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Crystal bending in triple-Laue X-ray interferometry. Part I. Theory / Sasso, Cp; Mana, G; Massa, E. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 1600-5767. - 56:(2023), pp. 707-715. [10.1107/S1600576723002844] 2023 Sasso, CPMana, GMassa, E 2023_Crystal_bending_in_triple_Laue_ interferometry_part1_Theory.pdf
Crystal bending in triple-Laue X-ray interferometry. Part II. Phase-contrast topography / Massa, E; Mana, G; Sasso, Cp. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 1600-5767. - 56:Pt 3(2023), pp. 716-724. [10.1107/S1600576723002832] 2023 Massa, EMana, GSasso, CP 2023_Crystal_Bending_part2_Phase_Contrast_Topography.pdf
Neutron interference from a split-crystal interferometer / Lemmel, H.; Jentschel, M.; Abele, H.; Lafont, F.; Guerard, B.; Sasso, C. P.; Mana, G.; Massa, E.. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 1600-5767. - 55:4(2022). [10.1107/S1600576722006082] 2022 C. P. SassoG. ManaE. Massa + 2022_Neutron_interference_from_a_slit-crystal_ineterometer.pdf
Operation model of a skew-symmetric split-crystal neutron interferometer / Sasso, Carlo P.; Mana, Giovanni; Massa, Enrico. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 1600-5767. - 57:1(2024), pp. 44-59. [10.1107/s1600576723010245] 2024 Sasso, Carlo P.Mana, GiovanniMassa, Enrico 2024_operation_model_SS_nINT.pdf
Three-dimensional model of a split-crystal X-ray and neutron interferometer / Sasso, C. P.; Mana, G.; Massa, E.. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 1600-5767. - 55:6(2022), pp. 1500-1513. [10.1107/S1600576722008962] 2022 Sasso, C. P.Mana, G.Massa, E. 2210.16309.pdf2022_Three‐dimensional model of a split‐crystal X‐ray and neutron.pdf
X-ray phase-contrast topography to measure the surface stress and bulk strain in a silicon crystal / Massa, E.; Sasso, C. P.; Fretto, M.; Martino, L.; Mana, G.. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 1600-5767. - 53:5(2020), pp. 1195-1202. [10.1107/s1600576720009267] 2020 E. MassaC. P. SassoM. FrettoL. MartinoG. Mana VH521_X_ray_phase_contrast_topography_to_measure_the_surface_stress.pdf
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