The structural and stoichiometric characterisations of Silicon crystals are reponed to find the origin of a molar volume discrepancy. The target of reproducing this anomaly was achieved and an hypothesis is proposed.

Results of the project Silicon for Mass Unit and Standard (SIMUS) / Alasia, F; Basile, G; D'Agostino, Giancarlo; Peuto, A; Pettorruso, S; Becker, P; Bettin, B; Kuetgens, U; Stuempe, J; Valkiers, S; Taylor, P; De Bievre, P; Jensen, L; Servidori, M; Spirito, P; Zeni, L; Amato, Giampiero; Riemann, H; Haertwig, J; Ammon, Wv. - (2002), pp. 558-559. (Intervento presentato al convegno 2002 Conference on Precision Electromagnetic measurements tenutosi a Ottawa, Canada nel 16-21 June 2002) [10.1109/CPEM.2002.1034969].

Results of the project Silicon for Mass Unit and Standard (SIMUS)

D'AGOSTINO, GIANCARLO;AMATO, GIAMPIERO;
2002

Abstract

The structural and stoichiometric characterisations of Silicon crystals are reponed to find the origin of a molar volume discrepancy. The target of reproducing this anomaly was achieved and an hypothesis is proposed.
2002
2002 Conference on Precision Electromagnetic measurements
16-21 June 2002
Ottawa, Canada
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11696/32051
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