A new translation device has been developed at the Istituto di Metrologia ''G. Colonnetti'' (IMGC) to improve the measurement of the (220) lattice spacing in silicon by X-ray/optical interferometry, It is capable of millimeter linear displacement and servo controls ensure picometer and nanoradian resolutions in crystal position and attitude, It has been successfully used to drive a scanning X-ray interferometer over a 2 mm displacement, thus extending by more than one order of magnitude the maximum crystal movement obtained before.
Scanning X-ray interferometry over a millimeter baseline / Bergamin A; Cavagnero G; Cordiali L; Mana G; Zosi G. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 46:2(1997), pp. 576-579.
Titolo: | Scanning X-ray interferometry over a millimeter baseline |
Autori: | |
Data di pubblicazione: | 1997 |
Rivista: | |
Citazione: | Scanning X-ray interferometry over a millimeter baseline / Bergamin A; Cavagnero G; Cordiali L; Mana G; Zosi G. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 46:2(1997), pp. 576-579. |
Abstract: | A new translation device has been developed at the Istituto di Metrologia ''G. Colonnetti'' (IMGC) to improve the measurement of the (220) lattice spacing in silicon by X-ray/optical interferometry, It is capable of millimeter linear displacement and servo controls ensure picometer and nanoradian resolutions in crystal position and attitude, It has been successfully used to drive a scanning X-ray interferometer over a 2 mm displacement, thus extending by more than one order of magnitude the maximum crystal movement obtained before. |
Handle: | http://hdl.handle.net/11696/34640 |
Appare nelle tipologie: | 1.1 Articolo in rivista |