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EnglishBased on the orthodox theory of single electronics, a simulation of a tunnel junction is performed, aiming at investigating if quasiparticle events are predictable to transfer fractional charge. The related outcome from the software package MOSES© [note: ©1995 by R.H. Chen; ©2001 by D.M.R. Kaplan and by Ö. Türel] (Monte-Carlo Single Electronics Simulator) is discussed.
Simulation of charge transfer in a tunnel junction: approaching the sub-e scale / D'ERRICO G. - 66(2004), pp. 282-284.
| Titolo: | Simulation of charge transfer in a tunnel junction: approaching the sub-e scale | |
| Autori: | ||
| Data di pubblicazione: | 2004 | |
| Titolo del libro: | Advanced Mathematical & Computational Tools in Metrology VI | |
| Digital Object Identifier (DOI): | 10.1142/9789812702647_0026 | |
| Abstract: | Based on the orthodox theory of single electronics, a simulation of a tunnel junction is performed, aiming at investigating if quasiparticle events are predictable to transfer fractional charge. The related outcome from the software package MOSES© [note: ©1995 by R.H. Chen; ©2001 by D.M.R. Kaplan and by Ö. Türel] (Monte-Carlo Single Electronics Simulator) is discussed. | |
| Full-text (pubblici): | none | |
| Appare nelle tipologie: | 2.1 Capitolo di libro |
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