Scanning X-ray interferometry over a millimeter baseline

Bergamin, A; Cavagnero, G; Cordiali, L; Mana, Giovanni; Zosi, G.

doi:10.1109/19.571920

A new translation device has been developed at the Istituto di Metrologia ''G. Colonnetti'' (IMGC) to improve the measurement of the (220) lattice spacing in silicon by X-ray/optical interferometry, It is capable of millimeter linear displacement and servo controls ensure picometer and nanoradian resolutions in crystal position and attitude, It has been successfully used to drive a scanning X-ray interferometer over a 2 mm displacement, thus extending by more than one order of magnitude the maximum crystal movement obtained before.

Scanning X-ray interferometry over a millimeter baseline / Bergamin A; Cavagnero G; Cordiali L; Mana G; Zosi G. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 46:2(1997), pp. 576-579.

Titolo:	Scanning X-ray interferometry over a millimeter baseline
Autori:	Bergamin A Cavagnero G Cordiali L MANA, GIOVANNI Zosi G. mostra contributor esterni nascondi contributor esterni
Data di pubblicazione:	1997
Rivista:	IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Citazione:	Scanning X-ray interferometry over a millimeter baseline / Bergamin A; Cavagnero G; Cordiali L; Mana G; Zosi G. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 46:2(1997), pp. 576-579.
Abstract:	A new translation device has been developed at the Istituto di Metrologia ''G. Colonnetti'' (IMGC) to improve the measurement of the (220) lattice spacing in silicon by X-ray/optical interferometry, It is capable of millimeter linear displacement and servo controls ensure picometer and nanoradian resolutions in crystal position and attitude, It has been successfully used to drive a scanning X-ray interferometer over a 2 mm displacement, thus extending by more than one order of magnitude the maximum crystal movement obtained before.
Handle:	http://hdl.handle.net/11696/34640
Appare nelle tipologie:	1.1 Articolo in rivista

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