Bimodal Approach for Noise Figures of Merit Evaluation in Quantum-Limited Josephson Traveling Wave Parametric Amplifiers

Fasolo, L.; Barone, C.; Borghesi, M.; Carapella, G.; Caricato, A. P.; Carusotto, I.; Chung, W.; Cian, A.; Gioacchino, D. Di; Enrico, E.; Falferi, P.; Faverzani, M.; Ferri, E.; Filatrella, G.; Gatti, C.; Giachero, A.; Giubertoni, D.; Greco, A.; Kutlu, C.; Leo, A.; Ligi, C.; Livreri, P.; Maccarrone, G.; Margesin, B.; Maruccio, G.; Matlashov, A.; Mauro, C.; Mezzena, R.; Monteduro, A. G.; Nucciotti, A.; Oberto, L.; Pagano, S.; Pierro, V.; Piersanti, L.; Rajteri, M.; Rettaroli, A.; Rizzato, S.; Semertzidis, Y. K.; Uchaikin, S.; Vinante, A.

doi:10.1109/TASC.2022.3148692

The advent of ultra-low noise microwave amplifiers revolutionized several research fields demanding quantum-limited technologies. Exploiting a theoretical bimodal description of a linear phase-preserving amplifier, in this contribution we analyze some of the intrinsic properties of a model architecture (i.e., an rf-SQUID based Josephson Traveling Wave Parametric Amplifier) in terms of amplification and noise generation for key case study input states (Fock and coherent). Furthermore, we present an analysis of the output signals generated by the parametric amplification mechanism when thermal noise fluctuations feed the device.

Bimodal Approach for Noise Figures of Merit Evaluation in Quantum-Limited Josephson Traveling Wave Parametric Amplifiers / Fasolo, L.; Barone, C.; Borghesi, M.; Carapella, G.; Caricato, A. P.; Carusotto, I.; Chung, W.; Cian, A.; Gioacchino, D. Di; Enrico, E.; Falferi, P.; Faverzani, M.; Ferri, E.; Filatrella, G.; Gatti, C.; Giachero, A.; Giubertoni, D.; Greco, A.; Kutlu, C.; Leo, A.; Ligi, C.; Livreri, P.; Maccarrone, G.; Margesin, B.; Maruccio, G.; Matlashov, A.; Mauro, C.; Mezzena, R.; Monteduro, A. G.; Nucciotti, A.; Oberto, L.; Pagano, S.; Pierro, V.; Piersanti, L.; Rajteri, M.; Rettaroli, A.; Rizzato, S.; Semertzidis, Y. K.; Uchaikin, S.; Vinante, A.. - In: IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY. - ISSN 1051-8223. - 32:4(2022), pp. 1-6. [10.1109/TASC.2022.3148692]