In recent years the technology of the Vector Network Analyzers (VNAs) is increasing rapidly, and almost every year a new model is produced from several manufacturers. Agilent Technologies produced recently a new series of VNAs classified as “Metrological” meaning that they claim better characteristics than other common instruments. The INRIM High Frequency Laboratory had the possibility of test- ing a metrological VNA and compare it with the one used to real- ize and disseminate the scattering parameters (S-parameters) primary standard. The results of this comparison are hereby presented.
VNA Characteristics Comparison / Sellone, Marco; Shoaib, N; Terzi, P.. - 4:(2015).
VNA Characteristics Comparison
SELLONE, MARCO;
2015
Abstract
In recent years the technology of the Vector Network Analyzers (VNAs) is increasing rapidly, and almost every year a new model is produced from several manufacturers. Agilent Technologies produced recently a new series of VNAs classified as “Metrological” meaning that they claim better characteristics than other common instruments. The INRIM High Frequency Laboratory had the possibility of test- ing a metrological VNA and compare it with the one used to real- ize and disseminate the scattering parameters (S-parameters) primary standard. The results of this comparison are hereby presented.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
