameter measurements with centimeter x-ray interferometry
2008 L., Ferroglio; Mana, Giovanni; Massa, Enrico
Novel transfer standard for temperature measurements of the international Avogadro project
2008 H., Bettin; A., Nicolaus; S., Rudtsch; Massa, Enrico; Merlone, Andrea
Si lattice parameter measurement by centimeter X-ray interferometry
2008 Ferroglio, L; Mana, Giovanni; Massa, Enrico
Comparison of the INRIM and PTB lattice-spacing standards
2009 Massa, Enrico; Mana, Giovanni; Kuetgens, U.
Observation of a bent crystal-lattice by x-ray interferometry
2009 Massa, Enrico; Mana, Giovanni; Ferroglio, L.
Measurement of the lattice parameter of a silicon crystal
2009 Massa, Enrico; Mana, Giovanni; U., Kuetgens; L., Ferroglio
STATUS OF THE NA DETERMINATION BY COUNTING ATOMS IN SILICON CRYSTALS
2010 Becker, P; Bettin, H; Borys, M; Busch, I; Fujii, K; Gray, M; Krumrey, M; Kuetgens, U; Mana, Giovanni; Manson, P; Massa, Enrico; Nicolaus, A; Picard, A; Schiel, D; Valkiers, S.
Uncertainty assessment of Si molar mass measurements
2010 Mana, Giovanni; Massa, Enrico; S., Valkiers; G. D., Willenberg
Calibration of a silicon crystal for absolute nuclear spectroscopy
2010 Massa, Enrico; Mana, Giovanni; Kuetgens, U; Ferroglio, L.
ADVANCES IN THE MEASUREMENT OF THE 28Si LATTICE PARAMETER
2010 Massa, Enrico; Mana, Giovanni; Kessler, E. G.
Measurement of the {2 2 0} lattice-plane spacing of a 28Si x-ray interferometer
2011 Massa, Enrico; Mana, Giovanni; U., Kuetgens; L., Ferroglio
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Present State of the Avogadro Constant Determination From Silicon Crystals With Natural Isotopic Compositions / K., Fujii; A., Waseda; N., Kuramoto; S., Mizushima; P., Becker; H., Bettin; A., Nicolaus; U., Kuetgens; S., Valkiers; P., Taylor; P., DE BIÈVRE; Mana, Giovanni; Massa, Enrico; R., Matyi; E. G., Kessler; M., Hanke. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 54:(2005), pp. 854-859. | 2005 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Nanometrology at the IMGC / Bisi, Marco; Massa, Enrico; Pasquini, A.; Picotto, Gianbartolo; Pisani, Marco. - (2005), pp. 22-37. [10.1002/3527606661.ch2] | 2005 | BISI, MARCOMASSA, ENRICOPICOTTO, GIANBARTOLOPISANI, MARCO + | - |
| PRECISION MEASUREMENT OF THE MOLAR PLANCK'S CONSTANT / M., Jentschel; J., Krempel; P., Mutti; Mana, Giovanni; Massa, Enrico; P., Becker. - (2006), pp. 90-91. (Intervento presentato al convegno CPEM tenutosi a Turin, Italy nel 10-14 July). | 2006 | MANA, GIOVANNIMASSA, ENRICO + | - |
| CONFIRMATION OF THE IMGC AND PTB DETERMINATIONS OF THE SILICON LATTICE SPACING / G., Cavagnero; Mana, Giovanni; Massa, Enrico; P., Becker; U., Kuetgens. - (2006), pp. 66-67. (Intervento presentato al convegno CPEM tenutosi a Turin nel 10-14 July). | 2006 | MANA, GIOVANNIMASSA, ENRICO + | - |
| NEW DEVELOPMENTS TOWARDS CENTIMETER X-RAY INTERFEROMETRY / A., Bergamin; G., Cavagnero; L., Ferroglio; Mana, Giovanni; Massa, Enrico; G., Zosi. - (2006), pp. 122-123. (Intervento presentato al convegno CPEM tenutosi a Turin, Italy nel 9-14 July). | 2006 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Aberration effects in two-beam laser interferometers / Cavagnero, Giovanni; Mana, Giovanni; Massa, Enrico. - In: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA. A, OPTICS, IMAGE SCIENCE, AND VISION. - ISSN 1084-7529. - 23:8(2006), pp. 1951-1959. [10.1364/JOSAA.23.001951] | 2006 | MANA, GIOVANNIMASSA, ENRICO + | - |
