A new tape of nonhysteretic Josephson junction suitable for applications in voltage metrology has been developed. These junctions derive from the Nb/Al - AlOx/Nb SIS junctions using a relatively thick Al layer oxidized at a low value of oxygen exposure. This produces junctions with reproducible and spatially homogeneous I-V characteristics, having current densities ranging from 10(3) to more than 2 x 10(4) A/cm(2) and characteristic voltages up to 0.40 mV. The authors report here the rf response of these junctions at 70 GHz. The authors have measured the dependence of the rf-induced steps on the microwave power and the stability of the steps, in view of a future application of these junctions to an ac Josephson voltage standard.
Rf properties of Overdamped Sis junctions / Lacquaniti, Vincenzo; C., Cagliero; S., Maggi; R., Steni; D., Andreone; Sosso, Andrea. - In: IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY. - ISSN 1051-8223. - 15:2(2005), pp. 114-116. [10.1109/TASC.2005.849707]
Rf properties of Overdamped Sis junctions
LACQUANITI, VINCENZO;SOSSO, ANDREA
2005
Abstract
A new tape of nonhysteretic Josephson junction suitable for applications in voltage metrology has been developed. These junctions derive from the Nb/Al - AlOx/Nb SIS junctions using a relatively thick Al layer oxidized at a low value of oxygen exposure. This produces junctions with reproducible and spatially homogeneous I-V characteristics, having current densities ranging from 10(3) to more than 2 x 10(4) A/cm(2) and characteristic voltages up to 0.40 mV. The authors report here the rf response of these junctions at 70 GHz. The authors have measured the dependence of the rf-induced steps on the microwave power and the stability of the steps, in view of a future application of these junctions to an ac Josephson voltage standard.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
