The structural and stoichiometric characterisations of Silicon crystals are reponed to find the origin of a molar volume discrepancy. The target of reproducing this anomaly was achieved and an hypothesis is proposed.

Results of the project Silicon for Mass Unit and Standard (SIMUS) / Alasia, F., Basile, G., D'Agostino, G., Peuto, A., Pettorruso, S., Becker, P., Bettin, B., Kuetgens, U., Stuempe, J., Valkiers, S., Taylor, P., De Bievre, P., Jensen, L., Servidori, M., Spirito, P., Zeni, L., Amato, G., Riemann, H., Haertwig, J., Ammon, W.v.. - (2002), pp. 558-559. (2002 Conference on Precision Electromagnetic measurements Ottawa, Canada 16-21 June 2002) [10.1109/CPEM.2002.1034969].

Results of the project Silicon for Mass Unit and Standard (SIMUS)

D'AGOSTINO, GIANCARLO;AMATO, GIAMPIERO;
2002

Abstract

The structural and stoichiometric characterisations of Silicon crystals are reponed to find the origin of a molar volume discrepancy. The target of reproducing this anomaly was achieved and an hypothesis is proposed.
2002
2002 Conference on Precision Electromagnetic measurements
16-21 June 2002
Ottawa, Canada
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11696/32051
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