Sfoglia per Rivista
E-beam evaporated ZnO thin films: Fabrication and characterization as UV detector
2015 Portesi, Chiara; Lolli, L; Taralli, Emanuele; Rajteri, Mauro; Monticone, Eugenio
Focus Point on Complex Photonics Measurements, Theory and Simulations for Extreme Light-Matter Interactions
2018 Pattelli, L; Wiersma, D; Brongersma, M; Capasso, F
Impedance measurements for photon number resolving Transition-Edge Sensors
2012 Taralli, Emanuele; Portesi, Chiara; Lolli, L; Rajteri, Mauro; Monticone, Eugenio; Novikov, I; Beyer, J.
A quantitative approach to reflectance transformation imaging in profilometric applications
2024 Verni, Eleonora; Fiocco, Giacomo; Grifoni, Emanuela; Lippolis, Giulia; Ludwig, Nicola; Malagodi, Marco; Pisani, Marco; Rovetta, Tommaso; Zucco, Massimo; Gargano, Marco
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| E-beam evaporated ZnO thin films: Fabrication and characterization as UV detector / Portesi, Chiara; Lolli, L; Taralli, Emanuele; Rajteri, Mauro; Monticone, Eugenio. - In: THE EUROPEAN PHYSICAL JOURNAL PLUS. - ISSN 2190-5444. - 130:3(2015). [10.1140/epjp/i2015-15045-1] | 2015 | PORTESI, CHIARATARALLI, EMANUELERAJTERI, MAUROMONTICONE, EUGENIO + | epjp1300449-offprints.pdf; EPJP-S-13-00489.pdf |
| Focus Point on Complex Photonics Measurements, Theory and Simulations for Extreme Light-Matter Interactions / Pattelli, L; Wiersma, D; Brongersma, M; Capasso, F. - In: THE EUROPEAN PHYSICAL JOURNAL PLUS. - ISSN 2190-5444. - 133:(2018). [10.1140/epjp/i2018-11952-9] | 2018 | Pattelli, LWiersma, D + | Pattelli2018_Article_FocusPointOnComplexPhotonics.pdf |
| Impedance measurements for photon number resolving Transition-Edge Sensors / Taralli, Emanuele; Portesi, Chiara; Lolli, L; Rajteri, Mauro; Monticone, Eugenio; Novikov, I; Beyer, J.. - In: THE EUROPEAN PHYSICAL JOURNAL PLUS. - ISSN 2190-5444. - 127:2(2012), pp. 13-20. [10.1140/epjp/i2012-12013-3] | 2012 | TARALLI, EMANUELEPORTESI, CHIARARAJTERI, MAUROMONTICONE, EUGENIO + | - |
| A quantitative approach to reflectance transformation imaging in profilometric applications / Verni, Eleonora; Fiocco, Giacomo; Grifoni, Emanuela; Lippolis, Giulia; Ludwig, Nicola; Malagodi, Marco; Pisani, Marco; Rovetta, Tommaso; Zucco, Massimo; Gargano, Marco. - In: THE EUROPEAN PHYSICAL JOURNAL PLUS. - ISSN 2190-5444. - 139:9(2024). [10.1140/epjp/s13360-024-05522-3] | 2024 | Pisani, MarcoZucco, Massimo + | - |
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