Sfoglia per Autore
Measuring small lattice distortions in Si-crystals by phase-contrast x-ray topography
2000 Bergamin, A; Cavagnero, G; Mana, Giovanni; Massa, Enrico; Zosi, G.
Light bounces in two-beam scanning laser interferometers
2000 Fujimoto, H; Mana, Giovanni; Nakayama, K.
Combined optical and X-ray interferometry for high-precision dimensional metrology
2000 Basile, G; Becker, P; Bergamin, A; Cavagnero, G; Franks, A; Jackson, K; Kuetgens, U; Mana, Giovanni; Palmer, Ew; Robbie, Cj; Stedman, M; Stumpel, J; Yacoot, A; Zosi, G.
Simulation of the thermoelastic behavior of an LLL x-ray interferometer
2000 Bergamin, A; Cavagnero, G; Mana, Giovanni; Massa, Enrico; Zosi, G.
A new scanning x-ray interferometer
2000 A., Bergamin; G., Cavagnero; Mana, Giovanni; Massa, Enrico; G., Zosi
Future visioni ai raggi X
2001 Massa, Enrico; Mana, Giovanni; Montanari, F.
Location accuracy limitations for CCD cameras
2001 Gai, M; Carollo, D; Delbo, M; Lattanzi, Mg; Massone, G; Bertinetto, F; Mana, Giovanni; Cesare, S.
Accuracy of laser beam center and width calculations
2001 Mana, Giovanni; Massa, Enrico; Rovera, A.
Remeasurement of the (220) lattice spacing of silicon
2002 G., Cavagnero; Durando, Giovanni; Mana, Giovanni; Massa, Enrico; G., Zosi
Convective forces in high precision mass measurements
2002 Mana, Giovanni; Palmisano, C; Perosino, A; Pettorruso, S; Peuto, A; Zosi, G.
Propagation of error analysis in a total least squares estimator in absolute gravimetry
2002 Durando, Giovanni; Mana, Giovanni
Propagation of error analysis in least-squares procedures with second-order autoregressive measurement errors
2002 Durando, Giovanni; Mana, Giovanni
Retrieval of the phase profile of digitized interferograms, J. Opt. A: Pure Appl. Opt. 5:418–424
2003 Balsamo, Alessandro; G., Cavagnero; Mana, Giovanni; E., Massa
Caratterizzazione delle tavole vibranti IMGC
2003 Mana, Giovanni; Mari, DOMENICO GIANLUCA; Mazzoleni, Fabrizio
Key Comparison EUROMET.AUV.V-K1. Comparison of accelerometer calibration
2003 Mana, Giovanni; Mari, DOMENICO GIANLUCA; Mazzoleni, Fabrizio
A two-axis tip-tilt platform for x-ray interferometry
2003 Bergamin, A; Cavagnero, G; Durando, Giovanni; Mana, Giovanni; Massa, Enrico
Retrieval of the phase profile of digitized interferograms
2003 Balsamo, Alessandro; Cavagnero, G; Mana, Giovanni; Massa, Enrico
Accuracy assessment of data analysis in absolute gravimetry
2003 Durando, Giovanni; Mana, Giovanni; Mazzoleni, F.
Present status of the Avogadro constant determination from silicon crystal with natural isotopic composition
2004 K., Fujii; A., Waseda; N., Kuramoto; S., Mizushima; P., Becker; H., Bettin; A., Nicolaus; U., Kuetgens; S. VALKIERS P., Taylor; P., DE BIÈVRE; Mana, Giovanni; Massa, Enrico; R., Matyi
Comparison of IMGC and PTB absolute determinations of the Si (220) lattice spacing
2004 P., Beker; U., Kuetgens; Mana, Giovanni; Massa, Enrico
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Measuring small lattice distortions in Si-crystals by phase-contrast x-ray topography / Bergamin, A; Cavagnero, G; Mana, Giovanni; Massa, Enrico; Zosi, G.. - In: JOURNAL OF PHYSICS D. APPLIED PHYSICS. - ISSN 0022-3727. - 33:21(2000), pp. 2678-2682. [10.1088/0022-3727/33/21/302] | 2000 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Light bounces in two-beam scanning laser interferometers / Fujimoto, H; Mana, Giovanni; Nakayama, K.. - In: JAPANESE JOURNAL OF APPLIED PHYSICS. PART 2, LETTERS. - ISSN 0021-4922. - 39:5A(2000), pp. 2870-2875. [10.1143/JJAP.39.2870] | 2000 | MANA, GIOVANNI + | - |
| Combined optical and X-ray interferometry for high-precision dimensional metrology / Basile, G; Becker, P; Bergamin, A; Cavagnero, G; Franks, A; Jackson, K; Kuetgens, U; Mana, Giovanni; Palmer, Ew; Robbie, Cj; Stedman, M; Stumpel, J; Yacoot, A; Zosi, G.. - In: PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON. SERIES A. - ISSN 1364-5021. - 456:1995(2000), pp. 701-729. [10.1098/rspa.2000.0536] | 2000 | MANA, GIOVANNI + | - |
| Simulation of the thermoelastic behavior of an LLL x-ray interferometer / Bergamin, A; Cavagnero, G; Mana, Giovanni; Massa, Enrico; Zosi, G.. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 71:4(2000), pp. 1716-1722. [10.1063/1.1150526] | 2000 | MANA, GIOVANNIMASSA, ENRICO + | - |
