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EnglishA new translation device has been developed at the Istituto di Metrologia ''G. Colonnetti'' (IMGC) to improve the measurement of the (220) lattice spacing in silicon by X-ray/optical interferometry, It is capable of millimeter linear displacement and servo controls ensure picometer and nanoradian resolutions in crystal position and attitude, It has been successfully used to drive a scanning X-ray interferometer over a 2 mm displacement, thus extending by more than one order of magnitude the maximum crystal movement obtained before.
| Titolo: | Scanning X-ray interferometry over a millimeter baseline |
| Autori: | |
| Data di pubblicazione: | 1997 |
| Rivista: | |
| Abstract: | A new translation device has been developed at the Istituto di Metrologia ''G. Colonnetti'' (IMGC) to improve the measurement of the (220) lattice spacing in silicon by X-ray/optical interferometry, It is capable of millimeter linear displacement and servo controls ensure picometer and nanoradian resolutions in crystal position and attitude, It has been successfully used to drive a scanning X-ray interferometer over a 2 mm displacement, thus extending by more than one order of magnitude the maximum crystal movement obtained before. |
| Handle: | http://hdl.handle.net/11696/34640 |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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