Dimensional artefacts to achieve metrological traceability in advanced manufacturing

Carmignato, S.; De Chiffre, L.; Bosse, H.; Leach, R. K.; Balsamo, A.; Estler, W. T.

doi:10.1016/j.cirp.2020.05.009

Dimensional measurements play a central role in enabling advanced manufacturing technologies, enhancing the quality of products and increasing productivity. This role becomes even more important in the context of Industry 4.0, where reliable and accurate digital models of products, processes and production systems are needed. To establish the traceability chain that links measurements in production to the length unit, dimensional artefacts - ranging from measurement standards to calibrated workpieces - are fundamental. The paper examines dimensional artefacts, discussing their characteristics, availability and role in supporting production by establishing metrological traceability, and provides guidelines for their selection, use and development.

Dimensional artefacts to achieve metrological traceability in advanced manufacturing / Carmignato, S.; De Chiffre, L.; Bosse, H.; Leach, R. K.; Balsamo, A.; Estler, W. T.. - In: CIRP ANNALS. - ISSN 0007-8506. - 69:2(2020), pp. 693-716.

Titolo:	Dimensional artefacts to achieve metrological traceability in advanced manufacturing
Autori:	Carmignato, S. [Writing – Original Draft Preparation] De Chiffre, L. [Writing – Original Draft Preparation] Bosse, H. [Writing – Original Draft Preparation] Leach, R. K. [Writing – Original Draft Preparation] BALSAMO, ALESSANDRO [Writing – Original Draft Preparation] Estler, W. T. [Writing – Original Draft Preparation] mostra contributor esterni nascondi contributor esterni
Data di pubblicazione:	2020
Rivista:	CIRP ANNALS
Citazione:	Dimensional artefacts to achieve metrological traceability in advanced manufacturing / Carmignato, S.; De Chiffre, L.; Bosse, H.; Leach, R. K.; Balsamo, A.; Estler, W. T.. - In: CIRP ANNALS. - ISSN 0007-8506. - 69:2(2020), pp. 693-716.
Handle:	http://hdl.handle.net/11696/65284
Appare nelle tipologie:	1.1 Articolo in rivista

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2020-09 CIRP Annals keynote - Dimensional artefacts.pdf		Versione editoriale	Non Pubblico - Accesso privato/ristretto	Administrator Richiedi una copia
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Utilizza questo identificativo per citare o creare un link a questo documento:
http://hdl.handle.net/11696/65284

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