The spin Seebeck effect (SSE) has generated interest in the thermoelectric and magnetic communities for potential high efficiency energy harvesting applications and spintronic communities as a source of pure spin current. Understanding the underlying mechanisms requires characterization of potential materials across a range of temperatures; however, for thin films, the default measurement of an applied temperature gradient (across the sample) has been shown to be compromised by the presence of thermal resistances. Here, we demonstrate a method to perform low temperature SSE measurements where, instead of monitoring the temperature gradient, the heat flux passing through the sample is measured using two calibrated heat flux sensors. This has the advantage of measuring the heat loss through the sample as well as providing a reliable method to normalize the SSE response of thin film samples. We demonstrate this method with an SiO2/Fe3O4/Pt sample where a semiconducting-insulating transition occurs at the Verwey transition, T-V, of Fe3O4 and quantify the thermomagnetic response above and below T-V. Published under license by AIP Publishing.

Measurement of the heat flux normalized spin Seebeck coefficient of thin films as a function of temperature / Venkat, G; Cox, C D W; Sola, A; Basso, V; Morrison, K. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 91:7(2020), p. 073910. [10.1063/5.0007989]

Measurement of the heat flux normalized spin Seebeck coefficient of thin films as a function of temperature

Sola, A;Basso, V;
2020

Abstract

The spin Seebeck effect (SSE) has generated interest in the thermoelectric and magnetic communities for potential high efficiency energy harvesting applications and spintronic communities as a source of pure spin current. Understanding the underlying mechanisms requires characterization of potential materials across a range of temperatures; however, for thin films, the default measurement of an applied temperature gradient (across the sample) has been shown to be compromised by the presence of thermal resistances. Here, we demonstrate a method to perform low temperature SSE measurements where, instead of monitoring the temperature gradient, the heat flux passing through the sample is measured using two calibrated heat flux sensors. This has the advantage of measuring the heat loss through the sample as well as providing a reliable method to normalize the SSE response of thin film samples. We demonstrate this method with an SiO2/Fe3O4/Pt sample where a semiconducting-insulating transition occurs at the Verwey transition, T-V, of Fe3O4 and quantify the thermomagnetic response above and below T-V. Published under license by AIP Publishing.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11696/65500
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