| On the effect of broadband emission in external-cavity diode-laser interferometry / Galzerano, G; Mana, Giovanni; Massa, Enrico. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 18:(2007), pp. 1338-1342. | 2007 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Confirmation of the INRiM and PTB determinations of the Si lattice parameter / Becker, P; Cavagnero, G; Kuetgens, U; Mana, Giovanni; Massa, Enrico. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 56:(2007), pp. 230-234. | 2007 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Status of the international effort on the x-ray crystal density work and its progress towards a measurement of the Avogadro constant / K., Fujii; A., Waseda; N., Kuramoto; P., Becker; A., Nicolaus; M., Krumrey; H. U., Danzebrink; I., Busch; H., Bettin; Mana, Giovanni; Massa, Enrico; S., Valkiers; W., Giardini; E., Kessler; S., Downes; A., Picard; H., Riemann. - (2008), pp. 300-301. (Intervento presentato al convegno CPEM tenutosi a Broomfield (USA) nel 8-13 June 2008). | 2008 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Silicon lattice-parameter measurements with centimeter x-ray interferometry / L., Ferroglio; Mana, Giovanni; Massa, Enrico. - (2008), pp. 410-411. (Intervento presentato al convegno CPEM tenutosi a Broomfield (USA) nel 8-13 June 2008). | 2008 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Novel transfer standard for temperature measurements of the international Avogadro project / H., Bettin; A., Nicolaus; S., Rudtsch; Massa, Enrico; Merlone, Andrea. - cd-rom:(2008), pp. .-.. (Intervento presentato al convegno Conference on Precision Electromagnetic Measurements tenutosi a Broomfield, Colorado (USA) nel 8-13 June 2008). | 2008 | MASSA, ENRICOMERLONE, ANDREA + | - |
| Si lattice parameter measurement by centimeter X-ray interferometry / Ferroglio, L; Mana, Giovanni; Massa, Enrico. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 21:(2008), pp. 16877-16888. | 2008 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Comparison of the INRIM and PTB lattice-spacing standards / Massa, Enrico; Mana, Giovanni; Kuetgens, U.. - In: METROLOGIA. - ISSN 0026-1394. - 46:(2009), pp. 249-253. | 2009 | MASSA, ENRICOMANA, GIOVANNI + | - |
| Observation of a bent crystal-lattice by x-ray interferometry / Massa, Enrico; Mana, Giovanni; Ferroglio, L.. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 17:(2009), pp. 11172-11178. | 2009 | MASSA, ENRICOMANA, GIOVANNI + | - |
| Measurement of the lattice parameter of a silicon crystal / Massa, Enrico; Mana, Giovanni; U., Kuetgens; L., Ferroglio. - In: NEW JOURNAL OF PHYSICS. - ISSN 1367-2630. - 11:(2009), pp. 053013-053013. | 2009 | MASSA, ENRICOMANA, GIOVANNI + | - |
| STATUS OF THE NA DETERMINATION BY COUNTING ATOMS IN SILICON CRYSTALS / Becker, P; Bettin, H; Borys, M; Busch, I; Fujii, K; Gray, M; Krumrey, M; Kuetgens, U; Mana, Giovanni; Manson, P; Massa, Enrico; Nicolaus, A; Picard, A; Schiel, D; Valkiers, S.. - (2010), pp. 107-108. (Intervento presentato al convegno CPEM 2010 tenutosi a Daejeon, Korea nel June 13-18, 2010). | 2010 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Uncertainty assessment of Si molar mass measurements / Mana, Giovanni; Massa, Enrico; S., Valkiers; G. D., Willenberg. - In: INTERNATIONAL JOURNAL OF MASS SPECTROMETRY. - ISSN 1387-3806. - 289:(2010), pp. 6-10. | 2010 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Calibration of a silicon crystal for absolute nuclear spectroscopy / Massa, Enrico; Mana, Giovanni; Kuetgens, U; Ferroglio, L.. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 0021-8898. - 43:(2010), pp. 293-296. | 2010 | MASSA, ENRICOMANA, GIOVANNI + | - |
| ADVANCES IN THE MEASUREMENT OF THE 28Si LATTICE PARAMETER / Massa, Enrico; Mana, Giovanni; Kessler, E. G.. - (2010), pp. 133-134. (Intervento presentato al convegno CPEM 2010 tenutosi a Daejeon, Korea nel June 13-18, 2010). | 2010 | MASSA, ENRICOMANA, GIOVANNI + | - |
| Measurement of the {2 2 0} lattice-plane spacing of a 28Si x-ray interferometer / Massa, Enrico; Mana, Giovanni; U., Kuetgens; L., Ferroglio. - In: METROLOGIA. - ISSN 0026-1394. - 48:(2011), pp. s37-s43. [10.1088/0026-1394/48/2/S06] | 2011 | MASSA, ENRICOMANA, GIOVANNI + | - |
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