Sfoglia per Autore
Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC
1983 Bertinetto, F; Cordiale, P; Picotto, Gianbartolo; Chartier, J. M.; Felder, R; Glaser, M. G.
Recent progresses in He-Ne lasers stabilized to 127I2
1985 Bertinetto, F; Cordiale, P; Fontana, S; Picotto, Gianbartolo
Helium-Neon lasers stabilized to iodine at 605 nm
1987 Bertinetto, F; Cordiale, P; Fontana, S; Picotto, Gianbartolo
Coherence effects in Frequency-Modulated laser Spectroscopy
1992 Picotto, Gianbartolo; Wataghin, V.
Two scanning tunneling microscope devices for large samples
1993 Picotto, Gianbartolo; Desogus, S; Barbato, G.
Surface characterization of sputtering niobium films by scanning tunneling microscopy
1994 Lacquaniti, Vincenzo; Maggi, S; Monticone, Eugenio; Picotto, Gianbartolo
STM characterization of InP gratings for DFB laser fabrication
1994 G., Meneghini; Picotto, Gianbartolo; M., Gentili; L., Grella
A surface profile reconstruction method based on multisensor capacitive transducers
1994 Nerino, R; Cabiati, F; Picotto, Gianbartolo; Sacconi, A.
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements
1994 Desogus, S; Lanyi, S; Nerino, R; Picotto, Gianbartolo
International Intercomparison of Scanning Tunneling Microscopy
1996 K., Carneiro; J., Garnæs; C. P., Jensen; J. F., Jorgensen; L., Nielsen; O., Jusko; G., Wilkening; G., Barbato; Picotto, Gianbartolo; G., Gori; S., Livi; G., Hughes; H., Mcquoid
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements
1996 Picotto, Gianbartolo; Desogus, S.; Lanyi, S.; Nerino, R.; Sosso, Andrea
Structural and surface properties of sputtered Nb films for multilayer devices
1997 Lacquaniti, Vincenzo; Monticone, Eugenio; Picotto, Gianbartolo
A novel AC current source for capacitance-based displacement measurements
1997 Nerino, R.; Sosso, Andrea; Picotto, Gianbartolo
Surface characterization of electroformed mirrors for an X-ray telescope
1997 Citterio, O.; Mazzoleni, Fabrizio; Monticone, Eugenio; Picotto, Gianbartolo
Vickers Hardness Indentations measured with Atomic Force Microscopy
1998 C. P., Jensen; J. F., Jorgensen; J., Garnaes; Picotto, Gianbartolo; G., Gori
The IMGC calibration setup for microdisplacement actuators
1999 Sacconi, A.; Pasin, W.; Picotto, Gianbartolo
A precision Z-stage for Scanning Probe Microscopy
2000 Picotto, Gianbartolo; Pisani, Marco
Displacement measurements of piezoelectric actuators in the nanosize-range
2001 Fabbri, G.; Galassi, C.; Picotto, Gianbartolo; Pisani, Marco
A metrological SPM for dimensional surface measurements
2001 Picotto, Gianbartolo; Pisani, Marco
A sample scanning system with nanometric accuracy for quantitative SPM measurements
2001 Picotto, Gianbartolo; Pisani, Marco
Citazione | Data di pubblicazione | Autori | File |
---|---|---|---|
Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC / Bertinetto, F; Cordiale, P; Picotto, Gianbartolo; Chartier, J. M.; Felder, R; Glaser, M. G.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 32:(1983), pp. 72-76. | 1983 | PICOTTO, GIANBARTOLO + | - |
Recent progresses in He-Ne lasers stabilized to 127I2 / Bertinetto, F; Cordiale, P; Fontana, S; Picotto, Gianbartolo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 34:(1985), pp. 256-261. | 1985 | PICOTTO, GIANBARTOLO + | - |
Helium-Neon lasers stabilized to iodine at 605 nm / Bertinetto, F; Cordiale, P; Fontana, S; Picotto, Gianbartolo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 36:(1987), pp. 609-612. | 1987 | PICOTTO, GIANBARTOLO + | - |
Coherence effects in Frequency-Modulated laser Spectroscopy / Picotto, Gianbartolo; Wataghin, V.. - In: JOURNAL OF PHYSICS. B, ATOMIC MOLECULAR AND OPTICAL PHYSICS. - ISSN 0953-4075. - 25:(1992), pp. 2489-2500. | 1992 | PICOTTO, GIANBARTOLO + | - |
Two scanning tunneling microscope devices for large samples / Picotto, Gianbartolo; Desogus, S; Barbato, G.. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 64:(1993), pp. 2699-2701. | 1993 | PICOTTO, GIANBARTOLO + | - |
