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EnglishA new translation device has been developed at the Istituto di Metrologia ''G. Colonnetti'' (IMGC) to improve the measurement of the (220) lattice spacing in silicon by X-ray/optical interferometry, It is capable of millimeter linear displacement and servo controls ensure picometer and nanoradian resolutions in crystal position and attitude, It has been successfully used to drive a scanning X-ray interferometer over a 2 mm displacement, thus extending by more than one order of magnitude the maximum crystal movement obtained before.
Scanning X-ray interferometry over a millimeter baseline / Bergamin A; Cavagnero G; Cordiali L; Mana G; Zosi G. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 46:2(1997), pp. 576-579.
| Titolo: | Scanning X-ray interferometry over a millimeter baseline | |
| Autori: | ||
| Data di pubblicazione: | 1997 | |
| Rivista: | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | |
| Digital Object Identifier (DOI): | http://dx.doi.org/10.1109/19.571920 | |
| Abstract: | A new translation device has been developed at the Istituto di Metrologia ''G. Colonnetti'' (IMGC...) to improve the measurement of the (220) lattice spacing in silicon by X-ray/optical interferometry, It is capable of millimeter linear displacement and servo controls ensure picometer and nanoradian resolutions in crystal position and attitude, It has been successfully used to drive a scanning X-ray interferometer over a 2 mm displacement, thus extending by more than one order of magnitude the maximum crystal movement obtained before. | |
| Full-text (pubblici): | none | |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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