Special Section on Mathematical and Statistical Methods for Metrology (EDITORIALE)

Guest Editors: Prof. Grazia Vicario (Politecnico di Torino) and Dr. Francesca Pennecchi (INRIM - Istituto Nazionale di Ricerca Metrologica) The idea of this special issue came about from the joint Workshop of itENBIS and INRIM, Mathematical and Statistical Methods for Metrology (MSMM 2019, http://www.msmm2019.polito.it/) held on May 30–31, 2019 in Torino (Italy) at INRIM, with the co-chairing of Prof. Grazia Vicario (PoliTo/itENBIS) and Dr. Francesca Pennecchi (INRIM/ENBIS). itENBIS is the Italian local network of ENBIS (European Network on Business and Industrial Statistics, http://www.enbis.org/), which is an organization aiming to promote the widespread use of sound science driven, applied statistical methods in European business and industry. The Italian local network is a group of Italian ENBIS members that commit themselves to the ENBIS mission while operating on the national scale. INRIM is the National Institute of Metrological Research (https://www.inrim.it/). It is a public research body having the role of National Metrology Institute (NMI), with the responsibility for carrying out and promoting scientific research in metrology. INRIM realises, maintains and develops the national reference standards of the measurement units of the International System (SI). Both itENBIS and INRIM acknowledged the increasing need of ad hoc and innovative mathematical and statistical tools for current and emerging metrological applications in the several areas of the science of measurements. Hence, the aim of the workshop was to join common areas of interest for metrologists and mathematical statisticians. In fact, the need for new methods and new tools requires the development of new theoretical and applied statistical ideas that ease collaboration with scientists and professionals in metrology, encouraging the connection between theory and application of the statistical methodologies in it.