METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

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Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC / Bertinetto, F; Cordiale, P; Picotto, Gianbartolo; Chartier, J. M.; Felder, R; Glaser, M. G.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 32:(1983), pp. 72-76. 1983 PICOTTO, GIANBARTOLO + -
Recent progresses in He-Ne lasers stabilized to 127I2 / Bertinetto, F; Cordiale, P; Fontana, S; Picotto, Gianbartolo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 34:(1985), pp. 256-261. 1985 PICOTTO, GIANBARTOLO + -
Helium-Neon lasers stabilized to iodine at 605 nm / Bertinetto, F; Cordiale, P; Fontana, S; Picotto, Gianbartolo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 36:(1987), pp. 609-612. 1987 PICOTTO, GIANBARTOLO + -
Coherence effects in Frequency-Modulated laser Spectroscopy / Picotto, Gianbartolo; Wataghin, V.. - In: JOURNAL OF PHYSICS. B, ATOMIC MOLECULAR AND OPTICAL PHYSICS. - ISSN 0953-4075. - 25:(1992), pp. 2489-2500. 1992 PICOTTO, GIANBARTOLO + -
Two scanning tunneling microscope devices for large samples / Picotto, Gianbartolo; Desogus, S; Barbato, G.. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 64:(1993), pp. 2699-2701. 1993 PICOTTO, GIANBARTOLO + -
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements / Desogus, S; Lanyi, S; Nerino, R; Picotto, Gianbartolo. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 12:(1994), pp. 1665-1668. 1994 PICOTTO, GIANBARTOLO + -
Surface characterization of sputtering niobium films by scanning tunneling microscopy / Lacquaniti, Vincenzo; Maggi, S; Monticone, Eugenio; Picotto, Gianbartolo. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 12:(1994), pp. 1734-1737. 1994 LACQUANITI, VINCENZOMONTICONE, EUGENIOPICOTTO, GIANBARTOLO + -
A surface profile reconstruction method based on multisensor capacitive transducers / Nerino, R; Cabiati, F; Picotto, Gianbartolo; Sacconi, A.. - In: MEASUREMENT. - ISSN 0263-2241. - 13:(1994), pp. 77-84. 1994 PICOTTO, GIANBARTOLO + -
STM characterization of InP gratings for DFB laser fabrication / G., Meneghini; Picotto, Gianbartolo; M., Gentili; L., Grella. - In: SURFACE AND INTERFACE ANALYSIS. - ISSN 0142-2421. - 22:(1994), pp. 296-299. 1994 PICOTTO, GIANBARTOLO + -
MICROHARDNESS MEASUREMENTS BY SCANNING TUNNELING MICROSCOPE RID / Barbato, G.; Desogus, S.; Germak, ALESSANDRO FRANCO LIDIA; Picotto, Gianbartolo; Xhomo, E.. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 12:3(1994), pp. 1738-1741. [10.1116/1.587588] 1994 GERMAK, ALESSANDRO FRANCO LIDIAPICOTTO, GIANBARTOLO + -
International Intercomparison of Scanning Tunneling Microscopy / K., Carneiro; J., Garnæs; C. P., Jensen; J. F., Jorgensen; L., Nielsen; O., Jusko; G., Wilkening; G., Barbato; Picotto, Gianbartolo; G., Gori; S., Livi; G., Hughes; H., Mcquoid. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 14:(1996), pp. 1531-1535. 1996 PICOTTO, GIANBARTOLO + -
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements / Picotto, Gianbartolo; Desogus, S.; Lanyi, S.; Nerino, R.; Sosso, Andrea. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 14:2(1996), pp. 897-900. [10.1116/1.589170] 1996 PICOTTO, GIANBARTOLOSOSSO, ANDREA + -
Structural and surface properties of sputtered Nb films for multilayer devices / Lacquaniti, Vincenzo; Monticone, Eugenio; Picotto, Gianbartolo. - In: SURFACE SCIENCE. - ISSN 0039-6028. - 377-379:(1997), pp. 1042-1045. [10.1016/S0039-6028(96)01542-7] 1997 LACQUANITI, VINCENZOMONTICONE, EUGENIOPICOTTO, GIANBARTOLO -
Surface characterization of electroformed mirrors for an X-ray telescope / Citterio, O.; Mazzoleni, Fabrizio; Monticone, Eugenio; Picotto, Gianbartolo. - In: SURFACE SCIENCE. - ISSN 0039-6028. - 377-379:(1997), pp. 98-102. 1997 MAZZOLENI, FABRIZIOMONTICONE, EUGENIOPICOTTO, GIANBARTOLO + -
A novel AC current source for capacitance-based displacement measurements / Nerino, R.; Sosso, Andrea; Picotto, Gianbartolo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 46:2(1997), pp. 640-643. [10.1109/19.572051] 1997 SOSSO, ANDREAPICOTTO, GIANBARTOLO + -
Vickers Hardness Indentations measured with Atomic Force Microscopy / C. P., Jensen; J. F., Jorgensen; J., Garnaes; Picotto, Gianbartolo; G., Gori. - In: JOURNAL OF TESTING AND EVALUATION. - ISSN 0090-3973. - 26 (6):(1998), pp. 532-538. 1998 PICOTTO, GIANBARTOLO + -
The IMGC calibration setup for microdisplacement actuators / Sacconi, A.; Pasin, W.; Picotto, Gianbartolo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 48:(1999), pp. 483-487. 1999 PICOTTO, GIANBARTOLO + -
A precision Z-stage for Scanning Probe Microscopy / Picotto, Gianbartolo; Pisani, Marco. - PTB-Bericht F-39:(2000), pp. 164-168. 2000 PICOTTO, GIANBARTOLOPISANI, MARCO -
A metrological SPM for dimensional surface measurements / Picotto, Gianbartolo; Pisani, Marco. - Vol. 1:(2001), pp. 402-405. 2001 PICOTTO, GIANBARTOLOPISANI, MARCO -
Displacement measurements of piezoelectric actuators in the nanosize-range / Fabbri, G.; Galassi, C.; Picotto, Gianbartolo; Pisani, Marco. - PTB-Bericht F-44:(2001), pp. 118-124. 2001 PICOTTO, GIANBARTOLOPISANI, MARCO + -
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