In this paper a new C-MOS compatible fabrication process is presented for a nitrogen dioxide porous silicon (PS) sensor. Electrically insulated PS sensing layers and even free-standing PS membranes have been obtained by front side electrochemical micromachining, reducing in this way electrical leakage towards the crystalline substrate. The electrical behavior of the device in a controlled environment was measured by means of a volt-amperometric technique at constant bias. A huge variation of the current was detected at RT for NO2 concentrations as low as 200 ppb (DeltaG/G = 111). The interference of humidity, ethanol, methanol, CO and ozone is also discussed. (C) 2001 Elsevier Science B.V. All rights reserved.

Front-side micromachined porous silicon nitrogen dioxide gas sensor / Baratto, C; Faglia, G; Sberveglieri, G; Boarino, Luca; Rossi, ANDREA MARIO; Amato, Giampiero. - In: THIN SOLID FILMS. - ISSN 0040-6090. - 391:2(2001), pp. 261-264. [10.1016/S0040-6090(01)00992-0]

Front-side micromachined porous silicon nitrogen dioxide gas sensor

BOARINO, LUCA;ROSSI, ANDREA MARIO;AMATO, GIAMPIERO
2001

Abstract

In this paper a new C-MOS compatible fabrication process is presented for a nitrogen dioxide porous silicon (PS) sensor. Electrically insulated PS sensing layers and even free-standing PS membranes have been obtained by front side electrochemical micromachining, reducing in this way electrical leakage towards the crystalline substrate. The electrical behavior of the device in a controlled environment was measured by means of a volt-amperometric technique at constant bias. A huge variation of the current was detected at RT for NO2 concentrations as low as 200 ppb (DeltaG/G = 111). The interference of humidity, ethanol, methanol, CO and ozone is also discussed. (C) 2001 Elsevier Science B.V. All rights reserved.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11696/31270
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