METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente.
METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.
EnglishBased on the orthodox theory of single electronics, a simulation of a tunnel junction is performed, aiming at investigating if quasiparticle events are predictable to transfer fractional charge. The related outcome from the software package MOSES© [note: ©1995 by R.H. Chen; ©2001 by D.M.R. Kaplan and by Ö. Türel] (Monte-Carlo Single Electronics Simulator) is discussed.
Simulation of charge transfer in a tunnel junction: approaching the sub-e scale / D'ERRICO G. - 66(2004), pp. 282-284.
| Titolo: | Simulation of charge transfer in a tunnel junction: approaching the sub-e scale | |
| Autori: | ||
| Data di pubblicazione: | 2004 | |
| Rivista: | ||
| Citazione: | Simulation of charge transfer in a tunnel junction: approaching the sub-e scale / D'ERRICO G. - 66(2004), pp. 282-284. | |
| Abstract: | Based on the orthodox theory of single electronics, a simulation of a tunnel junction is performed, aiming at investigating if quasiparticle events are predictable to transfer fractional charge. The related outcome from the software package MOSES© [note: ©1995 by R.H. Chen; ©2001 by D.M.R. Kaplan and by Ö. Türel] (Monte-Carlo Single Electronics Simulator) is discussed. | |
| Handle: | http://hdl.handle.net/11696/33349 | |
| ISBN: | 981-238-904-0 | |
| Appare nelle tipologie: | 2.1 Capitolo di libro |
File in questo prodotto:
Copyright © 2021