The “Automated impedance metrology extending the quantum toolbox for electricity” project (AIM QuTE) will extend Josephson impedance bridges capabilities to the whole complex plane with the best level of uncertainties (0.05 ppm). In parallel, fully digital bridges will be developed to reduce the operator workload imposed on national metrology institutes for the realisation of the impedances scales and for calibrations. The target level of uncertainty for these fully digital bridges is parts in 10−7. Furthermore, sub-pF standards will be developed to establish traceability of very small capacitances. An electronic impedance simulator, which will cover a very large region of the complex impedance plane, will also be realised, it will significantly reduce the number of standards required to link traceability of top level calibration laboratories to national metrology institutes.
AIM QuTE: Automated Impedance Metrology extending the Quantum Toolbox for Electricity / Palafox, L; Raso, F; J., Kučera J; Overney, F; Callegaro, Luca; Gournay, P; Ziołek, A; Nissilä, J; Eklund, G; Lippert, T; Gülmez, Y; Fleischmann, P; Kampik, M; Rybski, R.. - (2013). (Intervento presentato al convegno 16th International Congress of Metrology tenutosi a Paris nel 7-10 October 2013).
AIM QuTE: Automated Impedance Metrology extending the Quantum Toolbox for Electricity
CALLEGARO, LUCA;
2013
Abstract
The “Automated impedance metrology extending the quantum toolbox for electricity” project (AIM QuTE) will extend Josephson impedance bridges capabilities to the whole complex plane with the best level of uncertainties (0.05 ppm). In parallel, fully digital bridges will be developed to reduce the operator workload imposed on national metrology institutes for the realisation of the impedances scales and for calibrations. The target level of uncertainty for these fully digital bridges is parts in 10−7. Furthermore, sub-pF standards will be developed to establish traceability of very small capacitances. An electronic impedance simulator, which will cover a very large region of the complex impedance plane, will also be realised, it will significantly reduce the number of standards required to link traceability of top level calibration laboratories to national metrology institutes.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
