Metrological Assessment and Simulation of Charge Injection Phenomena in CMOS Electronic Switches / Trinchera, Bruno; Durandetto, Paolo; Iuzzolino, Ricardo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 1557-9662. - 74:(2025), p. 1508811. [10.1109/TIM.2025.3637972]
Metrological Assessment and Simulation of Charge Injection Phenomena in CMOS Electronic Switches
Bruno Trinchera
Project Administration
;Paolo DurandettoMembro del Collaboration Group
;
2025
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