Surface characterization of sputtering niobium films by scanning tunneling microscopy / Lacquaniti, Vincenzo; Maggi, S; Monticone, Eugenio; Picotto, Gianbartolo. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 12:(1994), pp. 1734-1737. | 1994 | LACQUANITI, VINCENZOMONTICONE, EUGENIOPICOTTO, GIANBARTOLO + | - |
STM characterization of InP gratings for DFB laser fabrication / G., Meneghini; Picotto, Gianbartolo; M., Gentili; L., Grella. - In: SURFACE AND INTERFACE ANALYSIS. - ISSN 0142-2421. - 22:(1994), pp. 296-299. | 1994 | PICOTTO, GIANBARTOLO + | - |
A surface profile reconstruction method based on multisensor capacitive transducers / Nerino, R; Cabiati, F; Picotto, Gianbartolo; Sacconi, A.. - In: MEASUREMENT. - ISSN 0263-2241. - 13:(1994), pp. 77-84. | 1994 | PICOTTO, GIANBARTOLO + | - |
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements / Desogus, S; Lanyi, S; Nerino, R; Picotto, Gianbartolo. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 12:(1994), pp. 1665-1668. | 1994 | PICOTTO, GIANBARTOLO + | - |
International Intercomparison of Scanning Tunneling Microscopy / K., Carneiro; J., Garnæs; C. P., Jensen; J. F., Jorgensen; L., Nielsen; O., Jusko; G., Wilkening; G., Barbato; Picotto, Gianbartolo; G., Gori; S., Livi; G., Hughes; H., Mcquoid. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 14:(1996), pp. 1531-1535. | 1996 | PICOTTO, GIANBARTOLO + | - |
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements / Picotto, Gianbartolo; Desogus, S.; Lanyi, S.; Nerino, R.; Sosso, Andrea. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 14:2(1996), pp. 897-900. [10.1116/1.589170] | 1996 | PICOTTO, GIANBARTOLOSOSSO, ANDREA + | - |
Structural and surface properties of sputtered Nb films for multilayer devices / Lacquaniti, Vincenzo; Monticone, Eugenio; Picotto, Gianbartolo. - In: SURFACE SCIENCE. - ISSN 0039-6028. - 377-379:(1997), pp. 1042-1045. [10.1016/S0039-6028(96)01542-7] | 1997 | LACQUANITI, VINCENZOMONTICONE, EUGENIOPICOTTO, GIANBARTOLO | - |
A novel AC current source for capacitance-based displacement measurements / Nerino, R.; Sosso, Andrea; Picotto, Gianbartolo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 46:2(1997), pp. 640-643. [10.1109/19.572051] | 1997 | SOSSO, ANDREAPICOTTO, GIANBARTOLO + | - |
Surface characterization of electroformed mirrors for an X-ray telescope / Citterio, O.; Mazzoleni, Fabrizio; Monticone, Eugenio; Picotto, Gianbartolo. - In: SURFACE SCIENCE. - ISSN 0039-6028. - 377-379:(1997), pp. 98-102. | 1997 | MAZZOLENI, FABRIZIOMONTICONE, EUGENIOPICOTTO, GIANBARTOLO + | - |
Vickers Hardness Indentations measured with Atomic Force Microscopy / C. P., Jensen; J. F., Jorgensen; J., Garnaes; Picotto, Gianbartolo; G., Gori. - In: JOURNAL OF TESTING AND EVALUATION. - ISSN 0090-3973. - 26 (6):(1998), pp. 532-538. | 1998 | PICOTTO, GIANBARTOLO + | - |
The IMGC calibration setup for microdisplacement actuators / Sacconi, A.; Pasin, W.; Picotto, Gianbartolo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 48:(1999), pp. 483-487. | 1999 | PICOTTO, GIANBARTOLO + | - |
A precision Z-stage for Scanning Probe Microscopy / Picotto, Gianbartolo; Pisani, Marco. - PTB-Bericht F-39:(2000), pp. 164-168. | 2000 | PICOTTO, GIANBARTOLOPISANI, MARCO | - |
Displacement measurements of piezoelectric actuators in the nanosize-range / Fabbri, G.; Galassi, C.; Picotto, Gianbartolo; Pisani, Marco. - PTB-Bericht F-44:(2001), pp. 118-124. | 2001 | PICOTTO, GIANBARTOLOPISANI, MARCO + | - |
A metrological SPM for dimensional surface measurements / Picotto, Gianbartolo; Pisani, Marco. - Vol. 1:(2001), pp. 402-405. | 2001 | PICOTTO, GIANBARTOLOPISANI, MARCO | - |
A sample scanning system with nanometric accuracy for quantitative SPM measurements / Picotto, Gianbartolo; Pisani, Marco. - In: ULTRAMICROSCOPY. - ISSN 0304-3991. - 1:(2001), pp. 1-12. | 2001 | PICOTTO, GIANBARTOLOPISANI, MARCO | - |
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