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EnglishThe described measuring system is a new system design in IMGC and developed in cooperation with AFFRI. It can be used to measure the geometrical characteristics of the Rockwell and Vickers diamond indenters. It is based on the interferometric image analysis of different sections of the indenters. Special algorithms are implemented to obtain, from a section of the interferometric images, the indenter profile reconstruction. The main characteristics of the measuring system are an adequate uncertainty to calibrate the indenters for the calibration of hardness testing machines and calibration of hardness blocks, fast measurement execution and low cost. These characteristics allow to this instrument to be easily used by laboratories of Primary Metrological Institutes and by secondary laboratories as well industrial laboratories.
Optical Measuring System For Hardness Indenters / AFFRI R; DESOGUS S; GERMAK A.; MAZZOLENI F; PERTEGHELLA D. - (2000), pp. 295-299. ((Intervento presentato al convegno XVI IMEKO World Congress tenutosi a Vienna, Austria nel Sept. 25-28, 2000.
| Titolo: | Optical Measuring System For Hardness Indenters | |
| Autori: | ||
| Data di pubblicazione: | 2000 | |
| Nome del convegno: | XVI IMEKO World Congress | |
| Luogo del convegno: | Vienna, Austria | |
| Anno del convegno: | Sept. 25-28, 2000 | |
| Abstract: | The described measuring system is a new system design in IMGC and developed in cooperation with ...AFFRI. It can be used to measure the geometrical characteristics of the Rockwell and Vickers diamond indenters. It is based on the interferometric image analysis of different sections of the indenters. Special algorithms are implemented to obtain, from a section of the interferometric images, the indenter profile reconstruction. The main characteristics of the measuring system are an adequate uncertainty to calibrate the indenters for the calibration of hardness testing machines and calibration of hardness blocks, fast measurement execution and low cost. These characteristics allow to this instrument to be easily used by laboratories of Primary Metrological Institutes and by secondary laboratories as well industrial laboratories. | |
| Full-text (pubblici): | none | |
| Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
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