The (220) lattice spacing of a silicon crystal was measured by combined x-ray and optical interferometry to about 3 x 10(-8) relative accuracy. The value obtained is d220 = 192015.551 +/- 0.005 fm. After correcting for the impurity-induced lattice contraction, d220 = 192 015.569 +/- 0.006 fm is obtained.

MEASUREMENT OF THE SILICON (220) LATTICE SPACING / Basile, G; Bergamin, A; Cavagnero, G; Mana, Giovanni; Vittone, E; Zosi, G.. - In: PHYSICAL REVIEW LETTERS. - ISSN 0031-9007. - 72:20(1994), pp. 3133-3136. [10.1103/PhysRevLett.72.3133]

MEASUREMENT OF THE SILICON (220) LATTICE SPACING

MANA, GIOVANNI;
1994

Abstract

The (220) lattice spacing of a silicon crystal was measured by combined x-ray and optical interferometry to about 3 x 10(-8) relative accuracy. The value obtained is d220 = 192015.551 +/- 0.005 fm. After correcting for the impurity-induced lattice contraction, d220 = 192 015.569 +/- 0.006 fm is obtained.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11696/32945
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