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A Possible Solution for the Discrepancy Between the INRIM and NMIJ Values of the Si Lattice-Parameter
2007 H., Fujimoto; Mana, Giovanni; K., Nakayama
A two-axis tip-tilt platform for x-ray interferometry
2003 Bergamin, A; Cavagnero, G; Durando, Giovanni; Mana, Giovanni; Massa, Enrico
Aberration effects in two-beam laser interferometers
2006 Cavagnero, Giovanni; Mana, Giovanni; Massa, Enrico
ACCURACY ASSESSMENT OF A LEAST-SQUARES ESTIMATOR FOR SCANNING-X-RAY INTERFEROMETRY
1991 Bergamin, A; Cavagnero, G; Mana, Giovanni
Accuracy assessment of data analysis in absolute gravimetry
2003 Durando, Giovanni; Mana, Giovanni; Mazzoleni, F.
Accuracy of laser beam center and width calculations
2001 Mana, Giovanni; Massa, Enrico; Rovera, A.
Accurate measurements of the Avogadro and Planck constants by counting silicon atoms
2013 Bettin, H; Fujii, K; Man, J; Mana, Giovanni; Massa, Enrico; Picard, A.
An automated resistor network to inspect the linearity of resistance-thermometry measurements
2013 Massa, Enrico; Mana, Giovanni
Avogadro constant measurements using enriched 28Si monocrystals
2018 Fujii, K; Massa, E; Bettin, H; Kuramoto, N; Mana, G
Bayesian estimate of the degree of a polynomial given a noisy data sample
2014 Mana, Giovanni; GIULIANO ALBO, PAOLO ALBERTO; Lago, Simona
Citazione | Data di pubblicazione | Autori | File |
---|---|---|---|
A Possible Solution for the Discrepancy Between the INRIM and NMIJ Values of the Si Lattice-Parameter / H., Fujimoto; Mana, Giovanni; K., Nakayama. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 56:(2007), pp. 351-355. | 2007 | MANA, GIOVANNI + | - |
A two-axis tip-tilt platform for x-ray interferometry / Bergamin, A; Cavagnero, G; Durando, Giovanni; Mana, Giovanni; Massa, Enrico. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 14:6(2003), pp. 717-723. [10.1088/0957-0233/14/6/303] | 2003 | DURANDO, GIOVANNIMANA, GIOVANNIMASSA, ENRICO + | - |
Aberration effects in two-beam laser interferometers / Cavagnero, Giovanni; Mana, Giovanni; Massa, Enrico. - In: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA. A, OPTICS, IMAGE SCIENCE, AND VISION. - ISSN 1084-7529. - 23:8(2006), pp. 1951-1959. [10.1364/JOSAA.23.001951] | 2006 | MANA, GIOVANNIMASSA, ENRICO + | - |
ACCURACY ASSESSMENT OF A LEAST-SQUARES ESTIMATOR FOR SCANNING-X-RAY INTERFEROMETRY / Bergamin, A; Cavagnero, G; Mana, Giovanni. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 2:8(1991), pp. 725-734. [10.1088/0957-0233/2/8/004] | 1991 | MANA, GIOVANNI + | - |
Accuracy assessment of data analysis in absolute gravimetry / Durando, Giovanni; Mana, Giovanni; Mazzoleni, F.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 52:2(2003), pp. 500-503. [10.1109/TIM.2003.810044] | 2003 | DURANDO, GIOVANNIMANA, GIOVANNI + | - |
Accuracy of laser beam center and width calculations / Mana, Giovanni; Massa, Enrico; Rovera, A.. - In: APPLIED OPTICS. - ISSN 0003-6935. - 40:9(2001), pp. 1378-1385. [10.1364/AO.40.001378] | 2001 | MANA, GIOVANNIMASSA, ENRICO + | - |
Accurate measurements of the Avogadro and Planck constants by counting silicon atoms / Bettin, H; Fujii, K; Man, J; Mana, Giovanni; Massa, Enrico; Picard, A.. - In: ANNALEN DER PHYSIK. - ISSN 0003-3804. - 525:8-9(2013), pp. 680-687. [10.1002/andp.201300038] | 2013 | MANA, GIOVANNIMASSA, ENRICO + | - |
An automated resistor network to inspect the linearity of resistance-thermometry measurements / Massa, Enrico; Mana, Giovanni. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 24:10(2013). [10.1088/0957-0233/24/10/107001] | 2013 | MASSA, ENRICOMANA, GIOVANNI | - |
Avogadro constant measurements using enriched 28Si monocrystals / Fujii, K; Massa, E; Bettin, H; Kuramoto, N; Mana, G. - In: METROLOGIA. - ISSN 0026-1394. - 55:1(2018), pp. L1-L4. [10.1088/1681-7575/aa9abd] | 2018 | Massa, EMana, G + | Fujii_2018_Metrologia_55_L1.pdf |
Bayesian estimate of the degree of a polynomial given a noisy data sample / Mana, Giovanni; GIULIANO ALBO, PAOLO ALBERTO; Lago, Simona. - In: MEASUREMENT. - ISSN 0263-2241. - 55:(2014), pp. 564-570. [10.1016/j.measurement.2014.05.037] | 2014 | MANA, GIOVANNIGIULIANO ALBO, PAOLO ALBERTOLAGO, SIMONA | - |
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Opzioni
Scopri
Tipologia
- 1 Contributo su Rivista 147
- 1 Contributo su Rivista::1.1 Arti... 147
Data di pubblicazione
- 2020 - 2024 14
- 2010 - 2019 61
- 2000 - 2009 40
- 1990 - 1999 27
- 1986 - 1989 5
Editore
- IOP 10
- Optical Society of America 5
- American Chemical Society 3
- INT UNION CRYSTALLOGRAPHY 3
- IOP PUBLISHING LTD 3
- Wiley 3
- American Chemical Society (ACS) 2
- Elsevier 2
- AIP 1
- American Institute of Physics 1
Rivista
- METROLOGIA 54
- IEEE TRANSACTIONS ON INSTRUMENTAT... 10
- MEASUREMENT SCIENCE & TECHNOLOGY 10
- JOURNAL OF APPLIED CRYSTALLOGRAPHY 6
- OPTICS EXPRESS 6
- REVIEW OF SCIENTIFIC INSTRUMENTS 6
- ANALYTICAL CHEMISTRY 5
- JOURNAL OF APPLIED CRYSTALLOGRAPHY 4
- ACTA CRYSTALLOGRAPHICA. SECTION A... 3
- CLASSICAL AND QUANTUM GRAVITY 3
Keyword
- Avogadro constant 10
- metrology 5
- diffraction 4
- data analysis 3
- dynamical theory of X-ray diffrac... 3
- kilogram 3
- optical interferometry 3
- silicon 3
- X-ray interferometry 3
- bent crystals 2
Lingua
- eng 92
- ita 2
Accesso al fulltext
- no fulltext 101
- open 25
- partially open 17
- reserved 4