The voltage and current offsets of two typical precision operational amplifiers (OPAs) with BJT and FET input, respectively, were continuously measured for two years. The paper presents the experiment, explains the method of data analysis, and discusses the results. The long-term stability turns out to be limited mainly by random walk processes.
Long-Term Behavior of Operational Amplifiers / Rubiola, Enrico; Francese, Claudio; de Marchi, Andrea. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 50:1(2001), pp. 89-94. [10.1109/19.903883]
Long-Term Behavior of Operational Amplifiers
Enrico Rubiola
;Claudio Francese;
2001
Abstract
The voltage and current offsets of two typical precision operational amplifiers (OPAs) with BJT and FET input, respectively, were continuously measured for two years. The paper presents the experiment, explains the method of data analysis, and discusses the results. The long-term stability turns out to be limited mainly by random walk processes.File in questo prodotto:
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