This paper aims at investigating the influence of the dielectric support on the indications of single axis and three-axis low frequency electric field meters obtained during their calibration. The modification of the calibration field due to the dielectric support, experienced by the meter probe, is predicted by a Boundary Element model and experimentally compared with the actual probe indication, considering both a parallel plate set-up and a TEM cell for the generation of the reference field. The perturbing effect, estimated for different dielectric supports, is found to be greatly amplified and frequency dependent when considering lossy dielectric materials.
Perturbing effects of the probe support on the calibration of electric field meters / Bottauscio, Oriano; Chiampi, M; Crotti, Gabriella; Zilberti, Luca. - In: THE EUROPEAN PHYSICAL JOURNAL. APPLIED PHYSICS. - ISSN 1286-0042. - 42:(2008), pp. 345-350. [10.1051/epjap:2008065]
Perturbing effects of the probe support on the calibration of electric field meters
BOTTAUSCIO, ORIANO;CROTTI, GABRIELLA;ZILBERTI, LUCA
2008
Abstract
This paper aims at investigating the influence of the dielectric support on the indications of single axis and three-axis low frequency electric field meters obtained during their calibration. The modification of the calibration field due to the dielectric support, experienced by the meter probe, is predicted by a Boundary Element model and experimentally compared with the actual probe indication, considering both a parallel plate set-up and a TEM cell for the generation of the reference field. The perturbing effect, estimated for different dielectric supports, is found to be greatly amplified and frequency dependent when considering lossy dielectric materials.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