| A new scanning x-ray interferometer / A., Bergamin; G., Cavagnero; Mana, Giovanni; Massa, Enrico; G., Zosi. - (2000), pp. 109-110. (Intervento presentato al convegno CPEM tenutosi a Sydney Australia nel 14-19 May). | 2000 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Future visioni ai raggi X / Massa, Enrico; Mana, Giovanni; Montanari, F.. - In: SAPERE. - ISSN 0036-4681. - (2001). | 2001 | MASSA, ENRICOMANA, GIOVANNI + | - |
| Location accuracy limitations for CCD cameras / Gai, M; Carollo, D; Delbo, M; Lattanzi, Mg; Massone, G; Bertinetto, F; Mana, Giovanni; Cesare, S.. - In: ASTRONOMY & ASTROPHYSICS. - ISSN 0004-6361. - 367:1(2001), pp. 362-370. | 2001 | MANA, GIOVANNI + | - |
| Accuracy of laser beam center and width calculations / Mana, Giovanni; Massa, Enrico; Rovera, A.. - In: APPLIED OPTICS. - ISSN 0003-6935. - 40:9(2001), pp. 1378-1385. [10.1364/AO.40.001378] | 2001 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Remeasurement of the (220) lattice spacing of silicon / G., Cavagnero; Durando, Giovanni; Mana, Giovanni; Massa, Enrico; G., Zosi. - (2002), pp. 562-563. (Intervento presentato al convegno CPEM tenutosi a Ottawa, Ontario Canada nel 16-21 June 2002). | 2002 | DURANDO, GIOVANNIMANA, GIOVANNIMASSA, ENRICO + | - |
| Convective forces in high precision mass measurements / Mana, Giovanni; Palmisano, C; Perosino, A; Pettorruso, S; Peuto, A; Zosi, G.. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 13:1(2002), pp. 13-20. [10.1088/0957-0233/13/1/302] | 2002 | MANA, GIOVANNI + | - |
| Propagation of error analysis in a total least squares estimator in absolute gravimetry / Durando, Giovanni; Mana, Giovanni. - In: METROLOGIA. - ISSN 0026-1394. - 39:5(2002), pp. 489-494. [10.1088/0026-1394/39/5/10] | 2002 | DURANDO, GIOVANNIMANA, GIOVANNI | - |
| Propagation of error analysis in least-squares procedures with second-order autoregressive measurement errors / Durando, Giovanni; Mana, Giovanni. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 13:10(2002), pp. 1505-1511. [10.1088/0957-0233/13/10/301] | 2002 | DURANDO, GIOVANNIMANA, GIOVANNI | - |
| Retrieval of the phase profile of digitized interferograms, J. Opt. A: Pure Appl. Opt. 5:418–424 / Balsamo, Alessandro; G., Cavagnero; Mana, Giovanni; E., Massa. - In: JOURNAL OF OPTICS RESEARCH. - ISSN 1050-3315. - 5:(2003), pp. 418-424. | 2003 | BALSAMO, ALESSANDROMANA, GIOVANNI + | - |
| Caratterizzazione delle tavole vibranti IMGC / Mana, Giovanni; Mari, DOMENICO GIANLUCA; Mazzoleni, Fabrizio. - (2003). | 2003 | MANA, GIOVANNIMARI, DOMENICO GIANLUCAMAZZOLENI, FABRIZIO | - |
| Key Comparison EUROMET.AUV.V-K1. Comparison of accelerometer calibration / Mana, Giovanni; Mari, DOMENICO GIANLUCA; Mazzoleni, Fabrizio. - (2003). | 2003 | MANA, GIOVANNIMARI, DOMENICO GIANLUCAMAZZOLENI, FABRIZIO | - |
| A two-axis tip-tilt platform for x-ray interferometry / Bergamin, A; Cavagnero, G; Durando, Giovanni; Mana, Giovanni; Massa, Enrico. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 14:6(2003), pp. 717-723. [10.1088/0957-0233/14/6/303] | 2003 | DURANDO, GIOVANNIMANA, GIOVANNIMASSA, ENRICO + | - |
| Retrieval of the phase profile of digitized interferograms / Balsamo, Alessandro; Cavagnero, G; Mana, Giovanni; Massa, Enrico. - In: JOURNAL OF OPTICS. A, PURE AND APPLIED OPTICS. - ISSN 1464-4258. - 5:4(2003), pp. 418-424. [10.1088/1464-4258/5/4/318] | 2003 | BALSAMO, ALESSANDROMANA, GIOVANNIMASSA, ENRICO + | - |
| Accuracy assessment of data analysis in absolute gravimetry / Durando, Giovanni; Mana, Giovanni; Mazzoleni, F.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 52:2(2003), pp. 500-503. [10.1109/TIM.2003.810044] | 2003 | DURANDO, GIOVANNIMANA, GIOVANNI + | - |
| Present status of the Avogadro constant determination from silicon crystal with natural isotopic composition / K., Fujii; A., Waseda; N., Kuramoto; S., Mizushima; P., Becker; H., Bettin; A., Nicolaus; U., Kuetgens; S. VALKIERS P., Taylor; P., DE BIÈVRE; Mana, Giovanni; Massa, Enrico; R., Matyi. - (2004), pp. 143-144. (Intervento presentato al convegno CPEM tenutosi a London nel 27th June 2nd July). | 2004 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Comparison of IMGC and PTB absolute determinations of the Si (220) lattice spacing / P., Beker; U., Kuetgens; Mana, Giovanni; Massa, Enrico. - (2004), pp. 441-442. (Intervento presentato al convegno CPEM tenutosi a London nel 27th June 2nd July). | 2004 | MANA, GIOVANNIMASSA, ENRICO + | - |
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