In this paper, we show that quantum Hall resistance measurements using two terminals may be as precise as four-terminal measurements when applying superconducting split contacts. The described sample designs eliminate resistance contributions of terminals and contacts such that the size and complexity of next-generation quantized Hall resistance devices can be significantly improved.

Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry / Kruskopf, Mattias; Rigosi, Albert F.; Panna, Alireza R.; Patel, Dinesh K.; Jin, Hanbyul; Marzano, Martina; Berilla, Michael; Newell, David B.; Elmquist, Randolph E.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 66:9(2019), pp. 3973-3977. [10.1109/TED.2019.2926684]

Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry

Marzano, Martina;
2019

Abstract

In this paper, we show that quantum Hall resistance measurements using two terminals may be as precise as four-terminal measurements when applying superconducting split contacts. The described sample designs eliminate resistance contributions of terminals and contacts such that the size and complexity of next-generation quantized Hall resistance devices can be significantly improved.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11696/61032
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