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Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC / BERTINETTO F; CORDIALE P; GB PICOTTO; CHARTIER J.M; FELDER R; GLASER M.G. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 32(1983), pp. 72-76. 1983 PICOTTO, GIANBARTOLO + -
Recent progresses in He-Ne lasers stabilized to 127I2 / BERTINETTO F; CORDIALE P; FONTANA S; GB PICOTTO. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 34(1985), pp. 256-261. 1985 PICOTTO, GIANBARTOLO + -
Helium-Neon lasers stabilized to iodine at 605 nm / BERTINETTO F; CORDIALE P; FONTANA S; GB PICOTTO. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 36(1987), pp. 609-612. 1987 PICOTTO, GIANBARTOLO + -
Coherence effects in Frequency-Modulated laser Spectroscopy / GB PICOTTO; WATAGHIN V. - In: JOURNAL OF PHYSICS. B, ATOMIC MOLECULAR AND OPTICAL PHYSICS. - ISSN 0953-4075. - 25(1992), pp. 2489-2500. 1992 PICOTTO, GIANBARTOLO + -
Two scanning tunneling microscope devices for large samples / GB PICOTTO; DESOGUS S; BARBATO G. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 64(1993), pp. 2699-2701. 1993 PICOTTO, GIANBARTOLO + -
STM characterization of InP gratings for DFB laser fabrication / G. MENEGHINI; GB PICOTTO; M. GENTILI; L. GRELLA. - In: SURFACE AND INTERFACE ANALYSIS. - ISSN 0142-2421. - 22(1994), pp. 296-299. 1994 PICOTTO, GIANBARTOLO + -
Surface characterization of sputtering niobium films by scanning tunneling microscopy / Lacquaniti, V; Maggi, S; Monticone, E; Picotto, G.. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 12(1994), pp. 1734-1737. 1994 LACQUANITI, VINCENZOMONTICONE, EUGENIOPICOTTO, GIANBARTOLO + -
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements / DESOGUS S; LANYI S; NERINO R; GB PICOTTO. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 12(1994), pp. 1665-1668. 1994 PICOTTO, GIANBARTOLO + -
MICROHARDNESS MEASUREMENTS BY SCANNING TUNNELING MICROSCOPE RID / Barbato, G.; Desogus, S.; Germak, A.; Picotto, G.; Xhomo, E.. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 12:3(1994), pp. 1738-1741. [10.1116/1.587588] 1994 GERMAK, ALESSANDRO FRANCO LIDIAPICOTTO, GIANBARTOLO + -
A surface profile reconstruction method based on multisensor capacitive transducers / NERINO R; CABIATI F; GB PICOTTO; SACCONI A. - In: MEASUREMENT. - ISSN 0263-2241. - 13(1994), pp. 77-84. 1994 PICOTTO, GIANBARTOLO + -
International Intercomparison of Scanning Tunneling Microscopy / K. CARNEIRO; J. GARNÆS; C. P. JENSEN; J. F. JORGENSEN; L. NIELSEN; O. JUSKO; G. WILKENING; G. BARBATO; GB PICOTTO; G. GORI; S. LIVI; G. HUGHES; H. MCQUOID. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 14(1996), pp. 1531-1535. 1996 PICOTTO, GIANBARTOLO + -
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements / Picotto, G; Desogus, S.; Lanyi, S.; Nerino, R.; Sosso, A.. - In: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B. - ISSN 1071-1023. - 14:2(1996), pp. 897-900. 1996 PICOTTO, GIANBARTOLOSOSSO, ANDREA + -
Surface characterization of electroformed mirrors for an X-ray telescope / Citterio, O.; Mazzoleni, F.; Monticone, E.; Picotto, G.. - In: SURFACE SCIENCE. - ISSN 0039-6028. - 377-379(1997), pp. 98-102. 1997 MAZZOLENI, FABRIZIOMONTICONE, EUGENIOPICOTTO, GIANBARTOLO + -
A novel AC current source for capacitance-based displacement measurements / Nerino, R.; Sosso, A.; Picotto, G.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 46:2(1997), pp. 640-643. [10.1109/19.572051] 1997 SOSSO, ANDREAPICOTTO, GIANBARTOLO + -
Structural and surface properties of sputtered Nb films for multilayer devices / Lacquaniti, V.; Monticone, E.; Picotto, G.. - In: SURFACE SCIENCE. - ISSN 0039-6028. - 377-379(1997), pp. 1042-1045. [10.1016/S0039-6028(96)01542-7] 1997 LACQUANITI, VINCENZOMONTICONE, EUGENIOPICOTTO, GIANBARTOLO -
Vickers Hardness Indentations measured with Atomic Force Microscopy / C. P. JENSEN; J. F. JORGENSEN; J. GARNAES; GB PICOTTO; G. GORI. - In: JOURNAL OF TESTING AND EVALUATION. - ISSN 0090-3973. - 26 (6)(1998), pp. 532-538. 1998 PICOTTO, GIANBARTOLO + -
The IMGC calibration setup for microdisplacement actuators / SACCONI A.; PASIN W.; GB PICOTTO. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 48(1999), pp. 483-487. 1999 PICOTTO, GIANBARTOLO + -
A precision Z-stage for Scanning Probe Microscopy / Picotto, G.; Pisani, M.. - PTB-Bericht F-39(2000), pp. 164-168. 2000 PICOTTO, GIANBARTOLOPISANI, MARCO -
Displacement measurements of piezoelectric actuators in the nanosize-range / Fabbri, G.; Galassi, C.; Picotto, G.; Pisani, M.. - PTB-Bericht F-44(2001), pp. 118-124. 2001 PICOTTO, GIANBARTOLOPISANI, MARCO + -
A metrological SPM for dimensional surface measurements / Picotto, G.; Pisani, M.. - Vol. 1(2001), pp. 402-405. 2001 PICOTTO, GIANBARTOLOPISANI, MARCO -
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